JSM-IT500HR

JSM-IT500HR

The JSM-IT500HR, based on the highly successful and award winning JEOL InTouchScope series, is equipped with a high-brightness electron gun and fully integrating JEOL's energy dispersive X-ray spectrometer (EDS). This revolutionizing JSM-IT500HR is a superb high throughput SEM, delivering a dramatically improved work efficiency (40% or higher than conventional models).

JEM-Z300FSC / JEM-Z200FSC

JEM-Z300FSC / JEM-Z200FSC

CRYO ARM is an electron microscope for observing biomolecules such as proteins at cryo temperature. The microscope equips a cold field-emission electron gun, an in-column Omega energy filter, a side-entry liquid nitrogen cooling stage, and an automated specimen exchange system. The specimen exchange system can store up to 12 specimens in the specimen exchange chamber.

JSM-IT200

JSM-IT200

Fast observation, analysis and report generation! JSM-IT200 is an easy-to-use SEM focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope, with significantly higher throughput.

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JEOL (Europe) BV News

latest news and events

New software for SEM Asbestos Analysis

Application Note: Frame Step Analyzer for Asbestos analysis.

We have released a software module for JEOL SEMs to assist the operator with asbestos analysis.

The operator can program any number of fields to be viewed, and with 1 press of a button the microscope can move to the next field.

When an asbestos fiber has been found and identified, it can be registered in a table, which can be saved as a report.

 

Applicable instruments: IT100, IT200, IT300 and IT500 series

For more information please contact us.

JEOL introduces the JSM-IT200

JEOL combines ease of use, high resolution and quick analysis in the latest SEM model.

With new features the new and compact JEOL JSM-IT200 enables the user to quickly and easily perform SEM analysis.

- “Zeromag" links the SEM image with Holder Graphics or optical CCD image, which enables the user to quickly locate areas for imaging and analysis.

- Autofunctions will do the microscope adjustments.

- Fully integrated EDS includes “live EDS Analysis”, displaying the chemical composition of the specimen while imaging.

- "Smile View™ Lab" for integrated management of image and analysis data, generates very quick reports from all data ranging from collected SEM images to elemental analysis results.

The small footprint and no need for water cooling or gas inlet allows easy installation of the SEM.

For more information, please visit our corporate website: https://www.jeol.co.jp/en/products/detail/JSM-IT200.html

Visit JEOL at WOTS 2018

WOTS 2018 will be held from October 2nd until October 5th in the Jaarbeurs Utrecht.

JEOL will be present with live SEM demonstrations on our latest model, the JSM-IT200 and we will have our latest Triple Quad Mass Spectrometer on display, the JMS-TQ4000GC.

Of course there will also be plenty of opportunity to discuss with our product specialists to discuss your application and how our instrumentation will help you find your answers. Our booth number is 07E084.

 

JEOL expands its lineup of gas chromatograph mass spectrometry with releasing new triple quadrupole mass spectrometer

JEOL Ltd. (President Gon-emon Kurihara) announces the release of new Gas Chromatograph(GC) -  triple quadrupole mass spectrometer system, JMS-TQ4000GC on August, 2018.

JMS-TQ4000GC is a GC-triple quadrupole mass spectrometer system with both capabilities of high throughput and high sensitivity based on the unique “Short collision cell technology”. Those capabilities can improve the productivity for routine analysis such as residual pesticides analysis in agricultural materials or monitoring of trace amount of chemicals regulated by tap water quality standard and environmental criteria in each region or country.

It is expected that JMS-TQ4000GC would contribute to expand JEOL’s market share of not only GC-triple quadrupole mass spectrometer but also GC-single quadrupole mass spectrometer or GC –time-of-flight mass spectrometer.

 

[Main Features]

1.   Short collision cell technology enables high speed data acquisition without crosstalk

JMS-TQ4000GC can achieve the fastest SRM (Selected Reaction Monitor) switching speed in the industry at 1,000 channels/sec. Moreover, even at the fast SRM it can eliminate ion interaction among SRM channels (crosstalk) and makes it possible to analyze multi-target compounds with high accuracies.

2.   High sensitivity achieved with ion accumulation and pulsed ion ejection at short collision cell

Short collision cell has both capabilities of ion accumulation and pulsed ion ejection. Noise level of signal can be reduced as much as possible by acquire data only when an ion pulse arrives at the detector. The noise reduction leads to high sensitivity.

3.   Simple operation for data acquisition and analysis with a combination of pre-installed SRM condition file and multi-target quantitative analysis software.

The “peak dependent SRM” system automatically creates the optimized measurement condition when the target pesticides are selected from the pre-installed SRM condition files. After measurement, the multi-target quantitative analysis software “Escrime” analyzes the data and creates the analysis reports according to the report format template selected in advance. In addition, the unique functionalities of “Escrime” such as “Slide show for chromatographic peaks check” and “Across-the-board manual peak integration” make the data verification easier and faster.

 

[Main Specification]

Measurement modes : Scan, SIM, Scan&SIM, SRM, Product-ion scan, Neutral loss scan, Precursor-ion scan, Scan&SRM

m/z range : 4~1,022

SRM speed : 1,000 channels/sec

CryoARM300 inauguration @ VIB Brussels 19th September 2018

The CryoARM300 at VIB Brussels will be inaugurated during the BECM sattelite meeting. The goal of the satellite lectures is to demonstrate the state of the art Cryo-EM options from a mostly technical perspective. The day will end with the BECM Inaugural Lecture to celebrate the installation of the CryoARM300 by Nobel Laureate Richard Henderson and a reception with barbecue.

This event precedes the Structural Dynamics in Cellular Communication conference on 20-21 September 2018 in Brussels, Belgium. You can find out more about this meeting on the conference website.

For more information and to register, please visit https://vib.formstack.com/forms/becm_satellite_meeting_registration

Inauguration of the JEM-ARM200F in Leuven

You are kindly invited to the Res Metallica symposium “Advanced Electron Microscopy and Spectroscopy for Deep Insight of Materials” on Wednesday May 9, 2018 at 13:00 in the "Aula van de Tweede Hoofdwet", Kasteelpark Arenberg 41, 3001 Leuven. The symposium is organised by the Department of Materials Engineering, KU Leuven and sponsored by JEOL and by FWO Science Research Network (WOG).

Recent advancements in electron microscope instrumentation have provided new possibilities for high resolution characterization of materials. Especially, the successful implementation of aberration-correction in a (scanning) transmission electron microscope (S)TEM has yielded possibilities far beyond the lateral resolution. In this symposium, two experts in this field will present the benefits of these advances with reference to several materials systems for gaining deeper understanding of materials properties. Two additional speakers, from university and from an industrial research environment, will highlight the role of (S)TEM for their research.

This symposium will be combined with the inauguration of the JEOL ARM200F STEM installed at the Corelab “Leuven NanoCentre”. The ARM200F was acquired via a Hercules Foundation project led by a consortium of KU Leuven (Materials Engineering, Physics, Centre for Surface Chemistry and Catalysis, Dental Materials) and supported by the group Science, Engineering and Technology of KU Leuven and JEOL. The ARM200F is an atomic resolution analytical electron microscope, with a STEM Cs corrector and cold field emission gun providing a STEM-HAADF resolution of 78 pm and full analytical capabilities using EDX and EELS.

 

To register, please visit: https://www.mtm.kuleuven.be/Events/ResMetallica/res-metallica-2018

JEOL present at the 42nd ISCC & 15th GCxGC Symposium from May 13-18

JEOL will be present at the 42nd International Conference Symposium on Capillary Chromatography (ISCC) jointly organized with the 15th GCxGC Symposium, which will be held this year in Riva del Garda, Italy from May 13th-18th.

We will have a booth displaying our latest developments, which will be presented in detail during a seminar.

The last conference in 2016 was very successful with 830 participants, from all around the world, and with 41 exhibitors.

This year particular emphasis will be directed to all Comprehensive Separation Technologies and MS Hyphenation and to capillary chromatography and 2D GC with various forms of MS from unit-mass to high resolution, and from single to hybrid analyzers.

 

For more information, please visit the conference website

JEOL Introduces the JSM-IT500HR

The JSM-IT500HR, the Field Emission version of the JSM-IT500, has been released. With this model all existing features of the IT500 are now incorporated into a High Resolution platform, enabling seemless operation from an optical image to a high resolution image.

For application examples and to see how the features work, please visit our corporate website:

https://www.jeol.co.jp/en/products/special_edition/2017/special01.html