Electron Microscopy News

JEOL introduces the JSM-IT200

Fri, 07 Sep 2018 13:50:00 GMT

JEOL combines ease of use, high resolution and quick analysis in the latest SEM model.

With new features JEOL's new and compact scanning electron microscope JSM-IT200 enables the user to quickly and easily perform SEM analysis.

“Zeromag" links the SEM image with Holder Graphics or optical CCD image, which enables the user to quickly locate areas for imaging and analysis.
Autofunctions will do the microscope adjustments.
Fully integrated EDS includes “live EDS Analysis”, displaying the chemical composition of the specimen while imaging.
Smile View™ Lab" for integrated management of image and analysis data, generates very quick reports from all data ranging from collected SEM images to elemental analysis results.
The small footprint and no need for water cooling or gas inlet allows easy installation of the SEM.

For more information, please visit our corporate website: https://www.jeol.co.jp/en/products/detail/JSM-IT200.html

Read more about electron microscopy on JEOL Benelux - Scanning Electron Microscopy (SEM).

JEOL introduces the JSM-IT500

Fri, 01 Sep 2017 10:21:23 GMT

JEOL's latest addition to the InTouchscope series is the JSM-IT500, a new model that incorporates new features that further increase ease of use and create a higher throughput for SEM analysis.

Key point 1 : Zeromag
The displayed Holder Graphics or CCD image enables you to locate the specimen area or specify analysis positions. You can rapidly search the specimen area and specify positions for multiple-field serial analysis.

Key point 2 : Live Analysis (Only for A/LA)
With "Live Analysis", the embedded EDS system shows a real time EDS spectrum during image observation. Elemental composition or "Alert" for element of interest is displayed on a live image.

Key point 3 : Integrated data management software
This user-friendly software enables you to select and review SEM images and analysis results through the data management area. You can also generate a report with a single click.

Please take a look at the video to see how the new features work: https://youtu.be/Kad1BzLWT5E

Release of the JSM-7900 UHR FEG-SEM

Wed, 23 Aug 2017 07:56:50 GMT

JSM-7900F is JEOL’s new flagship FE-SEM which combines ultimate high resolution imaging, enhanced stability and exceptional ease of use for any level of operator in multi-user environment.

Newly developed functionality that integrates lens control system and automatic technology, "Neo Engine" (New Electron Optical Engine) is a standard feature, allowing for fast and easy image acquisition at any accelerating voltage and probe current.
The system is the premier example of the JEOL’s advanced electron optics technology.

For more details visit our corporate website: https://www.jeol.co.jp/en/products/detail/JSM-7900F.html

JEOL releases the JSM-IT300HR

Tue, 25 Oct 2016 09:21:00 GMT

The JSM-IT300HR is the latest model in the InTouchscope Series. The succesful series has been expanded with a model that comes standard with a Field Emission Gun and Low Vacuum capabilities, based on the JSM-IT300 Tungsten SEM.

This versatile and powerful microscope allows for very easy and very fast imaging at high magnifications, so that even novice users can quickly enjoy the benefits of a Field Emission Gun.

Main features:

New high-brightness electron gun and optical system provide high resolution imaging and high spatial-resolution analysis.
Intuitive operation is enabled by Touch panel functions, Automatic functions and Recipe functions.
Easy-to-use software interface (GUI) includes full integration of image observation and element analysis, allowing even novice users to perform any task with high efficiency.
Large specimen stage which accommodates various sizes and types of specimens for extended observation and analysis.
Small footprint equivalent to the conventional general-purpose SEM.

More detailed information and example images can be found on our corporate website: https://www.jeol.co.jp/en/news/detail/20160907.1675.html

Release of the JEM-F200, a multi purpose TEM

Mon, 15 Feb 2016 15:52:53 GMT

JEOL's latest addition to its suite of Transmission Electron Microscopes is the versatile JEM-F200, also nicknamed "F2", the only advanced analytical, high throughput 200kV S/TEM in its class to offer a Cold Field Emission Gun and dual Silicon Drift Detectors.

The combined boost in probe current from the Cold FEG with the dual EDS makes this TEM stand out in its class.The 'F2' employs the newest in JEOL innovations in an easy-to-use, extremely stable, high resolution imaging and analytical TEM.

The F2 incorporates many new features:

Smart- design, with a new intuitive user interface
Quad-lens condenser system, the new 4-stageprobe-forming optical system, Quad-Lens condenser system, controls the electron beam intensity and the convergence angle independently to respond to different research requirements.
Advanced Scan system,which is capable of scanning the electron beam in the image forming system (optional) , in addition to the standard scanning system for the probe-forming system. This accomplishes wide field STEM-EELS.
Pico Stage Drive, which is capable of driving the stage in pico meter steps without a piezo drive, and moving the area of view in a wide dynamic range from an entire sample grid to atomic order images.
Specporter, an auto holder loading/unloading device.
Improved coldFEG, Guaranteeing high stability, high brightness, and high energy resolution, the cold field emission electron gun enables chemical bonding analysis by EELS, speeds up the analytical process by the high brightness electron beam, and minimizes chromatic aberrations from the electron source for enabling high resolution imaging.
Dual SDD, for very fast EDS analysis and minimal sample damage.
Environmental friendly, the instrument can be switched to ECO mode when not in use, to reduce its energy consumption.

Main specification: TEM point to point: 0.19 nm STEM-HAADF: 0.14 nm (using Cold FEG and UHR polepiece)

Release of a new Field-Emission Scanning Electron Microscope: The JSM-7200F

Fri, 08 Jan 2016 09:56:48 GMT

JEOL has released the JSM-7200F, a multi-purpose FE-SEM combining high-resolution and easy operation.

Scanning electron microscopes have been used in a wide range of fields and for diverse applications. The JSM-7200F utilizes JEOL proprietary in-lens Schottky Plus technology that allows improvement in the resolution at low accelerating voltages (1.6 nm @ 1 kV), and achieves a maximum probe current of 300 nA. The JSM-7200F is a multi-purpose FE-SEM that can satisfy a wide range of needs with both higher resolution and easier operation than conventional instruments.The features include:

High resolution of 1.6 nm at 1 kV, 1.2nm at 30kV.
High-speed analysis: maximum probe current of 300 nA, allowing short acquisition time for EDS, WDS, and EBSD, while maintaining high resolution.
Energy signal differentiation: incorporation of the TTL (through-the-lens) system in the standard configuration enables the use of energy filtering to selectively differentiate the electron energies.
Wide area analysis: the LDF (long depth of field) mode enables applications like wide-area EBSD analysis, without the need to use stage scan (montage).

New Versatile Compact SEM from JEOL

Fri, 13 Nov 2015 11:28:00 GMT

JEOL has released the JSM-IT100, the successor of the very popular and succesful InTouchscope JSM-6010 series. The JSM-IT100 is a simple-to-use versatile, research-grade SEM with a compact ergonomic design.

The JSM-IT100 is very easy to use, due to the very intuitive user interface and has a formidable price-performance ratio. This compact SEM is a versatile workhorse SEM that can be configured to meet individual lab requirements. It offers high resolution imaging, and offers a range of acceleration voltages at both high and low vacuum modes.

With the JSM-IT100, it is simple to quickly obtain high quality images using both Secondary Electron and Backscatter Imaging. The embedded JEOL EDS system with silicon drift detector technology now includes Spectral Mapping, Multi-Point Analysis, Automatic Drift Compensation, Partial area, Line Scan, and Mapping Filter functions.

JEOL's popular InTouchScope series includes the NeoScope benchtop SEM with selectable HV/LV and the JSM-IT300LV with advanced analytical capabilities and imaging of large, intact samples.