The first transmission electron microscope of its caliber to be installed, the eagerly awaited atomic resolution JEOL JEM-ARM200F TEM arrived at the University of Texas at San Antonio in January, and by early February began producing outstanding imaging results.
“Achieving raw HAADF images showing at least 78 picometer information transfer in just three weeks demonstrates the stability of this all-new instrument and the skill of the UTSA-JEOL team to quickly power up the first TEM of its kind,” said Dr. Thomas Isabell, JEOL USA Director of the TEM Product Division.
UTSA physics and astronomy department chair Dr. Miguel Yacaman, a renowned electron microscopist and nanotechnology researcher, tested the new ARM200F performance on Si <110> samples as the JEOL engineering, service and applications team worked closely together to install the TEM in UTSA’s Advanced Microscopy Lab.
“At the level of this new microscope, the potential for new discoveries is enormous,” says Yacaman, who likened the capabilities of the JEOL ARM200F for sub-atomic research to those of the Hubble telescope for intergalactic exploration.
The ARM200F represents more than 60 years of TEM expertise at JEOL and was designed from the ground up to integrate aberration correction into a super-shielded electron column that safeguards the ultrahigh-powered optics from environmental interferences.
“This first installation of the ARM200F demonstrates that JEOL is out in front in the development of stable, ultra-quality instruments and showcases just what our service and applications teams are capable of.” said Isabell.
The JEM-ARM200F enables both atom-by-atom imaging resolution and unmatched spatial resolution for atom-to-atom chemical mapping of materials, including EDS (energy-dispersive x-ray spectroscopy) and EELS (electron energy-loss spectroscopy). The completely new electron column design integrates S/TEM with Cs correction for atomic spatial energy resolution combined with high probe currents for microanalysis.
JEOL Ltd. (Gon’emon Kurihara, President) announced a new hybrid microscope, JASM-6200 “ClairScope™” to be distributed in August 2009.
[ Design Principle ]
ClairScope™ consists of an atmospheric scanning electron microscope (ASEM) and an optical microscope positioned on top. The ASEM is isolated from the SEM with a thin film installed at the top end of the inverted SEM. The thin film, designed to transmit an electron beam while blocking air, separates the sample in atmosphere from the vacuum in the SEM. The electron beam is projected from below to the sample placed on the thin film for high resolution imaging of the sample in atmosphere. The same area of view of the sample can also be imaged in the optical microscope on top. The thin film is configured in a dish (thin film dish), which can be used for cell culture in a culture chamber.
[ Features ]
SEM imaging in complete atmospheric pressure
The sample is held in complete atmospheric pressure, enabling dynamic observation of physical and chemical reactions in liquids and gases. Lengthy preliminary treatment of biological samples, including dehydration and drying, is no longer necessary, resulting in high throughput imaging. The microscope, without the limitations of vacuum atmosphere, will broaden the range of applications.
Imaging of the same area of view as optical microscope
The top of the thin film is open, joined to the optical microscope. The optical microscope being aligned with the ASEM, the operator can image the same area of view alternately between both microscopes.
The optical microscope can accommodate up to 6 mirror units simultaneously. Standard mirror units for bright field imaging and ultraviolet irradiation, combined with optional mirror units, can acquire various types of fluorescent images.
Open specimen chamber
The specimen chamber is open, allowing the operator to externally control reagents (chemical administration).For example, the operator can load the thin film dish onto the system, and observe the sample in the ASEM after administering a chemical to the sample. The operator can also monitor physical and chemical developments as the sample changes its volume.
[ Biological applications ]
Extended applications of optical microscope
Many biologists routinely use optical microscopes for their research. However, optical microscopy is unable to achieve resolution higher than 0.2 um due to its wavelength limitations. While scanning electron microscopy (SEM) and transmission electron microscopy (TEM) feature higher resolution, many samples require a lengthy preliminary treatment process including multiple dehydration and drying process steps, which usually takes a skilled technician one to a few days to complete. This is why SEM and TEM, despite their high resolution, are not as widely used as optical microscopy.
ClairScope™ is designed to observe samples in atmospheric pressure using the ASEM. It is capable of high resolution imaging of biological samples without the preliminary dehydration/drying process that requires skilled technician. Sample pre-treatment consists of simple steps of chemical administration, taking only about 10 minutes. This enhances the efficiency and yield of sample imaging.
ClairScope™ also supports imaging of the same area of view in the optical microscope on top and the ASEM at the bottom. This allows optical microscope users to first observe images they are familiar with, and proceed to high resolution imaging of a given spot of the sample. The system allows the operator to identify tissues and local existence of protein using fluorescence staining and optical microscopy, and to further study the corresponding spots using high resolution imaging of the ASEM.
ClairScope™ also allows the operator to observe live cells in the optical microscope, restrict the motion with chemicals, and apply fixation/staining as needed for high resolution imaging in the ASEM. Cells are cultured on the thin film dish in the same way as any conventional plastic dish. The researcher can culture cells in the usual procedure, observe the cells in the optical microscope, and focus on areas of interests in the ASEM for further imaging.
ClairScope™ is expected to be widely used in a variety of fields including basic biology, medicine, pharmaceutical, and cosmetics.
[ Other applications ]
Dynamic observation of chemical reaction
Real time high resolution imaging can reveal the mechanism of chemical reactions in liquid and vapor. Traditionally, this has been accomplished by TEM with an environmental cell. However, TEM can only accept thin film samples, and SEM imaging has been in demand for certain samples. ClairScope™, designed to image samples in atmospheric pressure in the ASEM, is capable of real time imaging of chemical reactions in liquid and vapor. The open top of the thin film facilitates chemical administration, and enables observation of gas emitting reactions. Furthermore, the system allows the optical microscope on top to alternately observe the same area of view as the ASEM. The system has succeeded in dynamic observation of hydrolytic reactions of plaster.
Dynamic observation of drying process
Drying is a critical process in various industries. However, it has been difficult to achieve dynamic observation of the drying process at higher resolution than optical microscopy. ClairScope™, with the open top of the thin dish, enable observation of the drying process of solvents. It has succeeded in dynamic observation of the drying process of a salt containing solvent from drying to crystallization.
Dynamic observation of electrochemical reaction
Electrochemical reactions, related to batteries, plating, corrosion, and refinement, is essential in many industries. High resolution imaging of electrochemical reactions in liquid has been a difficult issue. ClairScope™, capable of real time high resolution imaging of reactions in liquid in atmospheric pressure in the ASEM, also supports dynamic observation of electrochemical reactions. With the open top of the dish, the system is also effective in observing electrochemical reactions generating gases. It has succeeded in dynamic observation of electrochemical reactions of a sample loaded onto a prototype thin film dish incorporating an electrode in the thin film.
Basic physics
Particles in liquid are known to demonstrate Brownian motion and self assembly under certain conditions. These reactions are related to the basic motion mechanism of life, a field to be explored extensively. These reactions have been studied in optical microscopy. ClairScope™ has succeeded in real time observation of Brownian motion and self assembly of particles.
Reaction to electron beam irradiation
A high intensity electron beam can induce reactions in liquid and vapor. Using ClairScope™, the operator can induce such reaction in the ASEM for dynamic imaging, and also monitor the reaction using the optical microscope on top.
The NeoScope benchtop SEM, born from the combined expertise of Nikon Instruments and JEOL, is the winner of the SelectScience Scientists’ Choice Award for European Best New General Lab Product 2008.
Announced at the recent ACHEMA exhibition in Germany, the Scientists' Choice Awards were based on the results of an independent poll of more than 25,000 scientists from the SelectScience online community, who were asked to nominate and vote for what they considered to be the best new products of 2008. SelectScience.net is the leading online resource for applied chemists, clinical chemists and life scientists.
“Scientists are always quick to embrace innovation and new technology,” Chay Keogh, Marketing Manager at Nikon instruments, “The NeoScope is a fresh new approach offering a powerful yet affordable benchtop SEM. The Scientist’s Choice Award confirms that our combined experience of over 150 years in pioneering imaging technology has enabled JEOL and Nikon to lead the way in providing another exciting new tool to help accelerate the pace of research in all fields.”
The SelectScience Choice Award adds to Nikon’s exclusive Perfect Focus System second place ranking in The Scientist’s top innovations of 2008.
JEOL Ltd. (Gon’emon Kurihara, President) announced a new transmission electron microscope, JEM-ARM200F, incorporating a spherical aberration corrector for the electron optic system as standard, to be distributed in March 2009.
[Background]
Transmission electron microscopes are designed to study the geometry and structure of substances at high resolution. They can also analyze the elements constituting substances and the status of electrons by incorporating various analyzers such as energy dispersive X-ray fluorescent spectrometer (EDS) and electron beam energy loss spectrometer (EELS).
A new technology has recently been introduced to correct spherical aberrations that have long restricted the resolving power of electron microscopes. Spherical aberration correctors significantly enhance the resolution and analytical capabilities, enabling ultimate atomic level analysis. The JEM-ARM200F is a powerful transmission electron microscope with a standard spherical aberration corrector, featuring sub angstrom resolution and atomic level analysis.
JEOL Ltd. (Yoshiyasu Harada, President) announced a new model of thermal field emission scanning electron microscopes, JSM-7600F, to be distributed in May 2008.
[Background]
Today’s electronics manufacturers, including semiconductor device makers, are looking for electron microscopes featuring the same size and ease of operation as optical microscopes for inspection of their products developed and processed by micro technologies. The JCM-5000 NeoScope, a desktop electron microscope, is an answer to this increasing demand.
[Features]
Simple operation • Simple imaging procedure utilizing Auto Focus, Auto Contrast/Brightness • Only 3 minutes from sample loading to imaging
Standard large stage to accommodate large samples • XY stroke: 35 x 35 mm • Sample height up to 50 mm supported
No sample treatment needed before imaging • Imaging in High Vacuum or Low Vacuum mode • 3 accelerating voltage levels at 5, 10, and 15 kV to insure high image quality
Wide area of view to facilitate identifying imaging spot • Wide area of view at low magnification (lowest 10x) • High quality live image display at 640x512 pixels for easy adjustment
Compact, light, and energy saving • Consists of 3 modules: base unit, PC, and rotary pump • Compact, light base unit: 492 mm(W) x 458 mm(D) x 434 mm(H); 63 kg • Utility: Single phase 100 V to 240 V, 50/60 Hz, 350 VA only
JEOL Ltd. (Yoshiyasu Harada, President) announced a new model of thermal field emission scanning electron microscopes, JSM-7600F, to be distributed in May 2008.
[Background]
High resolution scanning electron microscopes featuring ease of operation are in increasing demand in the field of material development and processing. JEOL’s new FE SEM, JSM-7600F, was developed to meet this growing demand. The microscope integrates a semi in-lens system for high resolution imaging, and an in-lens thermal electron gun, both of which are a culmination of JEOL’s expertise in imaging and analysis. Its new User Interface enables easy navigation through imaging and analyzing procedures. The JSM-7600F is a powerful tool combining high resolution imaging and high speed analysis.
[Features]
In-lens thermal electron gun + Patented aperture angle optimizing lens JEOL’s proven in-lens thermal electron gun, combined with the aperture angle optimizing lens, achieves a probe current of 200 nA or higher at an accelerating voltage of 15 kV, efficiently acquiring high quality data in elemental analysis. Utilizing the beam finely focused at low accelerating voltage and high probe current, the microscope with a latest EDS detector (SDD detector) can rapidly acquire high resolution X-ray mapping data.
New r-filter for detection of images optimum for research objectives The JSM-7600F incorporates a new energy filter, r-filter, designed to vary the mixture rate of secondary electron and backscattered electron images, enhancing the topography or compositional differences of images as needed.
High performance under any operating conditions The JSM-7600F is capable of high resolution high sensitivity analysis under any combination of operating conditions for various samples and research requirements. Guaranteed resolution at high accelerating voltage: 1.0 nm (30 kV; WD 4.5 mm) Guaranteed resolution at low accelerating voltage: 1.5 nm (1 kV; WD 1.5 mm) Guaranteed resolution at high probe current: 3.0 nm (probe current 5 nA, accelerating voltage 15 kV, WD 8 mm)
New easy to use operator oriented user interface The user interface is designed to collectively define, save, and retrieve photographing and imaging conditions to facilitate data acquisition under optimum conditions. It also supports simultaneous acquisition of 4 different types of images, significantly improving throughput. Speedy imaging also reduces beam damage on the sample being viewed.
Standard 5 axis motor stage; intuitive specimen movement with track ball The standard 5 axis motor drive eucentric stage controls sample movement seamlessly throughout the magnification range from 25x to 1,000,000x. Intuitive specimen control by the track ball assures smooth movement of the area of view in high magnification imaging.
Versatile specimen chamber for optimum analysis The specimen chamber accommodates samples up to 200 mm in diameter, and features a complete set of detector ports secondary electron detector, backscattered electron detector, EDS, WDS, EBSD, and cathode luminescence detector, allowing the user to select an arrangement optimum to their analytical objectives.
JEOL Ltd. (Yoshiyasu Harada, President) announced a new model of dual beam milling/imaging scanning microscope, JIB-4600F, to be distributed in May 2008.
[Background]
As technologies for materials development and processing advance, high resolution imaging and high precision analysis of cross sections are in increasing demand, requiring simple, speedy data acquisition from a variety of samples. The JIB-4600F, a powerful multi beam milling/imaging system, is the answer to these applications.
[Features]
“In-lens thermal FEG” Highly stable probe current and aperture control lens facilitate high resolution image acquisition.
High speed analysis at high current Speedy mapping at a current of 200 nA at maximum
Large current mode (30 nA) For high FIB throughput at high current
Simultaneous viewing of milling process with real time monitor Simultaneous viewing of the milling process in SEM imaging, effective for inner structure analysis and TEM thin film sample preparation
A complete set of ports for full support of your applications Large stage accommodating samples up to 50 mm in diameter, detectors including EDS, EBSD, and CLD effective for analysis of sample surfaces and cross sections.
JEOL Ltd. (Yoshiyasu Harada, President) announced a new model of dual beam milling/imaging scanning microscope, JIB-4500, to be distributed on December 26, 2007.
[Background]
As technologies for materials development and processing advance, high precision analysis is in increasing need, requiring simple, speedy data acquisition from a variety of samples.
In response to these ubiquitous needs, we have developed a dual beam milling/imaging SEM, JIB-4500, a culmination of our expertise and experience in electron and ion optics over the years.
[Features]
LaB6 gun as standard The long lasting gun assures high resolution imaging.
Low vacuum SEM mode as standard The low vacuum mode is effective for imaging of non conductive samples susceptible for charge accumulation.
Large current mode (30 nA) For high FIB throughput
Simultaneous viewing of milling process with real time monitor The milling process is simultaneously viewed and analyzed in SEM imaging, effective for inner structure analysis and TEM thin film sample preparation.
A complete set of ports for full support of your applications Large stage accommodating samples up to 75 mm; various detectors including EDS, EBSD, and CLD
January 2008
JEOL information movie
December 2007
JEOL Ships 10,000th Scanning Electron Microscope
Industry's SEM of Choice for 31 Years
We announce with pride the shipment of the 10,000th general scanning electron microscope in 31 years since our first model, JSM-T20, was installed in 1975. We could not have achieved this milestone without your continued patronage.
The table below summarizes the cumulative total of general scanning electron microscopes shipped and the model changes over time. Many different models, from the first JSM-T20 to the latest JCM-5700, have been used for a wide range of applications. Today's achievement is only a passing point. We will continue our effort in producing superior and versatile microscopes for years to come.
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JEOL Ltd.
JEOL is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection tools), and analytical instruments including mass spectrometers, NMRs and ESRs.
The top of the thin film is open, joined to the optical microscope. The optical microscope being aligned with the ASEM, the operator can image the same area of view alternately between both microscopes.
JEOL Ltd. (Gon’emon Kurihara, President) announced a new transmission electron microscope, JEM-ARM200F, incorporating a spherical aberration corrector for the electron optic system as standard, to be distributed in March 2009.
JEOL Ltd. (Yoshiyasu Harada, President) announced a new model of thermal field emission scanning electron microscopes, JSM-7600F, to be distributed in May 2008.
JEOL Ltd. (Yoshiyasu Harada, President) announced a new model of dual beam milling/imaging scanning microscope, JIB-4600F, to be distributed in May 2008.
JEOL Ltd. (Yoshiyasu Harada, President) announced a new model of dual beam milling/imaging scanning microscope, JIB-4500, to be distributed on December 26, 2007.