Electron Microscopy NewsOur latest blogs on (Scanning) Electron Microscopes, NMR & Mass Spectometryhttps://www.jeolbenelux.com/JEOL-BV-NewsJEOL releases the JSM-IT300HRhttps://www.jeolbenelux.com/JEOL-BV-News/PostId/35/jeol-releases-the-jsm-it300hrProduct IntroductionTue, 25 Oct 2016 09:21:00 GMT<p><span style="font-size:larger;">The JSM-IT300HR is the latest model in the InTouchscope Series. The succesful series has been expanded with a model that comes standard with a Field Emission Gun and Low Vacuum capabilities, based on the JSM-IT300 Tungsten SEM.</span></p> <p style="margin-left: 120px;"><img alt="" src="/Portals/0/IT300HR.jpg" style="width: 400px; height: 328px;" title="" /></p> <p><span style="font-size:larger;">This versatile and powerful microscope allows for very easy and very fast imaging at high magnifications, so that even novice users can quickly enjoy the benefits of a Field Emission Gun. </span></p> <p><span style="font-size:larger;">Main features:</span></p> <ol> <li><span style="font-size:larger;">New high-brightness electron gun and optical system provide high resolution imaging and high spatial-resolution analysis.</span></li> <li><span style="font-size:larger;">Intuitive operation is enabled by Touch panel functions, Automatic functions and Recipe functions.</span></li> <li><span style="font-size:larger;">Easy-to-use software interface (GUI) includes full integration of image observation and element analysis, allowing even novice users to perform any task with high efficiency.</span></li> <li><span style="font-size:larger;">Large specimen stage which accommodates various sizes and types of specimens for extended observation and analysis.</span></li> <li><span style="font-size:larger;">Small footprint equivalent to the conventional general-purpose SEM.</span></li> </ol> <p><span style="font-size:larger;">More detailed information and example images can be found on our corporate website: <a href="https://www.jeol.co.jp/en/news/detail/20160907.1675.html" target="_blank">https://www.jeol.co.jp/en/news/detail/20160907.1675.html</a></span></p> 35Release of a new Field-Emission Scanning Electron Microscope: The JSM-7200Fhttps://www.jeolbenelux.com/JEOL-BV-News/PostId/26/release-of-a-new-field-emission-scanning-electron-microscope-the-jsm-7200fGeneralFri, 08 Jan 2016 09:56:48 GMT<p class="style1"><span style="font-size: 13px;">JEOL has released the  JSM-7200F, a m<span class="style1">ulti-purpose FE-SEM combining high-resolution and easy operation</span>.</span></p> <p class="style1"><span style="font-size: 13px;">Scanning electron microscopes have been used in a wide range of fields and for diverse applications. The JSM-7200F utilizes JEOL proprietary in-lens Schottky Plus technology that allows improvement in the resolution at low accelerating voltages (1.6 nm @ 1 kV), and achieves a maximum probe current of 300 nA. The JSM-7200F is a multi-purpose FE-SEM that can satisfy a wide range of needs with both higher resolution and easier operation than conventional instruments.The features in<span class="Normal">clude:</span></span></p> <ol> <li><span class="Normal" style="font-size: 13px;">High resolution of 1.6 nm at 1 kV, 1.2nm at 30kV.</span></li> <li><span class="Normal" style="font-size: 13px;">High-speed analysis: maximum probe current of 300 nA, allowing short acquisition time for EDS, WDS, and EBSD, while maintaining high resolution.</span></li> <li><span class="Normal" style="font-size: 13px;">Energy signal differentiation: incorporation of the TTL (through-the-lens) system in the standard configuration enables the use of energy filtering to selectively differentiate the electron energies.</span></li> <li><span class="Normal" style="font-size: 13px;">Wide area analysis: the LDF (long depth of field) mode enables applications like wide-area EBSD analysis, without the need to use stage scan (montage).</span></li> </ol> <p style="text-align: center;"><span style="font-size: 12px; line-height: 16px;"><img alt="" src="https://www.jeolbenelux.com/Portals/0/JSM-7200F.jpg" style="text-align: center; width: 300px; height: 312px;" /></span></p> 26