Release of a new Field-Emission Scanning Electron Microscope: The JSM-7200F

Fri, 08 Jan 2016 09:56:48 GMT

JEOL has released the JSM-7200F, a multi-purpose FE-SEM combining high-resolution and easy operation.

Scanning electron microscopes have been used in a wide range of fields and for diverse applications. The JSM-7200F utilizes JEOL proprietary in-lens Schottky Plus technology that allows improvement in the resolution at low accelerating voltages (1.6 nm @ 1 kV), and achieves a maximum probe current of 300 nA. The JSM-7200F is a multi-purpose FE-SEM that can satisfy a wide range of needs with both higher resolution and easier operation than conventional instruments.The features include:

High resolution of 1.6 nm at 1 kV, 1.2nm at 30kV.
High-speed analysis: maximum probe current of 300 nA, allowing short acquisition time for EDS, WDS, and EBSD, while maintaining high resolution.
Energy signal differentiation: incorporation of the TTL (through-the-lens) system in the standard configuration enables the use of energy filtering to selectively differentiate the electron energies.
Wide area analysis: the LDF (long depth of field) mode enables applications like wide-area EBSD analysis, without the need to use stage scan (montage).

Electron Microscopy News

Release of a new Field-Emission Scanning Electron Microscope: The JSM-7200F