Our latest blogs on (Scanning) Electron Microscopes, NMR & Mass Spectometryhttps://www.jeolbenelux.com/JEOL-BV-Newshttps://www.jeolbenelux.com/JEOL-BV-News/PostId/36/release-of-the-jib-4700f-multi-beam-systemProduct IntroductionTue, 07 Mar 2017 11:32:00 GMT<p><span style="font-size:larger;"><span style="color:#000000;">The JIB-4700F features a hybrid conical objective lens, GENTLEBEAM™ (GB) mode and an in-lens detector system to deliver a guaranteed resolution of 1.6nm at a low accelerating voltage of 1 kV. Using an "in-lens Schottky-emission electron gun" that produces an electron beam with a maximum probe-current of 300nA, this newly-developed instrument allows for high-resolution observations and fast analyses. For the FIB column, a high-current density Ga ion beam of up to 90nA maximum probe-current is employed for fast ion milling and processing of specimens.</span></span></p> <p><br /> <span style="font-size:larger;"><span style="color:#000000;">Concurrent with high-speed cross-section processing by FIB, high-resolution SEM observations and fast analyses can be conducted utilizing energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD). Additionally, a three-dimensional analysis function that automatically captures SEM images at certain intervals in cross-section processing is provided as one of the JIB-4700F's standard features. </span></span></p> <p><img alt="JIB-4700F Multi Beam System" src="/Portals/0/JEOL%20JIB-4700F.jpg" style="width: 803px; height: 190px;" title="" /></p> <p><br /> <span style="font-size:larger;"><span style="color: rgb(0, 0, 0);">For more details visit our corporate website: <a href="https://www.jeol.co.jp/en/products/detail/JIB-4700F.html">https://www.jeol.co.jp/en/products/detail/JIB-4700F.html</a></span></span></p> 36