JSM-IT500HR

JSM-IT500HR

The JSM-IT500HR, based on the highly successful and award winning JEOL InTouchScope series, is equipped with a high-brightness electron gun and fully integrating JEOL's energy dispersive X-ray spectrometer (EDS). This revolutionizing JSM-IT500HR is a superb high throughput SEM, delivering a dramatically improved work efficiency (40% or higher than conventional models).

JEM-Z300FSC / JEM-Z200FSC

JEM-Z300FSC / JEM-Z200FSC

CRYO ARM is an electron microscope for observing biomolecules such as proteins at cryo temperature. The microscope equips a cold field-emission electron gun, an in-column Omega energy filter, a side-entry liquid nitrogen cooling stage, and an automated specimen exchange system. The specimen exchange system can store up to 12 specimens in the specimen exchange chamber.

JSM-IT200

JSM-IT200

Fast observation, analysis and report generation! JSM-IT200 is an easy-to-use SEM focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope, with significantly higher throughput.

JEOL NEWS Magazine

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JEOL NEWS Volume 52, Number 1, July, 2017

In this issue:

  • Revealing the Atomic Structure of Two Dimensional and Three Dimensional Defects by Aberration Corrected Scanning Transmission Electron Microscopy
  • Quantitative STEM-EELS Characterizations of Oxide Superlattices and Atomic-Scale Electron Spectroscopy at 100 K at National Taiwan University
  • High Spatial Resolution Scanning Electron Microscope: Evaluation and Structural Analysis of Nanostructured Materials
  • A Top-Down Drawing of the World’s Smallest National Flag by JBX-6300FS Electron Beam Lithography System
  • High Temporal Resolution Analysis of Materials Nanoprocess by Materials- and Bio-Science Ultra-High Voltage Electron Microscope at Osaka University
  • A Quantitative Analytical Method "Effective Magnetic Moment Method" Based on Both Curie-Weiss Law and ESR Fundamental Equation
  • Introduction of a Next-Generation 200 kV Cryo TEM
  • Development of Pixelated STEM Detector "4DCanvas"
  • Development of a New Field Emission Electron Probe Microanalyzer JXA-8530FPlus
  • JMS-MT3010HRGA INFITOF, a High Resolution Time-of-Flight Mass Spectrometer (TOF-MS) for Gas Monitoring Analysis
  • The Development of the ROYAL HFX Probe
  • Latest Technologies of Electron-Beam Vacuum Deposition Used for Film Formation
  • New-Generation Analyzer BioMajesty™ Zero Series, JCA-ZS050, and Its Contribution to Clinical Analysis
  • Introduction of New Products

JEOL NEWS Volume 51, Number 1, July, 2016

In this issue:

  • Atomic Resolution Microscopy of Intermetallic Clathrates
  • Probing the Atomic-Scale Structure of Electrode Materials for Rechargeable Batteries by Aberration-Corrected Scanning Transmission Electron Microscopy
  • Microscopic Analyses of Deformation Structures around Fatigue Crack Tips
  • Rapid Screening and Quantification of Synthetic Cannabinoids with DART-MS and NMR Spectroscopy
  • Nanostructured Surface Phonon Polariton Systems for Mid-Infrared Nanophotonics
  • Visualization of Invisible Defects in Semiconductor Devices
  • Development of Cryo-Coil MAS Probe for Multinuclear Measurement
  • Development of JEM-F200(F2) Multi-Purpose Electron Microscope
  • Three-Dimensional Reconstruction of Biological Tissues by Serial Block Face-SEM
  • Depth Profile Measurement with JPS-9030

JEOL NEWS Volume 50, Number 1, July 2015

In this issue:

  • Lorentz TEM Study on Magnetic Skyrmions and Their Dynamics
  • Quantitative ADF STEM for Catalyst Nanoparticle Metrology
  • Application of Atomic-Resolution Energy-Dispersive X-ray Spectroscopy to the Study of Structures of Decagonal Quasicrystals
  • Dressing Living Organisms in the NanoSuit® for FE-SEM Observation
  • Serial Block Face Scanning Electron Microscopy Using the JEOL JSM-7100F with Gatan 3View 2XP at King’s College London – UK
  • Detailed Structural Characterization of Polymers by MALDI-TOFMS with a Spiral Ion Trajectory
  • 13C and 1H Solid-state NMR of Proteins and Other Systems under Ultra-Fast MAS at 80-100 kHz and Beyond
  • Development of Super-High Sensitivity EDS System for GRAND ARM (JEM-ARM300F)
  • Newly Developed Soft X-ray Emission Spectrometer, SS-94000SXES
  • Additional Ar-Ion Etching of FIB-Prepared TEM Samples using Ion Slicer
  • New Gas Chromatography/ High Resolution Time-of-Flight Mass Spectrometer JMS-T200GC “AccuTOF GCx”
  • Introduction of JEOL Products

JEOL NEWS Volume 49, Number 1, September, 2014

  • Development of Aberration Corrected Differential Phase Contrast (DPC) STEM
  • Atomic-Resolution Characterization Using the Aberration-Corrected JEOL JEM-ARM200CF at the University of Illinois – Chicago
  • Quantitative Characterization of Magnetic Materials Based on Electron Magnetic Circular Dichroism with Nanometric Resolution Using the JEM-1000K RS Ultra-High Voltage STEM
  • Photonic Crystal Lasers
  • Electron Microprobe Study of the Yinxu (Anyang) Bronze of Academia Sinica Collection
  • Elucidation of Deterioration Mechanism for Organic Solar Cells – Toward Highly Efficient Solar Cells
  • Super High Resolution Imaging with Atomic Resolution Electron Microscope of JEM-ARM300F
  • Advanced Analysis of Active Materials in Li-Ion Battery by XPS and AES
  • Characteristic Features and Applications of a Newly Developed Wavelength Dispersive Soft X-ray Emission Spectrometer for Electron Probe X-ray Microanalyzers and Scanning Electron Microscopes
  • Analysis of Organic Thin Films by the Laser Desorption/Ionization Method Using the JMS-S3000 “SpiralTOF”
  • Ultra-Low-Temperature-Probes (UltraCOOL™ probe / SuperCOOL™ probe)
  • New Series of NMR Spectrometers JNM-ECZ

JEOL NEWS Volume 48, Number 1, July, 2013

  • Innovation in Structural Interpretation of Al-TM (Transition-metal) Decagonal Quasicrystals By Cs-corrected STEM
  • Structural Analysis of Nanoparticles Using Scanning Transmission Electron Microscopy
  • Novel Structural Characterisations of Insulating and Electron Beam Sensitive Materials Employing Low Voltage High Resolution Scanning Electron Microscopy
  • Effects of l-menthol on the Thermotropic Characteristics of Intercellular Lipid in the Hairless Rat Stratum Corneum Evaluated by Differential Scanning Calorimetry and Electron Spin Resonance
  • Introduction of New Products
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