JEOL (Europe) BV News

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latest news and events


From the 4th till the 6th of September TU Delft organised a symposium in honor of the inauguration of the JEOL JEM-3200FSC installed this year at the BioNanoScience department of TU Delft. Many well known scientists in the Structural Biology field joined this event and presented their most recent work. Two very intensive days of presentations were followed by a 3rd day of workshops given by participating companies.

On the symposium website you can find the full list of speakers: https://www.tudelft.nl/en/cryo-em-symposium/program/

Below some photo's of Prof. Fujiyoshi and Prof. Dubochet presenting.

 

 


On the 19th of September the exhibition LabAnalyse 2017 will be held at in "de Kuip" in Rotterdam. JEOL (Europe) BV will be present to promote our recent developments and new products in the field of NMR, Mass spectrometry and Electron Optics. 

For more information, please visit http://labanalyse.nl/


On the 3rd and 4th of October the exhibition Labtechnology 2017 will be held at the Jaarbeurs in Utrecht. JEOL (Europe) BV will be present to promote our recent developments and new products in the field of NMR, Mass spectrometry and Electron Optics. You can find us at booth B16. 

To sign up for this event, please visit http://labtechnology.nl/en/


The IB-19530CP is equipped with a newly designed multi-purpose stage to fulfill increasingly diversified market needs and realize multi-functionality by different kinds of functional holders. Surface milling and polishing, cross-section polishing and also carbon sputtering is now possible within one instrument, using specialized functional holders.

The system is easy to set up and can be programmed for high-speed processing and finishing of high quality cross sections in a short period of time. Intermittent processing can also be programmed to enhance preparation of materials of low melting temperature and susceptible to ion beam irradiation.

 

For more details, please visit our main website: https://www.jeol.co.jp/en/products/detail/IB-19530CP.html


JEOL's latest addition to the InTouchscope series is the JSM-IT500, a new model that incorporates new features that further increase ease of use and create a higher throughput for SEM analysis.

Key point 1 : Zeromag
The displayed Holder Graphics or CCD image enables you to locate the specimen area or specify analysis positions. You can rapidly search the specimen area and specify positions for multiple-field serial analysis.


Key point 2 : Live Analysis (Only for A/LA)
With "Live Analysis", the embedded EDS system shows a real time EDS spectrum during image observation. Elemental composition or "Alert" for element of interest is displayed on a live image.


Key point 3 : Integrated data management software
This user-friendly software enables you to select and review SEM images and analysis results through the data management area. You can also generate a report with a single click.

Please take a look at the video to see how the new features work: https://youtu.be/Kad1BzLWT5E

 

 

 


JSM-7900F is JEOL’s new flagship FE-SEM which combines ultimate high resolution imaging, enhanced stability and exceptional ease of use for any level of operator in multi-user environment.

Newly developed functionality that integrates lens control system and automatic technology, "Neo Engine" (New Electron Optical Engine) is a standard feature, allowing for fast and easy image acquisition at any accelerating voltage and probe current.
The system is the premier example of the JEOL’s advanced electron optics technology.

For more details visit our corporate website: https://www.jeol.co.jp/en/products/detail/JSM-7900F.html


The New JNM-ECZ High field NMR series is booming.  Recent installations of 400 MHz, 500 MHz and 600 MHz for liquid experiments, but also for solids is proving the excellent performance of these systems.  With old magnets and new probes making it possible to do 3 channel experiments on a two channel spectrometer JEOL is showing the way to modern NMR systems at lower cost of ownership.

Improvement of our application center in UK together with the any installations, we now can demonstrate the wide range of system configurations.

Are you interested in knowing more, just complete the “request product info” on our website.

 

                                                                                        


JEOL (Europe) BV will be present at the Laborama Expo 2017, on the 16th and 17th of March in the Brussels Kart Expo in Groot Bijgaarden. We will have our InfiTOF, as well as our benchtop SEM on display. You are more than welcome to visit us and be informed about our latest developments. You can find us at Booth D5.

 


The JIB-4700F features a hybrid conical objective lens, GENTLEBEAM™ (GB) mode and an in-lens detector system to deliver a guaranteed resolution of 1.6nm at a low accelerating voltage of 1 kV. Using an "in-lens Schottky-emission electron gun" that produces an electron beam with a maximum probe-current of 300nA, this newly-developed instrument allows for high-resolution observations and fast analyses. For the FIB column, a high-current density Ga ion beam of up to 90nA maximum probe-current is employed for fast ion milling and processing of specimens.


Concurrent with high-speed cross-section processing by FIB, high-resolution SEM observations and fast analyses can be conducted utilizing energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD). Additionally, a three-dimensional analysis function that automatically captures SEM images at certain intervals in cross-section processing is provided as one of the JIB-4700F's standard features. 


For more details visit our corporate website: http://www.jeol.co.jp/en/products/detail/JIB-4700F.html


The JSM-IT300HR is the latest model in the InTouchscope Series. The succesful series has been expanded with a model that comes standard with a Field Emission Gun and Low Vacuum capabilities, based on the JSM-IT300 Tungsten SEM.

This versatile and powerful microscope allows for very easy and very fast imaging at high magnifications, so that even novice users can quickly enjoy the benefits of a Field Emission Gun. 

Main features:

  1. New high-brightness electron gun and optical system provide high resolution imaging and high spatial-resolution analysis.
  2. Intuitive operation is enabled by Touch panel functions, Automatic functions and Recipe functions.
  3. Easy-to-use software interface (GUI) includes full integration of image observation and element analysis, allowing even novice users to perform any task with high efficiency.
  4. Large specimen stage which accommodates various sizes and types of specimens for extended observation and analysis.
  5. Small footprint equivalent to the conventional general-purpose SEM.

More detailed information and example images can be found on our corporate website: http://www.jeol.co.jp/en/products/detail/JSM-IT300HR.html


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