Clear visibility promotes new discovery
Nowadays, not only resolution and analytical performance on the nanometer order, but also throughput in data acquisition are considered important. The newly born JSM-IT710HR is the fourth-generation model of JEOL's HR* series, which is based on the theme of "SEM that allows anyone to easily take high-resolution images.
The JSM-IT710HR makes users want to pursue beyond what has been seen, due to ease of operation with enhanced automatic functions and improved observation performance from a new detector.
I can see it, I want to see it more.
|The SEM image is visible in conjunction with the optical image.
||The image is seen better due to the high resolution electron gun.
Specimen: courtesy of Hino Tonton ZOO (Hamura Zoo)
Specimen: Courtesy of Prof. Tetsuro Asakura, Department of Biotechnology and Life Science, Tokyo University of Agriculture and Technology
Crystal structure analysis
Specimen: Courtesy of Prof. Kaneaki Tsuzaki, National Institute for Material Science (NIMS)
Automatic Observation: Simple SEM/EDS
Simple SEM function enables automatic measurements by registering multiple conditions at once. Simple
This improves the efficiency of routine work.
Live 3D: constructs 3D image on the spot
Imaging is possible at a low magnification with a little distortion, due to the out-lens objective lens.
New Low Vacuum Hybrid Secondary Electron Detector (LHSE)※
The LHSED, a new low-vacuum detector, enables observation while switching between images containing light emission information and topographic images.
- Improved quality of low vacuum secondary electron live image
- Acquisition of light emission information
- Switching between topographic and light emission information images
Schottky FE electron gun stability has been enhanced more than 4 times compared to the previous models
Automatic Beam Adjustment
JSM-IT710HR does not require complicated manual adjustment and provides automatic adjustment from axis alignment to astigmatism correction and focusing.
Secondary Electron Detection System
|Secondary electron detector
|Low vacuum secondary electron detector
Specimen: Feather of peacock*
*Specimen image: Courtesy of Hinotonton Zoo (Hamura Zoo)
Specimen: cellulose microfiber
Both High Resolution and Large Current
The Schottky field emission gun used in the JSM-IT710HR enables high-resolution observation and analysis because the electron gun is integrated with the condenser lens to create large currents while maintaining a small probe.
Backscattered Electron Detection System
The new multi-segmented backscattered electron detector acquires backscattered electron images from four directions at once so that a simple 3D image can be created and displayed live, in real-time.
Every Analysis Starts with Zeromag
Zeromag's optical image simplifies navigation.
SEM images can be linked to optical images for easy observation, analysis, and automated measurements.
JEOL manufactures and sells not only SEMs but also EDS.
Fully embedded EDS with SEM for simplified workflow, operation and data management.
JEOL’s EDS system supports a new phase analysis function. Phase maps can be created from map data set.
|Backscattered electron image
|Phase mapping (Overlay of multiple phases)
||Specimen: cross section of a cutting tool for precision machining. Phase analysis indicates component difference between Co, Cu and Sn rich areas.
Co area: 68.15%
CuSn (CuRich) area: 16.25%
CuSn (SnRich) area: 14.54%