Electron Microscopy NewsOur latest blogs on (Scanning) Electron Microscopes, NMR & Mass Spectometryhttps://www.jeolbenelux.com/JEOL-BV-NewsJEOL is releasing new triple quadrupole mass spectrometerhttps://www.jeolbenelux.com/JEOL-BV-News/PostId/121/jeol-expands-its-lineup-of-gas-chromatograph-mass-spectrometry-with-releasing-new-triple-quadrupole-mass-spectrometerProduct IntroductionMon, 27 Aug 2018 12:53:00 GMT<p>JEOL Ltd. (President Gon-emon Kurihara) announces the release of new Gas Chromatograph(GC) -  triple quadrupole mass spectrometer system, JMS-TQ4000GC on August, 2018.</p> <p>JMS-TQ4000GC is a GC-triple quadrupole mass spectrometer system with both capabilities of high throughput and high sensitivity based on the unique “Short collision cell technology”. Those capabilities can improve the productivity for routine analysis such as residual pesticides analysis in agricultural materials or monitoring of trace amount of chemicals regulated by tap water quality standard and environmental criteria in each region or country.</p> <p>It is expected that JMS-TQ4000GC would contribute to expand JEOL’s market share of not only GC-triple quadrupole mass spectrometer but also GC-single quadrupole mass spectrometer or GC –time-of-flight mass spectrometer.</p> <p>[Main Features]</p> <p>1.   Short collision cell technology enables high speed data acquisition without crosstalk</p> <p>JMS-TQ4000GC can achieve the fastest SRM (Selected Reaction Monitor) switching speed in the industry at 1,000 channels/sec. Moreover, even at the fast SRM it can eliminate ion interaction among SRM channels (crosstalk) and makes it possible to analyze multi-target compounds with high accuracies.</p> <p>2.   High sensitivity achieved with ion accumulation and pulsed ion ejection at short collision cell</p> <p>Short collision cell has both capabilities of ion accumulation and pulsed ion ejection. Noise level of signal can be reduced as much as possible by acquire data only when an ion pulse arrives at the detector. The noise reduction leads to high sensitivity.</p> <p>3.   Simple operation for data acquisition and analysis with a combination of pre-installed SRM condition file and multi-target quantitative analysis software.</p> <p>The “peak dependent SRM” system automatically creates the optimized measurement condition when the target pesticides are selected from the pre-installed SRM condition files. After measurement, the multi-target quantitative analysis software “Escrime” analyzes the data and creates the analysis reports according to the report format template selected in advance. In addition, the unique functionalities of “Escrime” such as “Slide show for chromatographic peaks check” and “Across-the-board manual peak integration” make the data verification easier and faster.</p> <p>[Main Specification]</p> <p>Measurement modes : Scan, SIM, Scan&SIM, SRM, Product-ion scan, Neutral loss scan, Precursor-ion scan, Scan&SRM</p> <p>m/z range : 4~1,022</p> <p>SRM speed : 1,000 channels/sec</p> <p><img alt="Gas Chromatograph JMS-TQ4000GC -  Triple Quadrupole Mass Spectrometer System - JEOL Benelux" src="/Portals/0/images_seo_2019/Gas_Chromatograph_JMS-TQ4000GC_Triple_Quadrupole_Mass_Spectrometer_System-JEOL%20Benelux.jpg?ver=2019-03-20-085038-397" style="width: 400px; height: 250px;" /></p> 121JEOL (Europe) BV introduces: Photo Ion-Source for JMS-T200GC AccuTOF GCxhttps://www.jeolbenelux.com/JEOL-BV-News/PostId/29/jeol-europe-bv-introduces-photo-ion-source-for-jms-t200gc-accutof-gcxGeneralFri, 19 Feb 2016 11:27:19 GMT<p style="margin-bottom: 0.0001pt;"><span style="font-size: 13px;">Electron ionization (EI), generally used for GC/MS and GCxGC/MS analysis, produces fragment ions. Fragments are valuable for database search and compound identification. </span><span style="font-size: small;">However, fragmentation adds an additional level of complexity in interpreting complex mixtures, such as crude oil. Some compounds (e.g. alkanes, alcohols) do not produce abundant (or any) molecular ions.</span></p> <p style="margin-bottom: 0.0001pt;"><span style="font-size: small;"></span></p> <p><span style="font-size: 13px;">Since photoionization (PI) is a softer ionization method than EI, molecular ion can be easily distinguished using this technique. For some analytes, characteristic fragment ions may also be observed. </span><span style="font-size: small;">Combining soft ionization with high-resolution exa</span><span style="font-size: small;">ct-mass data and new software tools simplifies processing of complex GC and GCxGC data (e.g. petroleum type analysis).</span></p> <p style="margin-bottom: 0.0001pt;"><span style="font-size: 13px;">PI provides clear molecular ions and elemental composition that can be combined with EI data to identify unknowns and also provides selective ionization of target compounds</span></p> <p style="margin-bottom: 0.0001pt;"><span style="font-size: 13px;"></span></p> <p style="margin-bottom: 0.0001pt;"><span style="font-size: small;">The JEOL PI source is designed as a PI/EI combination ion source. Switching between PI and EI can be done without breaking vacuum of the ion source, even without breaking any vacuum. Also during an analytical run it is possible to switch between PI/EI and vice versa. The accurate mass will always stay available whatever ionisation technique is used with our JMS-T200GC AccuTOF GCx.</span></p> <p style="margin-bottom: 0.0001pt;"><span style="font-size: small;"></span></p> <p><span style="font-size: small; text-align: center;">At this moment a PI source is available for our GC-TOF and GC-Quadrupole systems.</span></p> <p style="text-align: center;"><img alt="JEOL Photo Ion-Source" src="https://www.jeolbenelux.com/Portals/0/PI%20T200.jpg" style="font-size: small; text-align: center; width: 350px; height: 296px;" /></p> 29JEOL Europe BV at PEFTEChttps://www.jeolbenelux.com/JEOL-BV-News/PostId/22/jeol-europe-bv-at-peftecEventThu, 01 Oct 2015 13:50:00 GMT<p>JEOL Europe BV would like to invite you to visit stand 90 at PEFTEC 2015 on the 18th & 19th of November 2015 at the Antwerp Expo.</p> 22JEOL (Europe) BV present at Labtechnology 2015https://www.jeolbenelux.com/JEOL-BV-News/PostId/21/jeol-europe-bv-present-at-labtechnology-2015EventFri, 28 Aug 2015 14:34:00 GMT<p><span style="font-size: 13px;">On the 7th and 8th of October the exhibition Labtechnology 2015 will be held at the Jaarbeurs in Utrecht. JEOL (Europe) BV will be present to promote our recent developments and new products in the field of NMR, Mass spectrometry and Electron Optics. You can find us at booth C18.</span></p> <p><span style="font-size: 13px;">To register for this exhibition please visit <a href="https://labtechnology.nl/" target="_blank">https://labtechnology.nl/</a></span></p> <p style="text-align: center;"><img alt="Logo Exhibition Labtechnology 2015" src="https://www.jeolbenelux.com/Portals/0/Images/logo-labtech.png" style="text-align: center; width: 444px; height: 106px; float: left;" /></p> <p> </p> 21