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JEOL NEWS Volume 50, Number 1, July 2015

In this issue:

  • Lorentz TEM Study on Magnetic Skyrmions and Their Dynamics
  • Quantitative ADF STEM for Catalyst Nanoparticle Metrology
  • Application of Atomic-Resolution Energy-Dispersive X-ray Spectroscopy to the Study of Structures of Decagonal Quasicrystals
  • Dressing Living Organisms in the NanoSuit® for FE-SEM Observation
  • Serial Block Face Scanning Electron Microscopy Using the JEOL JSM-7100F with Gatan 3View 2XP at King’s College London – UK
  • Detailed Structural Characterization of Polymers by MALDI-TOFMS with a Spiral Ion Trajectory
  • 13C and 1H Solid-state NMR of Proteins and Other Systems under Ultra-Fast MAS at 80-100 kHz and Beyond
  • Development of Super-High Sensitivity EDS System for GRAND ARM (JEM-ARM300F)
  • Newly Developed Soft X-ray Emission Spectrometer, SS-94000SXES
  • Additional Ar-Ion Etching of FIB-Prepared TEM Samples using Ion Slicer
  • New Gas Chromatography/ High Resolution Time-of-Flight Mass Spectrometer JMS-T200GC “AccuTOF GCx”
  • Introduction of JEOL Products

JEOL NEWS Volume 49, Number 1, September, 2014

  • Development of Aberration Corrected Differential Phase Contrast (DPC) STEM
  • Atomic-Resolution Characterization Using the Aberration-Corrected JEOL JEM-ARM200CF at the University of Illinois – Chicago
  • Quantitative Characterization of Magnetic Materials Based on Electron Magnetic Circular Dichroism with Nanometric Resolution Using the JEM-1000K RS Ultra-High Voltage STEM
  • Photonic Crystal Lasers
  • Electron Microprobe Study of the Yinxu (Anyang) Bronze of Academia Sinica Collection
  • Elucidation of Deterioration Mechanism for Organic Solar Cells – Toward Highly Efficient Solar Cells
  • Super High Resolution Imaging with Atomic Resolution Electron Microscope of JEM-ARM300F
  • Advanced Analysis of Active Materials in Li-Ion Battery by XPS and AES
  • Characteristic Features and Applications of a Newly Developed Wavelength Dispersive Soft X-ray Emission Spectrometer for Electron Probe X-ray Microanalyzers and Scanning Electron Microscopes
  • Analysis of Organic Thin Films by the Laser Desorption/Ionization Method Using the JMS-S3000 “SpiralTOF”
  • Ultra-Low-Temperature-Probes (UltraCOOL™ probe / SuperCOOL™ probe)
  • New Series of NMR Spectrometers JNM-ECZ

JEOL NEWS Volume 48, Number 1, July, 2013

  • Innovation in Structural Interpretation of Al-TM (Transition-metal) Decagonal Quasicrystals By Cs-corrected STEM
  • Structural Analysis of Nanoparticles Using Scanning Transmission Electron Microscopy
  • Novel Structural Characterisations of Insulating and Electron Beam Sensitive Materials Employing Low Voltage High Resolution Scanning Electron Microscopy
  • Effects of l-menthol on the Thermotropic Characteristics of Intercellular Lipid in the Hairless Rat Stratum Corneum Evaluated by Differential Scanning Calorimetry and Electron Spin Resonance
  • Introduction of New Products
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