JSM-IT500HR

JSM-IT500HR

The JSM-IT500HR, based on the highly successful and award winning JEOL InTouchScope series, is equipped with a high-brightness electron gun and fully integrating JEOL's energy dispersive X-ray spectrometer (EDS). This revolutionizing JSM-IT500HR is a superb high throughput SEM, delivering a dramatically improved work efficiency (40% or higher than conventional models).

JEM-Z300FSC / JEM-Z200FSC

JEM-Z300FSC / JEM-Z200FSC

CRYO ARM is an electron microscope for observing biomolecules such as proteins at cryo temperature. The microscope equips a cold field-emission electron gun, an in-column Omega energy filter, a side-entry liquid nitrogen cooling stage, and an automated specimen exchange system. The specimen exchange system can store up to 12 specimens in the specimen exchange chamber.

JSM-IT200

JSM-IT200

Fast observation, analysis and report generation! JSM-IT200 is an easy-to-use SEM focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope, with significantly higher throughput.

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JEOL (Europe) BV News

latest news and events

Inauguration of the JEM-ARM200F in Leuven

You are kindly invited to the Res Metallica symposium “Advanced Electron Microscopy and Spectroscopy for Deep Insight of Materials” on Wednesday May 9, 2018 at 13:00 in the "Aula van de Tweede Hoofdwet", Kasteelpark Arenberg 41, 3001 Leuven. The symposium is organised by the Department of Materials Engineering, KU Leuven and sponsored by JEOL and by FWO Science Research Network (WOG).

Recent advancements in electron microscope instrumentation have provided new possibilities for high resolution characterization of materials. Especially, the successful implementation of aberration-correction in a (scanning) transmission electron microscope (S)TEM has yielded possibilities far beyond the lateral resolution. In this symposium, two experts in this field will present the benefits of these advances with reference to several materials systems for gaining deeper understanding of materials properties. Two additional speakers, from university and from an industrial research environment, will highlight the role of (S)TEM for their research.

This symposium will be combined with the inauguration of the JEOL ARM200F STEM installed at the Corelab “Leuven NanoCentre”. The ARM200F was acquired via a Hercules Foundation project led by a consortium of KU Leuven (Materials Engineering, Physics, Centre for Surface Chemistry and Catalysis, Dental Materials) and supported by the group Science, Engineering and Technology of KU Leuven and JEOL. The ARM200F is an atomic resolution analytical electron microscope, with a STEM Cs corrector and cold field emission gun providing a STEM-HAADF resolution of 78 pm and full analytical capabilities using EDX and EELS.

 

To register, please visit: https://www.mtm.kuleuven.be/Events/ResMetallica/res-metallica-2018

JEOL present at the 42nd ISCC & 15th GCxGC Symposium from May 13-18

JEOL will be present at the 42nd International Conference Symposium on Capillary Chromatography (ISCC) jointly organized with the 15th GCxGC Symposium, which will be held this year in Riva del Garda, Italy from May 13th-18th.

We will have a booth displaying our latest developments, which will be presented in detail during a seminar.

The last conference in 2016 was very successful with 830 participants, from all around the world, and with 41 exhibitors.

This year particular emphasis will be directed to all Comprehensive Separation Technologies and MS Hyphenation and to capillary chromatography and 2D GC with various forms of MS from unit-mass to high resolution, and from single to hybrid analyzers.

 

For more information, please visit the conference website

JEOL Introduces the JSM-IT500HR

The JSM-IT500HR, the Field Emission version of the JSM-IT500, has been released. With this model all existing features of the IT500 are now incorporated into a High Resolution platform, enabling seemless operation from an optical image to a high resolution image.

For application examples and to see how the features work, please visit our corporate website:

https://www.jeol.co.jp/en/products/special_edition/2017/special01.html

JEOL Present at Laborama 2018

JEOL (Europe) BV will be present at the Laborama Expo 2018, on the 15th and 16th of March in the Brussels Kart Expo in Groot Bijgaarden. We will have  our benchtop SEM on display. You are more than welcome to visit us and be informed about our latest developments on SEM, MS and NMR. You can find us at Booth B4. 

For more Information about this event, please visit: http://expo.laborama.be/nl/vakbeurs-laboratorium-professional

Festive Inauguration of the JEM-3200FSC in Delft

From the 4th till the 6th of September TU Delft organised a symposium in honor of the inauguration of the JEOL JEM-3200FSC installed this year at the BioNanoScience department of TU Delft. Many well known scientists in the Structural Biology field joined this event and presented their most recent work. Two very intensive days of presentations were followed by a 3rd day of workshops given by participating companies.

On the symposium website you can find the full list of speakers: https://www.tudelft.nl/en/cryo-em-symposium/program/

Below some photo's of Prof. Fujiyoshi and Prof. Dubochet presenting.

 

 

JEOL introduces the IB-19530CP Cross section Polisher

The IB-19530CP is equipped with a newly designed multi-purpose stage to fulfill increasingly diversified market needs and realize multi-functionality by different kinds of functional holders. Surface milling and polishing, cross-section polishing and also carbon sputtering is now possible within one instrument, using specialized functional holders.

The system is easy to set up and can be programmed for high-speed processing and finishing of high quality cross sections in a short period of time. Intermittent processing can also be programmed to enhance preparation of materials of low melting temperature and susceptible to ion beam irradiation.

 

For more details, please visit our main website: https://www.jeol.co.jp/en/products/detail/IB-19530CP.html

JEOL introduces the JSM-IT500

JEOL's latest addition to the InTouchscope series is the JSM-IT500, a new model that incorporates new features that further increase ease of use and create a higher throughput for SEM analysis.

Key point 1 : Zeromag
The displayed Holder Graphics or CCD image enables you to locate the specimen area or specify analysis positions. You can rapidly search the specimen area and specify positions for multiple-field serial analysis.


Key point 2 : Live Analysis (Only for A/LA)
With "Live Analysis", the embedded EDS system shows a real time EDS spectrum during image observation. Elemental composition or "Alert" for element of interest is displayed on a live image.


Key point 3 : Integrated data management software
This user-friendly software enables you to select and review SEM images and analysis results through the data management area. You can also generate a report with a single click.

Please take a look at the video to see how the new features work: https://youtu.be/Kad1BzLWT5E