Electron Microscopy News

JEOL introduces the JSM-F100

Thu, 15 Aug 2019 14:01:01 GMT

JSM-F100 is an easy-to-use FEG-SEM for high resolution imaging. This latest model Scanning Electron Microscope is equipped with our NEO-engine, LIVE-AI image filter and a brandnew GUI. Together this speeds up the workflow significantly.

Furthermore, the JSM-F100 comes with a JEOL energy dispersive X-ray spectrometer (EDS), which is fully integrated within "SEM Center" for seamless acquisition from images to elemental analysis results. Inspired by users in pursuing the evolution, and integration, of high performance and operability, the JSM-F100 achieves a superb work efficiency, leading to dramatically increased high throughput capabilities.

For more information please visit https://www.jeol.co.jp/en/products/detail/JSM-F100.html

JEOL introduces the JSM-IT200

Fri, 07 Sep 2018 13:50:00 GMT

JEOL combines ease of use, high resolution and quick analysis in the latest SEM model.

With new features JEOL's new and compact scanning electron microscope JSM-IT200 enables the user to quickly and easily perform SEM analysis.

“Zeromag" links the SEM image with Holder Graphics or optical CCD image, which enables the user to quickly locate areas for imaging and analysis.
Autofunctions will do the microscope adjustments.
Fully integrated EDS includes “live EDS Analysis”, displaying the chemical composition of the specimen while imaging.
Smile View™ Lab" for integrated management of image and analysis data, generates very quick reports from all data ranging from collected SEM images to elemental analysis results.
The small footprint and no need for water cooling or gas inlet allows easy installation of the SEM.

For more information, please visit our corporate website: https://www.jeol.co.jp/en/products/detail/JSM-IT200.html

Read more about electron microscopy on JEOL Benelux - Scanning Electron Microscopy (SEM).

Release of the JIB-4700F Multi Beam System

Tue, 07 Mar 2017 11:32:00 GMT

The JIB-4700F features a hybrid conical objective lens, GENTLEBEAM™ (GB) mode and an in-lens detector system to deliver a guaranteed resolution of 1.6nm at a low accelerating voltage of 1 kV. Using an "in-lens Schottky-emission electron gun" that produces an electron beam with a maximum probe-current of 300nA, this newly-developed instrument allows for high-resolution observations and fast analyses. For the FIB column, a high-current density Ga ion beam of up to 90nA maximum probe-current is employed for fast ion milling and processing of specimens.

Concurrent with high-speed cross-section processing by FIB, high-resolution SEM observations and fast analyses can be conducted utilizing energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD). Additionally, a three-dimensional analysis function that automatically captures SEM images at certain intervals in cross-section processing is provided as one of the JIB-4700F's standard features.

For more details visit our corporate website: https://www.jeol.co.jp/en/products/detail/JIB-4700F.html