Electron Microscopy News

JSM-IT810 released, a new Field Emission SEM

Tue, 30 Jul 2024 13:16:03 GMT

Field Emission Scanning Electron Microscopes (FE-SEM) are widely used in science and technology fields such as research institutes, universities, and industry. There is a growing demand for an instrument that can be used easily, accurately, quickly, and efficiently from observation to analysis.
The JSM-IT810 adds the "Neo Action" automatic observation and analysis function and automatic calibration function to the JSM-IT800, which is equipped with the next-generation electron optical control system “Neo Engine” and the "SEM Center" for high operability such as Zeromag and EDS integration, to not only improve efficiency and productivity but also help solve labor shortages.

Main Features
1. Automatic Observation and Analysis Function "Neo Action"
All you need to do is select the SEM image acquisition conditions and field of view, and the function automatically performs SEM observation and EDS (energy dispersive X-ray spectroscopy) analysis. This function contributes to improving the efficiency of routine work including analysis work.

2. Automatic Calibration Function "SEM Automatic Adjustment Package"
This function enables automatic execution of the selected items in alignment adjustment, magnification adjustment, and EDS energy calibration.

3. "Live Function"
This function is capable of Live 3D, Live Analysis, and Live Map functions. 3D images can be constructed on the spot while an SEM observation is being performed to obtain unevenness and depth information. In addition, it helps always display characteristic X-ray spectrum and elemental mapping.

4. EDS Integration
Observation by an SEM and analysis by an EDS are integrated. Analysis of point, area, and MAP can be performed from the observation screen. Incorporation of the Windowless EDS-Gather-X enables detection from Li and analysis at a high sensitivity and high spatial resolution.

Click here to learn more. Or contact the JEOL BV sales team sales@jeolbenelux.com

JEOL Present at Laborama 2022

Fri, 06 May 2022 12:30:55 GMT

JEOL (Europe) BV will be present at Laborama 2022, on the 18th and 19th of May in the Brussels Expo in Brussels. You are more than welcome to visit us and be informed about our latest developments on SEM, MS and NMR. You can find us at Booth B17. We will have our JCM-7000 Benchtop SEM on display.

For more Information about this event, please visit: http://expo.laborama.be/nl

JEOL (Europe) BV offering Refurbished Instruments

Fri, 31 Jul 2020 10:34:14 GMT

We have recently taken back several instruments that are still in excellent condition and can be offered as refurbished microscopes.

JEM-1010 100kV TEM with Megaview Camera

JEM-1010

JEM-1200EXII 120kV TEM with STEM
JEM-1200EXII 120kV TEM with Orius Camera and EDX

JEM-1200EXII

JSM-6380 Compact W-SEM with SE detector (same size as 6060LV)
JSM-6060LV Compact W-SEM with SE and BSE detector

JSM-6060LV

JSM-6700F Cold FEG-SEM with in chamber SE, in-lens SE, retractable BSE detector and STEM detector

JSM-6700F

For any further details or questions, please contact us: Sales(at)jeolbenelux.com

JEOL introduces the JSM-F100

Thu, 15 Aug 2019 14:01:01 GMT

JSM-F100 is an easy-to-use FEG-SEM for high resolution imaging. This latest model Scanning Electron Microscope is equipped with our NEO-engine, LIVE-AI image filter and a brandnew GUI. Together this speeds up the workflow significantly.

Furthermore, the JSM-F100 comes with a JEOL energy dispersive X-ray spectrometer (EDS), which is fully integrated within "SEM Center" for seamless acquisition from images to elemental analysis results. Inspired by users in pursuing the evolution, and integration, of high performance and operability, the JSM-F100 achieves a superb work efficiency, leading to dramatically increased high throughput capabilities.

For more information please visit https://www.jeol.co.jp/en/products/detail/JSM-F100.html

JEOL Present at Labtechnology 2019

Fri, 02 Aug 2019 11:02:24 GMT

On the 1st and 2nd of October the exhibition Labtechnology 2019 will be held at the Jaarbeurs in Utrecht. JEOL (Europe) BV will be present to promote our recent developments and new products in the field of NMR, Mass spectrometry and Electron Optics. You can find us at booth A17..

We will have our latest Benchtop SEM, the JCM-7000 live on display, and we will present our most recent Triple Quadrupole Mass Spectrometer, the JMS-TQ4000GC

To sign up for this event, please visit https://labtechnology.nl

Precisiebeurs 2019

Fri, 02 Aug 2019 10:50:37 GMT

JEOL (Europe) BV will be present at the Precision Fair 2019 on the 13th and 14th ofNovember at the Koningshof in Veldhoven. You are invited to stand 208 to receive a live demonstration of our brandnew JCM-7000 Benchtop SEM.

To pre-register, please visit https://precisiebeurs.nl/

New software for SEM Asbestos Analysis

Wed, 12 Sep 2018 12:21:00 GMT

Application Note: Frame Step Analyzer for Asbestos analysis.

We have released a software module for JEOL SEMs to assist the operator with asbestos analysis.

The operator can program any number of fields to be viewed, and with one press of a button the microscope can move to the next field.

When an asbestos fiber has been found and identified, it can be registered in a table, which can be saved as a report.

Applicable instruments: IT100, IT200, IT300 and IT500 series

For more information please contact us.

JEOL introduces the JSM-IT200

Fri, 07 Sep 2018 13:50:00 GMT

JEOL combines ease of use, high resolution and quick analysis in the latest SEM model.

With new features JEOL's new and compact scanning electron microscope JSM-IT200 enables the user to quickly and easily perform SEM analysis.

“Zeromag" links the SEM image with Holder Graphics or optical CCD image, which enables the user to quickly locate areas for imaging and analysis.
Autofunctions will do the microscope adjustments.
Fully integrated EDS includes “live EDS Analysis”, displaying the chemical composition of the specimen while imaging.
Smile View™ Lab" for integrated management of image and analysis data, generates very quick reports from all data ranging from collected SEM images to elemental analysis results.
The small footprint and no need for water cooling or gas inlet allows easy installation of the SEM.

For more information, please visit our corporate website: https://www.jeol.co.jp/en/products/detail/JSM-IT200.html

Read more about electron microscopy on JEOL Benelux - Scanning Electron Microscopy (SEM).

JEOL present at the Precision Fair 2018

Wed, 05 Sep 2018 12:03:00 GMT

JEOL (Europe) BV will be present at the Precision Fair 2018 on the 14th and 15th of november at the Koningshof in Veldhoven. You are invited to stand 208 to receive a live demonstration of our JCM-6000Plus Benchtop SEM

To pre-register, please visit https://precisiebeurs.nl/

Visit JEOL at WOTS 2018

Wed, 05 Sep 2018 11:58:00 GMT

WOTS 2018 will be held from October 2nd until October 5th in the Jaarbeurs Utrecht.

JEOL will be present with live SEM demonstrations on our latest model, the JSM-IT200 and we will have our latest Triple Quad Mass Spectrometer on display, the JMS-TQ4000GC.

Of course there will also be plenty of opportunity to discuss with our product specialists to discuss your application and how our instrumentation will help you find your answers. Our booth number is 07E084.

JEOL Introduces the JSM-IT500HR

Fri, 02 Mar 2018 16:05:18 GMT

The JSM-IT500HR, the Field Emission version of the JSM-IT500, has been released. With this model all existing features of the IT500 are now incorporated into a High Resolution platform, enabling seemless operation from an optical image to a high resolution image.

For application examples and to see how the features work, please visit our corporate website:

https://www.jeol.co.jp/en/products/special_edition/2017/special01.html

JEOL Present at Laborama 2018

Fri, 02 Mar 2018 13:52:29 GMT

JEOL (Europe) BV will be present at the Laborama Expo 2018, on the 15th and 16th of March in the Brussels Kart Expo in Groot Bijgaarden. We will have our benchtop SEM on display. You are more than welcome to visit us and be informed about our latest developments on SEM, MS and NMR. You can find us at Booth B4.

For more Information about this event, please visit: http://expo.laborama.be/nl

JEOL present at Labtechnology 2017

Fri, 01 Sep 2017 11:32:00 GMT

On the 3rd and 4th of October the exhibition Labtechnology 2017 will be held at the Jaarbeurs in Utrecht. JEOL (Europe) BV will be present to promote our recent developments and new products in the field of NMR, Mass spectrometry and Electron Optics. You can find us at booth B16.

To sign up for this event, please visit https://labtechnology.nl

JEOL introduces the JSM-IT500

Fri, 01 Sep 2017 10:21:23 GMT

JEOL's latest addition to the InTouchscope series is the JSM-IT500, a new model that incorporates new features that further increase ease of use and create a higher throughput for SEM analysis.

Key point 1 : Zeromag
The displayed Holder Graphics or CCD image enables you to locate the specimen area or specify analysis positions. You can rapidly search the specimen area and specify positions for multiple-field serial analysis.

Key point 2 : Live Analysis (Only for A/LA)
With "Live Analysis", the embedded EDS system shows a real time EDS spectrum during image observation. Elemental composition or "Alert" for element of interest is displayed on a live image.

Key point 3 : Integrated data management software
This user-friendly software enables you to select and review SEM images and analysis results through the data management area. You can also generate a report with a single click.

Please take a look at the video to see how the new features work: https://youtu.be/Kad1BzLWT5E

Release of the JSM-7900 UHR FEG-SEM

Wed, 23 Aug 2017 07:56:50 GMT

JSM-7900F is JEOL’s new flagship FE-SEM which combines ultimate high resolution imaging, enhanced stability and exceptional ease of use for any level of operator in multi-user environment.

Newly developed functionality that integrates lens control system and automatic technology, "Neo Engine" (New Electron Optical Engine) is a standard feature, allowing for fast and easy image acquisition at any accelerating voltage and probe current.
The system is the premier example of the JEOL’s advanced electron optics technology.

For more details visit our corporate website: https://www.jeol.co.jp/en/products/detail/JSM-7900F.html

JEOL releases the JSM-IT300HR

Tue, 25 Oct 2016 09:21:00 GMT

The JSM-IT300HR is the latest model in the InTouchscope Series. The succesful series has been expanded with a model that comes standard with a Field Emission Gun and Low Vacuum capabilities, based on the JSM-IT300 Tungsten SEM.

This versatile and powerful microscope allows for very easy and very fast imaging at high magnifications, so that even novice users can quickly enjoy the benefits of a Field Emission Gun.

Main features:

New high-brightness electron gun and optical system provide high resolution imaging and high spatial-resolution analysis.
Intuitive operation is enabled by Touch panel functions, Automatic functions and Recipe functions.
Easy-to-use software interface (GUI) includes full integration of image observation and element analysis, allowing even novice users to perform any task with high efficiency.
Large specimen stage which accommodates various sizes and types of specimens for extended observation and analysis.
Small footprint equivalent to the conventional general-purpose SEM.

More detailed information and example images can be found on our corporate website: https://www.jeol.co.jp/en/news/detail/20160907.1675.html

JEOL present at WOTS 2016

Tue, 02 Aug 2016 15:30:00 GMT

During WOTS 2016 from October 4th until October 7th in Utrecht, JEOL will be present with live SEM demonstrations and a variety of lectures on the latest developments regarding SEM, TEM, MS and NMR.

Every day presentations will be given in our on-booth lecture room:

Novelties in Liquid and Solids NMR 11:00-11:30

SEM at your fingertips 12:00-12:30

Gas and Volatiles analysis with High resolution MS 14:00-14:30

Introduction to the all-purpose TEM 15:00-15:30

See you at WOTS 2016!

JEOL Celebrating 50 years of SEM

Mon, 01 Aug 2016 13:08:00 GMT

In 2016 we are celebrating 50 years of JEOL scanning electron microscopes!

Since the launch of our first SEM in 1966, the JSM-1, we have been constantly developing and improving the ease-of-use and the performance of our SEMs, with the support of our customers.

Since 1966, more than 22.000 JEOL SEMs have been installed worldwide!

JEOL present at Materials 2016

Thu, 31 Mar 2016 12:41:00 GMT

JEOL (Europe) BV will be present at Materials 2016, on the 20th and 21st of April in the Konings in Veldhoven. We will have our latest compact SEM, the JSM-IT100LA on display. You are more than welcome to visit us and be informed about our latest developments. You can find us at Booth 91.

For more information, please visit the website https://materials.nl/

JEOL present at Laborama 2016

Fri, 08 Jan 2016 14:05:43 GMT

JEOL (Europe) BV will be present at the Laborama Expo 2016, on the 17th and 18th of March in the Brussels Kart Expo in Groot Bijgaarden. We will have our Nanalysis NMReady Benchtop NMR on display, as well as our latest compact SEM, the JSM-IT100LA. You are more than welcome to visit us and be informed about our latest developments. You can find us at Booth I11.

http://expo.laborama.be/