<rss version="2.0" xmlns:atom="http://www.w3.org/2005/Atom" xmlns:media="http://search.yahoo.com/mrss/"><channel><atom:link href="https://www.jeolbenelux.com/DesktopModules/LiveBlog/API/Syndication/GetRssFeeds?Tag=sem-edx&amp;mid=533&amp;PortalId=0&amp;tid=95&amp;ItemCount=20" rel="self" type="application/rss+xml" /><title>Electron Microscopy News</title><description>Our latest blogs on (Scanning) Electron Microscopes, NMR &amp; Mass Spectometry</description><link>https://www.jeolbenelux.com/JEOL-BV-News</link><item><title>New Versatile Compact SEM from JEOL</title><link>https://www.jeolbenelux.com/JEOL-BV-News/PostId/25/new-versatile-compact-sem-from-jeol</link><category>General</category><pubDate>Fri, 13 Nov 2015 11:28:00 GMT</pubDate><description>&lt;p style="text-align: left;"&gt; &lt;/p&gt;

&lt;p style="color: #333333; margin: 0px 0px 10px; padding: 0px; border: 0px; text-align: center; background-color: rgba(255, 255, 255, 0.901961);"&gt;&lt;span&gt;&lt;img alt="" src="https://www.jeolbenelux.com/Portals/0/JSM-IT100.jpg" style="text-align: center; width: 225px; height: 225px;" /&gt;&lt;/span&gt;&lt;/p&gt;

&lt;p style="color: #333333; margin: 0px 0px 10px; padding: 0px; border: 0px; text-align: left; background-color: rgba(255, 255, 255, 0.901961);"&gt;&lt;span style="font-size: 13px;"&gt;JEOL has released the JSM-IT100, the successor of the very popular and succesful InTouchscope JSM-6010 series. The JSM-IT100 is a simple-to-use versatile, research-grade SEM with a compact ergonomic design.&lt;/span&gt;&lt;/p&gt;

&lt;p style="color: #333333; margin: 0px 0px 10px; padding: 0px; border: 0px; background-color: rgba(255, 255, 255, 0.901961);"&gt;&lt;span style="font-size: 13px;"&gt;The JSM-IT100 is very easy to use, due to the very intuitive user interface and has a formidable price-performance ratio. This compact SEM is a versatile workhorse SEM that can be configured to meet individual lab requirements. It offers high resolution imaging, and offers a range of acceleration voltages at both high and low vacuum modes.&lt;/span&gt;&lt;/p&gt;

&lt;p style="color: #333333; margin: 0px 0px 10px; padding: 0px; border: 0px; background-color: rgba(255, 255, 255, 0.901961);"&gt;&lt;span style="font-size: 13px;"&gt;With the JSM-IT100, it is simple to quickly obtain high quality images using both Secondary Electron and Backscatter Imaging. The embedded JEOL EDS system with silicon drift detector technology now includes Spectral Mapping, Multi-Point Analysis, Automatic Drift Compensation, Partial area, Line Scan, and Mapping Filter functions.&lt;/span&gt;&lt;/p&gt;

&lt;p style="color: #333333; margin: 0px 0px 10px; padding: 0px; border: 0px; background-color: rgba(255, 255, 255, 0.901961);"&gt;&lt;span style="font-size: 13px;"&gt;JEOL's popular InTouchScope series includes the NeoScope benchtop SEM with selectable HV/LV and the JSM-IT300LV with advanced analytical capabilities and imaging of large, intact samples.&lt;/span&gt;&lt;/p&gt;

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</description><guid isPermaLink="false">25</guid></item></channel></rss>