Clear visibility promotes new discovery
Nowadays, not only resolution and analytical performance on the nanometer order, but also throughput in data acquisition are considered important. The newly born JSM-IT710HR is the fourth-generation model of JEOL's HR* series, which is based on the theme of "SEM that allows anyone to easily take high-resolution images.
The JSM-IT710HR makes users want to pursue beyond what has been seen, due to ease of operation with enhanced automatic functions and improved observation performance from a new detector.
*HR=High Resolution
Features
I can see it, I want to see it more.
The SEM image is visible in conjunction with the optical image. |
The image is seen better due to the high resolution electron gun. |
![The SEM image is visible in conjunction with the optical image. The SEM image is visible in conjunction with the optical image.](/portals/0/products/JSM-IT710HR/JSM-IT710HR_01e.jpg?ver=MHH3f71M3yzbIfFsPiIC5g%3d%3d)
Specimen: courtesy of Hino Tonton ZOO (Hamura Zoo)
|
![The image is seen better due to the high resolution electron gun. The image is seen better due to the high resolution electron gun.](/portals/0/products/JSM-IT710HR/JSM-IT710HR_02e.jpg?ver=MHH3f71M3yzbIfFsPiIC5g%3d%3d) |
※optional
Charge reduction
Specimen: Courtesy of Prof. Tetsuro Asakura, Department of Biotechnology and Life Science, Tokyo University of Agriculture and Technology
Crystal structure analysis
Specimen: Courtesy of Prof. Kaneaki Tsuzaki, National Institute for Material Science (NIMS)
New functionality
Automatic Observation: Simple SEM/EDS
Simple SEM function enables automatic measurements by registering multiple conditions at once. Simple
This improves the efficiency of routine work.
![Automatic Observation: Simple SEM/EDS Automatic Observation: Simple SEM/EDS](/portals/0/products/JSM-IT710HR/JSM-IT710HR_07e.jpg?ver=r4o7etMzICkmWjPjRmCr-w%3d%3d)
![Automatic Observation: Simple SEM/EDS Automatic Observation: Simple SEM/EDS](/portals/0/products/JSM-IT710HR/JSM-IT710HR_08e.jpg?ver=30fY9vj3RMCsJR4n7r7AZg%3d%3d)
![Automatic Observation: Simple SEM/EDS Automatic Observation: Simple SEM/EDS](/portals/0/products/JSM-IT710HR/JSM-IT710HR_09e.jpg?ver=r4o7etMzICkmWjPjRmCr-w%3d%3d)
Live 3D: constructs 3D image on the spot
Imaging is possible at a low magnification with a little distortion, due to the out-lens objective lens.
New Low Vacuum Hybrid Secondary Electron Detector (LHSE)※
※Optional function
The LHSED, a new low-vacuum detector, enables observation while switching between images containing light emission information and topographic images.
LHSED Features
- Improved quality of low vacuum secondary electron live image
- Acquisition of light emission information
- Switching between topographic and light emission information images
|
![Low Vacuum Hybrid Secondary Electron Detector (LHSE) Low Vacuum Hybrid Secondary Electron Detector (LHSE)](/portals/0/products/JSM-IT710HR/JSM-IT710HR_15e.png?ver=qh9xdTRxO5-yKjWy4B8izw%3d%3d) |
![LHSED LHSED](/portals/0/products/JSM-IT710HR/JSM-IT710HR_14e.jpg?ver=A3ewEmT_T97pBIRn3lvrPw%3d%3d)
Schottky FE electron gun stability has been enhanced more than 4 times compared to the previous models
Automatic Beam Adjustment
JSM-IT710HR does not require complicated manual adjustment and provides automatic adjustment from axis alignment to astigmatism correction and focusing.
![](/portals/0/products/JSM-IT710HR/JSM-IT710HR_16e.jpg?ver=MHH3f71M3yzbIfFsPiIC5g%3d%3d)
![](/portals/0/products/JSM-IT710HR/JSM-IT710HR_17e.jpg?ver=MHH3f71M3yzbIfFsPiIC5g%3d%3d)
Secondary Electron Detection System
Secondary electron detector
(SED) |
Low vacuum secondary electron detector
(LVSED/LHSED) |
![Secondary electron detector (SED) Secondary electron detector (SED)](/portals/0/products/JSM-IT710HR/JSM-IT710HR_18e.jpg?ver=JuX3JlYCjPPqpNeCNYhcow%3d%3d)
Specimen: Feather of peacock*
*Specimen image: Courtesy of Hinotonton Zoo (Hamura Zoo) |
![Low vacuum secondary electron detector (LVSED/LHSED) Low vacuum secondary electron detector (LVSED/LHSED)](/portals/0/products/JSM-IT710HR/JSM-IT710HR_19e.jpg?ver=recrepuwWcK2GQpehOY6vw%3d%3d)
Specimen: cellulose microfiber |
Both High Resolution and Large Current
The Schottky field emission gun used in the JSM-IT710HR enables high-resolution observation and analysis because the electron gun is integrated with the condenser lens to create large currents while maintaining a small probe.
Backscattered Electron Detection System
The new multi-segmented backscattered electron detector acquires backscattered electron images from four directions at once so that a simple 3D image can be created and displayed live, in real-time.
Every Analysis Starts with Zeromag
Zeromag's optical image simplifies navigation.
SEM images can be linked to optical images for easy observation, analysis, and automated measurements.
![Every Analysis Starts with Zeromag Every Analysis Starts with Zeromag](/portals/0/products/JSM-IT710HR/JSM-IT710HR_22e.jpg?ver=A3ewEmT_T97pBIRn3lvrPw%3d%3d)
EDS Integration
JEOL manufactures and sells not only SEMs but also EDS.
Fully embedded EDS with SEM for simplified workflow, operation and data management.
![EDS Integration EDS Integration](/portals/0/products/JSM-IT710HR/JSM-IT710HR_23e.jpg?ver=A3ewEmT_T97pBIRn3lvrPw%3d%3d)
Phase Analysis
JEOL’s EDS system supports a new phase analysis function. Phase maps can be created from map data set.
Backscattered electron image
![Backscattered electron image Backscattered electron image](/portals/0/products/JSM-IT710HR/JSM-IT710HR_24e.jpg?ver=Y4f-PdBWMCDgoGBrMcRsFw%3d%3d) |
Phase mapping (Overlay of multiple phases)
![Phase mapping (Overlay of multiple phases) Phase mapping (Overlay of multiple phases)](/portals/0/products/JSM-IT710HR/JSM-IT710HR_25e.jpg?ver=cTOcnxF---cngU8HqOaFrQ%3d%3d) |
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Specimen: cross section of a cutting tool for precision machining. Phase analysis indicates component difference between Co, Cu and Sn rich areas. |
Co area: 68.15%
![Co area: 68.15% Co area: 68.15%](/portals/0/products/JSM-IT710HR/JSM-IT710HR_26e.jpg?ver=bPi3QUzBSiDLa_L_0l_Ozw%3d%3d)
CuSn (CuRich) area: 16.25%
![](/portals/0/products/JSM-IT710HR/JSM-IT710HR_27e.jpg?ver=MHH3f71M3yzbIfFsPiIC5g%3d%3d)
CuSn (SnRich) area: 14.54%
![CuSn (SnRich) area: 14.54% CuSn (SnRich) area: 14.54%](/portals/0/products/JSM-IT710HR/JSM-IT710HR_28e.jpg?ver=r4o7etMzICkmWjPjRmCr-w%3d%3d)