Electron Microscopy NewsOur latest blogs on (Scanning) Electron Microscopes, NMR & Mass Spectometryhttps://www.jeolbenelux.com/JEOL-BV-NewsRelease of the JEM-F200, a multi purpose TEMhttps://www.jeolbenelux.com/JEOL-BV-News/PostId/28/release-of-the-jem-f200-a-multi-purpose-temGeneralMon, 15 Feb 2016 15:52:53 GMT<p style="color: #333333; margin: 0px 0px 10px; padding: 0px; border: 0px; background-color: rgba(255, 255, 255, 0.901961);"><span style="font-size: 13px;">JEOL's latest addition to its suite of Transmission Electron Microscopes is the versatile JEM-F200, also nicknamed "F2", the only advanced analytical, high throughput 200kV S/TEM in its class to offer a Cold Field Emission Gun and dual Silicon Drift Detectors.</span></p> <p style="color: #333333; margin: 0px 0px 10px; padding: 0px; border: 0px; background-color: rgba(255, 255, 255, 0.901961);"><span style="font-size: 13px;">The combined boost in probe current from the Cold FEG with the dual EDS makes this TEM stand out in its class.The 'F2' employs the newest in JEOL innovations in an easy-to-use, extremely stable, high resolution imaging and analytical TEM.</span></p> <p style="color: #333333; margin: 0px 0px 10px; padding: 0px; border: 0px; background-color: rgba(255, 255, 255, 0.901961);"><span style="font-size: 13px;"></span></p> <p style="color: #333333; margin: 0px 0px 10px; padding: 0px; border: 0px; background-color: rgba(255, 255, 255, 0.901961);"><span style="font-size: 13px;">The F2 incorporates many new features: </span></p> <ul> <li style="color: #333333; margin: 0px 0px 10px; padding: 0px; border: 0px; background-color: rgba(255, 255, 255, 0.901961);"><span style="font-size: 13px;">Smart- design, with a new intuitive user interface</span></li> <li style="color: #333333; margin: 0px 0px 10px; padding: 0px; border: 0px; background-color: rgba(255, 255, 255, 0.901961);"><span style="font-size: 13px;">Quad-lens condenser system, <span style="color: #333333;"> the new 4-stageprobe-forming optical system, Quad-Lens condenser system, controls the electron beam intensity and the convergence angle independently to respond to different research requirements.</span></span></li> <li style="color: #333333; margin: 0px 0px 10px; padding: 0px; border: 0px; background-color: rgba(255, 255, 255, 0.901961);"><span style="font-size: 13px;">Advanced Scan system,<span style="color: #333333;">which is capable of scanning the electron beam in the image forming system (optional) , in addition to the standard scanning system for the probe-forming system. This accomplishes wide field STEM-EELS.</span></span></li> <li style="color: #333333; margin: 0px 0px 10px; padding: 0px; border: 0px; background-color: rgba(255, 255, 255, 0.901961);"><span style="font-size: 13px;">Pico Stage Drive, <span style="color: #333333;">which is capable of driving the stage in pico meter steps without a piezo drive, and moving the area of view in a wide dynamic range from an entire sample grid to atomic order images.</span></span></li> <li style="color: #333333; margin: 0px 0px 10px; padding: 0px; border: 0px; background-color: rgba(255, 255, 255, 0.901961);"><span style="font-size: 13px;">Specporter, an auto holder loading/unloading device.</span></li> <li style="color: #333333; margin: 0px 0px 10px; padding: 0px; border: 0px; background-color: rgba(255, 255, 255, 0.901961);"><span style="font-size: 13px;">Improved coldFEG, <span style="color: #333333;">Guaranteeing high stability, high brightness, and high energy resolution, the cold field emission electron gun enables chemical bonding analysis by EELS, speeds up the analytical process by the high brightness electron beam, and minimizes chromatic aberrations from the electron source for enabling high resolution imaging.</span></span></li> <li style="color: #333333; margin: 0px 0px 10px; padding: 0px; border: 0px; background-color: rgba(255, 255, 255, 0.901961);"><span style="font-size: 13px;">Dual SDD, for very fast EDS analysis and minimal sample damage.</span></li> <li style="color: #333333; margin: 0px 0px 10px; padding: 0px; border: 0px; background-color: rgba(255, 255, 255, 0.901961);"><span style="font-size: 13px;">Environmental friendly, the instrument can be switched to ECO mode when not in use, to reduce its energy consumption.</span></li> </ul> <p><span style="font-size: 13px; color: #333333;">Main specification: <span style="color: #333333;">TEM point to point: 0.19 nm </span><span style="color: #333333;">STEM-HAADF: 0.14 nm (using Cold FEG and UHR polepiece)</span></span></p> <p style="text-align: center;"><span style="font-size: 13px; color: #333333;"><img alt="JEM-F200-F2 Transmission Electron Microscope (TEM)" src="/Portals/0/images_seo_2019/JEM-F200-F2_Transmission_Electron_Microscope_(TEM).jpg?ver=2019-04-20-165429-463" style="text-align: center;" /></span></p> 28