Electron Microscopy News

JEOL and ACD/Labs Sign Distribution Agreement for ACD/NMR software

Tue, 29 Sep 2020 09:30:20 GMT

JEOL and Advanced Chemistry Development, Inc. (ACD/Labs) announced they have concluded a distribution agreement for ACD/NMR software.

NMR Predictor Suite having a structure predictive function is the software which can predict an NMR spectrum from chemical structure information, among ACD/NMR software. It is the tool which can perform structure analysis easily. For a user who is considering purchase of NMR for the first time, that will be valuable source of structral analysis information.

"We're very excited to work with JEOL and bring our tools to their customers around the world," Dimitris Argyropoulos, NMR Business Manager at ACD/Labs, commented. "JEOL has been producing scientific instrumentation for the past 70 years and is a well-known and respected supplier of NMR instruments. The ability to use ACD/Labs software in combination with NMR software Delta for advanced spectra processing, automated structure verification and industry-standard databasing gives JEOL users access to the most advanced tools available. Furthermore, ACD/Labs’ software offers the capability for chemists to process and analyze LC/MS, UV/Vis, IR, and all other analytical data using the same software, regardless of data format."

The JEM-F200 at the NKI is featured in BioTech and Life Sciences

Fri, 31 Jul 2020 13:09:08 GMT

Biotech and Life Sciences has featured the JEM-F200 installed at the NKI.

IThe article can be found on page 21 in the following link and explains what the NKI will do with the microscope: https://www.biotechnews.eu/fileadmin/pdf/2019-najaar/2019_Biotechnews_november.pdf

JEOL (Europe) BV offering Refurbished Instruments

Fri, 31 Jul 2020 10:34:14 GMT

We have recently taken back several instruments that are still in excellent condition and can be offered as refurbished microscopes.

JEM-1010 100kV TEM with Megaview Camera

JEM-1010

JEM-1200EXII 120kV TEM with STEM
JEM-1200EXII 120kV TEM with Orius Camera and EDX

JEM-1200EXII

JSM-6380 Compact W-SEM with SE detector (same size as 6060LV)
JSM-6060LV Compact W-SEM with SE and BSE detector

JSM-6060LV

JSM-6700F Cold FEG-SEM with in chamber SE, in-lens SE, retractable BSE detector and STEM detector

JSM-6700F

For any further details or questions, please contact us: Sales(at)jeolbenelux.com

First structure from the JEM-F200 at the NKI in Amsterdam

Wed, 18 Mar 2020 14:34:44 GMT

The NKI in Amsterdam has completed their first trial on the JEM-F200 equipped with Gatan K2 Camera and Elsa Cryoholder, The result is a 3.4Å reconstruction on Apoferritin. For this test 120 images were taken in 3 hours. Congratulations to Prof. Dr. Titia Sixma and Prof. Dr. Tassos Perrakis and their colleagues with this very promising test result!

JEOL Periodic Table app

Mon, 27 May 2019 08:20:17 GMT

JEOL USA has developed an app to assist researchers with EDS, NMR and MS research. Using the JEOL Periodic Table app you have quick and easy access to the spectral data of all known elements while doing EDS in electron microscopy, nuclear magnetic resonance or mass spectrometry.

The app is available in the apple appstore: https://itunes.apple.com/us/app/jeol-usa-periodic-table/id1459184462?ls=1&mt=8

JEOL NMR in high demand

Mon, 13 Mar 2017 09:45:02 GMT

The New JNM-ECZ High field NMR series is booming. Recent installations of 400 MHz, 500 MHz and 600 MHz for liquid experiments, but also for solids is proving the excellent performance of these systems. With old magnets and new probes making it possible to do 3 channel experiments on a two channel spectrometer JEOL is showing the way to modern NMR systems at lower cost of ownership.

Improvement of our application center in UK together with the any installations, we now can demonstrate the wide range of system configurations.

Are you interested in knowing more, just complete the “request product info” on our website.

JEOL Celebrating 50 years of SEM

Mon, 01 Aug 2016 13:08:00 GMT

In 2016 we are celebrating 50 years of JEOL scanning electron microscopes!

Since the launch of our first SEM in 1966, the JSM-1, we have been constantly developing and improving the ease-of-use and the performance of our SEMs, with the support of our customers.

Since 1966, more than 22.000 JEOL SEMs have been installed worldwide!

Inauguration of the JEM-1400Plus in Ghent on 24th March 2016

Mon, 01 Aug 2016 12:38:00 GMT

24^th March 2016 knew the festive inauguration of the JEM-1400Plus, JEOL’s 120 kV TEM, in Ghent. The 1400Plus is JEOL’s latest generation 120 kV TEM. This system is extremely user-friendly and has integrated solutions for tomography as well as for large area imaging. The investment is a joint effort of 4 research centers of VIB (Flemish Institute for Biotechnology) and 1 research center of Ghent University:

· Inflammation Research Center (VIB-IRC)

· Plant Systems Biology (VIB-PSB)

· Medical Biotechnology Center (VIB-MBC)

· VIB Core facilities

· Center for Medical Genetics Ghent University (CMGG)

In her welcome speech Prof. Anne de Paepe, Rector of Ghent University and Director of CMGG, emphasized the importance of collaboration for the acquisition and exploitation of large equipment.

The official “cutting of the ribbon” was followed by a demonstration of the 1400Plus and a reception with a variety of drinks and delicious snacks for the more than 100 participants.

Pictures:

TOP The official “cutting of the ribbon” by Prof. Anne De Paepe, assisted by mrs. Riet De Rycke and mr. Michiel De Bruyne, transmission electron microscopists at the VIB-UGent TEM Core Facility.

BOTTOM Mrs Riet De Rycke (far right) demonstrates the 1400Plus to (starting first row and from left to right): Prof. Nico Callewaert, Director MBC; Prof. Dirk Inzé, Director PSB; Dr. Jo Bury, Managing Director VIB, Prof. Bart Lambrecht, Director IRC; Prof. Anne De Paepe, Rector and Director CMGG.

JEOL (Europe) BV introduces: Photo Ion-Source for JMS-T200GC AccuTOF GCx

Fri, 19 Feb 2016 11:27:19 GMT

Electron ionization (EI), generally used for GC/MS and GCxGC/MS analysis, produces fragment ions. Fragments are valuable for database search and compound identification. However, fragmentation adds an additional level of complexity in interpreting complex mixtures, such as crude oil. Some compounds (e.g. alkanes, alcohols) do not produce abundant (or any) molecular ions.

Since photoionization (PI) is a softer ionization method than EI, molecular ion can be easily distinguished using this technique. For some analytes, characteristic fragment ions may also be observed. Combining soft ionization with high-resolution exact-mass data and new software tools simplifies processing of complex GC and GCxGC data (e.g. petroleum type analysis).

PI provides clear molecular ions and elemental composition that can be combined with EI data to identify unknowns and also provides selective ionization of target compounds

The JEOL PI source is designed as a PI/EI combination ion source. Switching between PI and EI can be done without breaking vacuum of the ion source, even without breaking any vacuum. Also during an analytical run it is possible to switch between PI/EI and vice versa. The accurate mass will always stay available whatever ionisation technique is used with our JMS-T200GC AccuTOF GCx.

At this moment a PI source is available for our GC-TOF and GC-Quadrupole systems.

Release of the JEM-F200, a multi purpose TEM

Mon, 15 Feb 2016 15:52:53 GMT

JEOL's latest addition to its suite of Transmission Electron Microscopes is the versatile JEM-F200, also nicknamed "F2", the only advanced analytical, high throughput 200kV S/TEM in its class to offer a Cold Field Emission Gun and dual Silicon Drift Detectors.

The combined boost in probe current from the Cold FEG with the dual EDS makes this TEM stand out in its class.The 'F2' employs the newest in JEOL innovations in an easy-to-use, extremely stable, high resolution imaging and analytical TEM.

The F2 incorporates many new features:

Smart- design, with a new intuitive user interface
Quad-lens condenser system, the new 4-stageprobe-forming optical system, Quad-Lens condenser system, controls the electron beam intensity and the convergence angle independently to respond to different research requirements.
Advanced Scan system,which is capable of scanning the electron beam in the image forming system (optional) , in addition to the standard scanning system for the probe-forming system. This accomplishes wide field STEM-EELS.
Pico Stage Drive, which is capable of driving the stage in pico meter steps without a piezo drive, and moving the area of view in a wide dynamic range from an entire sample grid to atomic order images.
Specporter, an auto holder loading/unloading device.
Improved coldFEG, Guaranteeing high stability, high brightness, and high energy resolution, the cold field emission electron gun enables chemical bonding analysis by EELS, speeds up the analytical process by the high brightness electron beam, and minimizes chromatic aberrations from the electron source for enabling high resolution imaging.
Dual SDD, for very fast EDS analysis and minimal sample damage.
Environmental friendly, the instrument can be switched to ECO mode when not in use, to reduce its energy consumption.

Main specification: TEM point to point: 0.19 nm STEM-HAADF: 0.14 nm (using Cold FEG and UHR polepiece)

Release of a new Field-Emission Scanning Electron Microscope: The JSM-7200F

Fri, 08 Jan 2016 09:56:48 GMT

JEOL has released the JSM-7200F, a multi-purpose FE-SEM combining high-resolution and easy operation.

Scanning electron microscopes have been used in a wide range of fields and for diverse applications. The JSM-7200F utilizes JEOL proprietary in-lens Schottky Plus technology that allows improvement in the resolution at low accelerating voltages (1.6 nm @ 1 kV), and achieves a maximum probe current of 300 nA. The JSM-7200F is a multi-purpose FE-SEM that can satisfy a wide range of needs with both higher resolution and easier operation than conventional instruments.The features include:

High resolution of 1.6 nm at 1 kV, 1.2nm at 30kV.
High-speed analysis: maximum probe current of 300 nA, allowing short acquisition time for EDS, WDS, and EBSD, while maintaining high resolution.
Energy signal differentiation: incorporation of the TTL (through-the-lens) system in the standard configuration enables the use of energy filtering to selectively differentiate the electron energies.
Wide area analysis: the LDF (long depth of field) mode enables applications like wide-area EBSD analysis, without the need to use stage scan (montage).

New Versatile Compact SEM from JEOL

Fri, 13 Nov 2015 11:28:00 GMT

JEOL has released the JSM-IT100, the successor of the very popular and succesful InTouchscope JSM-6010 series. The JSM-IT100 is a simple-to-use versatile, research-grade SEM with a compact ergonomic design.

The JSM-IT100 is very easy to use, due to the very intuitive user interface and has a formidable price-performance ratio. This compact SEM is a versatile workhorse SEM that can be configured to meet individual lab requirements. It offers high resolution imaging, and offers a range of acceleration voltages at both high and low vacuum modes.

With the JSM-IT100, it is simple to quickly obtain high quality images using both Secondary Electron and Backscatter Imaging. The embedded JEOL EDS system with silicon drift detector technology now includes Spectral Mapping, Multi-Point Analysis, Automatic Drift Compensation, Partial area, Line Scan, and Mapping Filter functions.

JEOL's popular InTouchScope series includes the NeoScope benchtop SEM with selectable HV/LV and the JSM-IT300LV with advanced analytical capabilities and imaging of large, intact samples.

New TEM for Naturalis

Wed, 11 Nov 2015 14:16:00 GMT

The Naturalis Biodiversity Center, a research institute and natural history museum in Leiden, has recently acquired the state-of-the-art JEM-1400Plus Transmission Electron Microscope (TEM) from JEOL.

“Thanks to this TEM we are able to study the biodiversity of plants and species in the smallest details.” According to Kees van den Berg, Senior Analyst at Naturalis. “For the acquisition of the new 120kV TEM the JEM-1400Plus from JEOL was selected because of its performance, ease-of-use and proven stability of the system. The excellent service track record of JEOL also played an important role in the evaluation."

"We used to have a JEOL JEM-1010 from 1992. Even though it was still working well, it no longer fit in our new organization structure where digitalization of our collection and data has become a priority. Additionally, the new TEM is also fully compatible with our Windows 7 based network. The JEM-1010 will go to a new owner who will certainly benefit from the microscope for years to come."

Since the introduction of the JEM-1400 in 2007 and the JEM-1400Plus in 2012, already more than 600 microscopes of this type have been installed worldwide. The strength of this system lies in the flexibility of the system to be able to work in a great variety of research fields, for example: Biological sections, polymers, nanomaterials and asbestos analysis, all in both room temperature and under cryo conditions.

JEM-ARM300F: The Ultimate Atomic Resolution Transmission Electron Microscope

Mon, 08 Jun 2015 15:02:00 GMT

Transmission electron microscopy (TEM) has long been a tool essential for micro structure evaluation in the field of materials development.
However, as the fine structures of advanced materials are being designed at the nano level or atomic level, the synthetic process for such materials increasingly requires imaging and analysis at higher resolution.

To meet this demand, JEOL has focused on development of a transmission electron microscope incorporating spherical aberration correctors to exceed the current resolution boundary.
In 2009, JEOL announced the JEM-ARM200F, a 200 kV atomic resolution analytical transmission electron microscope featuring spherical aberration correctors, which achieved a resolution of 80 pm (scanning transmission (STEM) image) as the first ever commercial electron microscope. To achieve the atomic level resolution, the JEM-ARM200F incorporates various capabilities to ensure highly stable operation. With over 100 units of the ARM200F currently in operation worldwide, many researchers have become familiar with atomic level imaging and analysis.

Meanwhile, as aberration correctors are widely used, various new requirements for transmission electron microscopy are emerging, in addition to higher resolution, including higher analytical sensitivity, in-situ imaging, flexible accelerating voltage control, and ease of operation for aberration correction.

Thus, JEOL developed the JEM-ARM300F, a 300 kV atomic resolution transmission electron microscope featuring JEOL's own aberration correctors as an enhanced model of the JEM-ARM200F.
Nicknamed GRAND ARM, the JEM-ARM300F, incorporates JEOL's propriety dodecapole correctors, successfully increasing the resolution level to 63 pm (STEM resolution).
The GRAND ARM can be configured for ultra high resolution imaging or analytical applications for high sensitivity and in-situ analysis according to the user's needs.

The system is primarily intended for public and private research institutes and semiconductor manufacturers.

Main Features

Ultra high resolution imaging
Achieves a resolution of 63 pm in the scanning transmission electron microscope image (STEM) mode at an accelerating voltage of 300 kV, using JEOL's own spherical aberration corrector for the illumination system.
High performance cold-cathode field-emission electron gun featuring high brightness and low energy dispersion
Incorporates a new high performance cold cathode electron gun as standard; the high brightness beam with minimum chromatic aberration allows for high resolution imaging and analysis.
Wide accelerating voltage range
Supports accelerating voltage levels of 300 kV and 80 kV as standard; other accelerating voltage levels are optionally available as needed.
Aberration corrector integrated with microscope base unit
Incorporates JEOL's proprietary spherical aberration correctors in the image forming system (TEM aberration corrector) and in the illumination system (STEM spherical aberration corrector).
Aberration corrector control system
Uses the JEOL COSMO (JEOL Corrector System Module) system for auto control of the aberration correctors.
Two types of objective lens pole piece
Two types of objective lens polepiece are available to meet a wide range of users' applications.
Vacuum system featuring dry pre-evacuation and high vacuum
The vacuum system features a pre-evacuation system incorporating a turbo molecular pump as standard and an enhanced column evacuation system, achieving higher vacuum while minimizing contamination and damage in atomic level imaging and analysis.
Stable column/console, specimen stage, and electrical system
The column, 330 mm in diameter, features a higher level of mechanical rigidity. The microscope base unit is also designed to enhance its mechanical/electrical stability and resistance to environment, fully utilizing the stabilizing technologies developed for the JEM-ARM200F.
A complete line of signal detectors
A complete line of signal detectors are available, including EDS (energy dispersive X-ray spectrometer) up to 100 mm2and EELS (electron energy loss spectrometer), backscattered electron detectors, and up to 4 STEM detectors. The microscope also supports simultaneous observation of high angle annular dark field image, low angle annular dark field image, annular bright field image, and bright field image.

Main Specifications

Accelerating voltage	Maximum 300 kV
TEM lattice resolution	0.05 nm(with spherical aberration corrector for image forming system)
STEM resolution	0.063 nm(spherical aberration corrector for illumination system)

JCM-6000 ”NeoScope™”, A New Desktop Scanning Electron Microscope

Thu, 04 Jun 2015 13:10:00 GMT

JEOL's JCM-5000 NeoScope, since it was announced, has been widely used by electronics manufacturers, including semiconductor device makers, as a desktop scanning electron microscope featuring the same ease of operation as optical microscopes for inspection of the products developed and processed by micro technologies. The new JCM-6000 "NeoScopeTM," is a touch panel controlled, multi functional desktop scanning microscope that answers the increasingly diversified needs among users worldwide. Nikon has joined JEOL to sell the Neoscope.

Features

1) Simple operation

Easy touch panel operation
A complete range of automated functions (auto focus, auto stigmator, auto contrast/brightness)
Easy, dependable auto gun alignment (filament centering)

2) Enhanced low vacuum capability

Enhanced quality of backscattered electron images
Easy observation of non conductive samples in the direct low vacuum mode
Only 2 minutes 30 seconds from sample loading to imaging

3) New capabilities for imaging

Secondary electron imaging and backscattered electron imaging supported at high vacuum
Dual frame imaging to facilitate comparison of live and retrieved images
A wide magnification range from the lowest 10x for wide area of view up to 60,000x

4) A complete line of optional accessories

Energy dispersive X-ray spectrometer
Tilt/rotation motor drive specimen holder

*Both options are retrofittable

5) Compact, light, and energy saving

Base unit: 330mm (W) x 490mm (D) x 430mm (H); 50 kg
Utility: Single phase 100 V to 240 V, 50/60 Hz, 700 to 960 VA

JPS-9030: The XPS for high-speed, high-precision depth profiling

Thu, 04 Jun 2015 12:56:00 GMT

In recent years, there has been a growing demand to perform high quality surface analysis quickly, easily and reproducibly on any kind of sample for any level user. The JPS-9030 is equipped with a newly-designed user interface that further improves operability and also debuts a sophisticated, new modern and sleek exterior design.

Main Features

Depth profiling optimized for the application
The newly-developed Kaufman-type etching ion source provides etching rates from 1 nm/min to 100 nm/min (SiO2equivalent), and allows a wide range of settings. It is capable of depth profiles suitable for any application, from measurements demanding precision to processes that require speed. The mounting of the Kaufman-type etching ion source to the specimen exchange chamber facilitates prevention of contamination of the measurement chamber.
Newly-developed software provides even greater ease-of-use
SpecSurf Ver. 2.0 now incorporates a ribbon-style GUI, offering a user-friendly environment in which all operations can be performed with the mouse. With JEOL’s own automatic qualitative analysis function, it is possible to sequentially perform qualitative, quantitative and chemical state analyses for multiple acquisition points.
Ultra-high surface sensitivity
The JPS-9030 supports techniques like Angle-Resolved XPS (ARXPS) and Total Reflection XPS (TRXPS), and is capable ultra-high sensitive analysis of the top surfaces of 1 nm (standard measurement method 6 nm or more).
A wealth of options
- Monochromatic X-ray sources
- Argon gas cluster ion source suitable for organic samples
- Infra-red heating system capable of temperatures of 1,000°C or higher
- Transfer vessel to protect specimens from exposure to the atmosphere

Main Specifications

Intensity (MgKα, 300W equivalent)	1,000,000 cps or more (at Ag3d5/2FWHM is 1.0 eV)
X-ray source	Mg/Al twin anode
Input-lens system	Cylindrical electrostatic lens
Energy analyzer	Electrostatic hemispherical analyzer
Energy sweep method	Constant Analyzer Energy and Constant Retarding Ratio
Detector	multichannel plate
Ion gun	Kaufman type ion gun
Base pressure	7 × 10-8Pa or better
Bake-out system	Built-in heater, automatic control

JEM-2100Plus: A new 200kV Transmission Electron Microscope

Thu, 04 Jun 2015 12:24:00 GMT

The JEM-2100Plus is a multi purpose transmission electron microscope for micro structure evaluation, which combines the proven JEM-2100 optic system with an advanced control system for enhanced ease of operation. Achieving superior performance through very user friendly intuitive operation, the JEM-2100Plus provides solutions to a wide range of applications from materials science to medical/biological studies.

Main Features

Designed to ease of operation

64 bit Windows® compatible control software, TEM Center, is an intuitive user interface designed to maximize ease of operation.
A complete range of automated functions
The JEM-2100Plus comes with a complete range of automated functions, including auto focus, auto contrast/brightness, auto exposure, auto montage, drift compensation, and stage navigation.
Advanced integration
The TEM Center allows the user to control optional accessories such as high resolution camera and scanning image (BF/DF) observation device through intuitive user-system interaction.
Image view/edit software
Viewer software supports off-line image viewing and editing.

Notices:Windows is a registered trademark of Microsoft Corporation in the United States and other countries.

Main Specifications

Maximum accelerating voltage	200kV
Guaranteed resolution	0.14 nm(TEM lattice image)
Magnification	x30 to x800,000
The JEM-2100Plus can be configured to support a variety of applications from cryo TEM to ultra high resolution imaging.

JSM-7100F Thermal field emission electron microscope

Sun, 01 Jan 2012 05:00:00 GMT

Observation of nano-structures

The unique high power optics of JSM-7100F guarantees 1.2nm resolution. High magnification for the study of nano-structures is easily obtained.

Stable high precision analysis
The in-lens thermal FEG produces a stable large probe current. You can obtain high quality observation and analysis results. The emitter is guaranteed for 3 years.

Magnetic specimens
The objective lens of the JSM-7100F does not form magnetic field around a specimen. Magnetic specimens can be observed and analyzed without restriction.

Analysis of nano-structures
A small probe diameter is obtained with the patented aperture angle optimizing lens. You can acquire high precision analyses and high quality elemental maps in a short time by using a large probe current.

A variety of analytical equipment including EDS, WDS, and EBSD can be mounted their ideal geometry.

Clean vacuum
A specimen is introduced through the specimen exchange airlock chamber. The specimen chamber is always kept in clean high vacuum. The unique one action specimen exchange mechanism lets you insert and remove a specimen with simple operation. The specimen chamber is pumped with a TMP.

In-lens thermal FEG
The patented in-lens thermal FEG is efficient and produces a maximum probe current of 200nA.

Aperture angle optimizing lens
The patented aperture angle optimizing lens automatically optimizes aperture angle of the objective lens to form a small electron probe diameter at large probe currents.

Observation
A variety of images, such as secondary electron images, backscattered electron images, and STEM images, are obtained. The stable thermal field emission electron source ensures research with high quality images.

Analysis
Elemental analyses with EDS and WDS, and EBSD analysis are carried out efficiently. High precision analysis can be obtained with the stable electron probe.

Centurio Large Angle SDD-EDS

Thu, 01 Sep 2011 04:00:00 GMT

Centurio is a next-generation Silicon Drift Detector (SDD) EDS that collects X-rays from S/TEM samples at an unprecedented large solid angle of up to 0.98 steradians from a detection area of 100mm².

Through efficient collection of X-rays at very high count rates, Centurio speeds elemental mapping and improves element detection sensitivity without loss of energy resolution. Large pixel number EDS maps can be made at rates ten times faster than with the previous EDS designs, with excellent signal-to-noise ratio. Combined with the large probe currents in small probe sizes attainable with aberration corrected STEM, fast, efficient atomic resolution EDS analysis is possible.

Key Features

High sensitivity, high throughput analysis
Exponentially expands the elemental mapping capability for the JEOL 200kV and higher nano-area analysis TEM.
The automatically retractable side entry design allows fast repositioning to avoid irradiation from back-scattered electrons.

Specifications

Solid angle
- High resolution polepiece 0.98 sr
- Ultrahigh resolution polepiece 0.8 sr
Detection area 100mm²

JEOL Announces a New Field Emission Scanning Electron Microscope, JSM-7800F

Fri, 01 Jul 2011 04:00:00 GMT

An ultimate analytical tool for a wide range of applications

Scanning electron microscopes are used in a wide range of fields from basic material research to specific applications in production. The JSM-7800F is an ultimate analytical tool that answers a wide variety of users' needs. With its new super hybrid objective lens, the microscope is capable of high resolution imaging as well as high speed, high precision elemental analysis.

Features

Ultimate resolution

The super hybrid objective lens achieves resolutions of 0.8 nm (15 kV) and 1.2 nm (1 kV).

High speed, high precision elemental analysis

The microscope performs speedy sample analysis with the optimally focused electron probe at high current without compromising the analytical accuracy and the quality of elemental mapping.

High quality data acquired by stable electron probe

The long lasting in-lens thermal electron gun produces a stable probe, which allows for continuous acquisition of high quality data from imaging and from various analysis including EDS, WDS, EBSD, and CL.

Support of wide ranging samples

The super hybrid objective lens can image/analyze magnetic samples at high magnification. It also makes imaging of non conductive samples easy.