Electron Microscopy NewsOur latest blogs on (Scanning) Electron Microscopes, NMR & Mass Spectometryhttps://www.jeolbenelux.com/JEOL-BV-NewsJEM-ARM300F: The Ultimate Atomic Resolution Transmission Electron Microscope https://www.jeolbenelux.com/JEOL-BV-News/PostId/20/jem-arm300fGeneralMon, 08 Jun 2015 15:02:00 GMT<p style="color: #333333; margin: 0px 0px 15px;"><span style="font-size: 13px;">Transmission electron microscopy (TEM) has long been a tool essential for micro structure evaluation in the field of materials development.<br /> However, as the fine structures of advanced materials are being designed at the nano level or atomic level, the synthetic process for such materials increasingly requires imaging and analysis at higher resolution.<br /> <br /> To meet this demand, JEOL has focused on development of a transmission electron microscope incorporating spherical aberration correctors to exceed the current resolution boundary.<br /> In 2009, JEOL announced the JEM-ARM200F, a 200 kV atomic resolution analytical transmission electron microscope featuring spherical aberration correctors, which achieved a resolution of 80 pm (scanning transmission (STEM) image) as the first ever commercial electron microscope.  To achieve the atomic level resolution, the JEM-ARM200F incorporates various capabilities to ensure highly stable operation.  With over 100 units of the ARM200F currently in operation worldwide, many researchers have become familiar with atomic level imaging and analysis.</span></p> <p style="color: #333333; margin: 0px 0px 15px;"><span style="border-color: initial; border-image-source: initial; border-image-slice: initial; border-image-width: initial; border-image-outset: initial; border-image-repeat: initial; font-size: 18px;"><img alt="JEM-ARM300F" src="https://www.jeol.co.jp/en/news/detail/news_entry_file/file/press_2014507_01.jpg" style="color: rgb(51, 51, 51); border: 0px none; width: 285px; height: 400px;" /></span><br /> <span style="font-size: 13px;"> Meanwhile, as aberration correctors are widely used, various new requirements for transmission electron microscopy are emerging, in addition to higher resolution, including higher analytical sensitivity, in-situ imaging, flexible accelerating voltage control, and ease of operation for aberration correction.<br /> <br /> Thus, JEOL developed the JEM-ARM300F, a 300 kV atomic resolution transmission electron microscope featuring JEOL's own aberration correctors as an enhanced model of the JEM-ARM200F.<br /> Nicknamed GRAND ARM, the JEM-ARM300F, incorporates JEOL's propriety dodecapole correctors, successfully increasing the resolution level to 63 pm (STEM resolution).<br /> The GRAND ARM can be configured for ultra high resolution imaging or analytical applications for high sensitivity and in-situ analysis according to the user's needs.</span><br /> <br /> <span style="font-size: 13px;"> The system is primarily intended for public and private research institutes and semiconductor manufacturers.</span></p> <h3 style="color: #045999; margin: 5px 0px 10px; padding: 0px 0px 3px; border-bottom-width: 1px; border-bottom-style: dotted; border-bottom-color: #cccccc;"><span style="font-size: 13px;">Main Features</span></h3> <ol style="color: #333333; margin: 0px 0px 15px 18px; padding: 0px;"> <li style="margin: 0px 0px 8px; list-style-type: decimal; list-style-image: initial;"><span style="font-size: 13px;">Ultra high resolution imaging<br /> Achieves a resolution of 63 pm in the scanning transmission electron microscope image (STEM) mode at an accelerating voltage of 300 kV, using JEOL's own spherical aberration corrector for the illumination system.</span></li> <li style="margin: 0px 0px 8px; list-style-type: decimal; list-style-image: initial;"><span style="font-size: 13px;">High performance cold-cathode field-emission electron gun featuring high brightness and low energy dispersion<br /> Incorporates a new high performance cold cathode electron gun as standard; the high brightness beam with minimum chromatic aberration allows for high resolution imaging and analysis.</span></li> <li style="margin: 0px 0px 8px; list-style-type: decimal; list-style-image: initial;"><span style="font-size: 13px;">Wide accelerating voltage range<br /> Supports accelerating voltage levels of 300 kV and 80 kV as standard; other accelerating voltage levels are optionally available as needed.</span></li> <li style="margin: 0px 0px 8px; list-style-type: decimal; list-style-image: initial;"><span style="font-size: 13px;">Aberration corrector integrated with microscope base unit<br /> Incorporates JEOL's proprietary spherical aberration correctors in the image forming system (TEM aberration corrector) and in the illumination system (STEM spherical aberration corrector).</span></li> <li style="margin: 0px 0px 8px; list-style-type: decimal; list-style-image: initial;"><span style="font-size: 13px;">Aberration corrector control system<br /> Uses the JEOL COSMO (JEOL Corrector System Module) system for auto control of the aberration correctors.</span></li> <li style="margin: 0px 0px 8px; list-style-type: decimal; list-style-image: initial;"><span style="font-size: 13px;">Two types of objective lens pole piece<br /> Two types of objective lens polepiece are available to meet a wide range of users' applications.</span></li> <li style="margin: 0px 0px 8px; list-style-type: decimal; list-style-image: initial;"><span style="font-size: 13px;">Vacuum system featuring dry pre-evacuation and high vacuum<br /> The vacuum system features a pre-evacuation system incorporating a turbo molecular pump as standard and an enhanced column evacuation system, achieving higher vacuum while minimizing contamination and damage in atomic level imaging and analysis.</span></li> <li style="margin: 0px 0px 8px; list-style-type: decimal; list-style-image: initial;"><span style="font-size: 13px;">Stable column/console, specimen stage, and electrical system<br /> The column, 330 mm in diameter, features a higher level of mechanical rigidity.  The microscope base unit is also designed to enhance its mechanical/electrical stability and resistance to environment, fully utilizing the stabilizing technologies developed for the JEM-ARM200F.</span></li> <li style="margin: 0px 0px 8px; list-style-type: decimal; list-style-image: initial;"><span style="font-size: 13px;">A complete line of signal detectors<br /> A complete line of signal detectors are available, including EDS (energy dispersive X-ray spectrometer) up to 100 mm2and EELS (electron energy loss spectrometer), backscattered electron detectors, and up to 4 STEM detectors.  The microscope also supports simultaneous observation of high angle annular dark field image, low angle annular dark field image, annular bright field image, and bright field image.</span></li> </ol> <h3 style="color: #045999; margin: 5px 0px 10px; padding: 0px 0px 3px; border-bottom-width: 1px; border-bottom-style: dotted; border-bottom-color: #cccccc;"><strong><span style="font-size: 13px;">Main Specifications</span></strong></h3> <table border="1" style="color: #333333; margin: 25px 0px; border-spacing: 0px; width: 0px;"> <colgroup> <col /> <col /> </colgroup> <tbody> <tr> <td style="padding: 5px 10px; border: medium solid #eeeeee; text-align: left;"><span style="font-size: 13px;">Accelerating voltage</span></td> <td style="padding: 5px 10px; border: medium solid #eeeeee; text-align: left;"><span style="font-size: 13px;">Maximum 300 kV</span></td> </tr> <tr> <td style="padding: 5px 10px; border: medium solid #eeeeee; text-align: left;"><span style="font-size: 13px;">TEM lattice resolution</span></td> <td style="padding: 5px 10px; border: medium solid #eeeeee; text-align: left;"><span style="font-size: 13px;">0.05 nm(with spherical aberration corrector for image forming system)</span></td> </tr> <tr> <td style="padding: 5px 10px; border: medium solid #eeeeee; text-align: left;"><span style="font-size: 13px;">STEM resolution</span></td> <td style="padding: 5px 10px; border: medium solid #eeeeee; text-align: left;"><span style="font-size: 13px;">0.063 nm(spherical aberration corrector for illumination system)</span></td> </tr> </tbody> </table> <p style="color: #333333; margin: 0px 0px 15px;"> </p> 20JEM-2100Plus: A new 200kV Transmission Electron Microscopehttps://www.jeolbenelux.com/JEOL-BV-News/PostId/18/release-of-a-new-electron-microscope-jem-2100plusGeneralThu, 04 Jun 2015 12:24:00 GMT<p><span style="font-size: 13px; color: #045999;"><span style="color: #333333;">The JEM-2100Plus is a multi purpose transmission electron microscope for micro structure evaluation, which combines the proven JEM-2100 optic system with an advanced control system for enhanced ease of operation. Achieving superior performance through very user friendly intuitive operation, the JEM-2100Plus provides solutions to a wide range of applications from materials science to medical/biological studies.</span></span><br /> <span style="font-size: small; color: #045999;"></span></p> <p><span style="font-size: small; color: #045999;"><strong>Main Features</strong></span></p> <p><span style="font-size: 13px; color: #045999;"></span><br /> <strong style="font-size: small; color: #333333;">Designed to ease of operation</strong><span style="font-size: 13px; color: #045999;"></span></p> <ol style="color: #333333; margin: 0px 0px 15px 18px; padding: 0px;"> <li style="margin: 0px 0px 8px; list-style-type: decimal; list-style-image: initial;"><span style="font-size: 13px;"> 64 bit Windows® compatible control software, TEM Center, is an intuitive user interface designed to maximize ease of operation.</span></li> <li style="margin: 0px 0px 8px; list-style-type: decimal; list-style-image: initial;"><span style="font-size: 13px;"><strong>A complete range of automated functions</strong><br /> The JEM-2100Plus comes with a complete range of automated functions, including auto focus, auto contrast/brightness, auto exposure, auto montage, drift compensation, and stage navigation.</span></li> <li style="margin: 0px 0px 8px; list-style-type: decimal; list-style-image: initial;"><span style="font-size: 13px;"><strong>Advanced integration</strong><br /> The TEM Center allows the user to control optional accessories such as high resolution camera and scanning image (BF/DF) observation device through intuitive user-system interaction.</span></li> <li style="margin: 0px 0px 8px; list-style-type: decimal; list-style-image: initial;"><span style="font-size: 13px;"><strong>Image view/edit software</strong><br /> Viewer software supports off-line image viewing and editing.</span></li> </ol> <p style="color: #333333; margin: 0px 0px 15px;"><span style="font-size: 13px;">Notices:Windows is a registered trademark of Microsoft Corporation in the United States and other countries.</span></p> <p style="color: #045999; margin: 5px 0px 10px; padding: 0px 0px 3px; border-bottom-width: 1px; border-bottom-style: dotted; border-bottom-color: #cccccc;"><span style="font-size: 13px;"><strong>Main Specifications</strong></span></p> <table border="1" cellpadding="1" cellspacing="1" style="color: #333333; margin: 25px 0px; border-spacing: 0px; width: 0px;"> <colgroup> <col /> <col /> </colgroup> <tbody> <tr> <th style="padding: 5px 10px; border: 1px solid #eeeeee; background: #fafafa;"><span style="font-size: 13px;">Maximum accelerating voltage</span></th> <td style="padding: 5px 10px; border: solid #eeeeee; text-align: left;"><span style="font-size: 13px;">200kV</span></td> </tr> <tr> <th style="padding: 5px 10px; border: 1px solid #eeeeee; background: #fafafa;"><span style="font-size: 13px;">Guaranteed resolution</span></th> <td style="padding: 5px 10px; border: solid #eeeeee; text-align: left;"><span style="font-size: 13px;">0.14 nm(TEM lattice image)</span></td> </tr> <tr> <th style="padding: 5px 10px; border: 1px solid #eeeeee; background: #fafafa;"><span style="font-size: 13px;">Magnification</span></th> <td style="padding: 5px 10px; border: solid #eeeeee; text-align: left;"><span style="font-size: 13px;">x30 to x800,000</span></td> </tr> <tr> <td colspan="2" style="padding: 5px 10px; border: solid #eeeeee; text-align: left;"><span style="font-size: 13px;">The JEM-2100Plus can be configured to support a variety of applications from cryo TEM to ultra high resolution imaging.</span></td> </tr> </tbody> </table> <p><span style="font-size: 13px;"><br style="color: #333333;" /> <img alt="JEM-2100Plus" src="https://www.jeol.co.jp/en/news/detail/news_entry_file/file/news_20150511_01.jpg" style="color: rgb(51, 51, 51); border: 0px; width: 400px; height: 454px;" /> </span></p> <p style="color: #333333; margin: 0px 0px 15px;"> </p> <div id="radePasteHelper" style="position: absolute; left: -10000px; border: 0px solid red; top: 0px; width: 1px; height: 1px; overflow: hidden;"> </div> <div id="radePasteHelper" style="position: absolute; left: -10000px; border: 0px solid red; top: 0px; width: 1px; height: 1px; overflow: hidden;"> </div> 18