JMS-T2000GC

JMS-T2000GC

High performance gas chromatograph time-of-flight mass spectrometer.

JEM-ARM300F2

JEM-ARM300F2

A new atomic resolution electron microscope has been released! The "GRAND ARM 2" has been upgraded. This new "GRAND ARM 2" enables observations at ultrahigh spatial resolution with highly sensitive analysis over a wide range of accelerating voltages.

JAM-5200 EBM
CRYO ARM 300 II (JEM-3300)

JEM-3300 (CRYO ARM 300 II) Cryo-Electron Microscope

CRYO ARM™ is an electron microscope for observing biomolecules such as proteins at cryo temperature. The microscope equips a cold field-emission electron gun, an in-column Omega energy filter, a side-entry liquid nitrogen cooling stage, and an automated specimen exchange system. The specimen exchange system can store up to 12 specimens in the specimen exchange chamber.

Electron Microscopy, NMR & Mass Spectometry News

rss

Electron Microscopy News

Our latest blogs on (Scanning) Electron Microscopes, NMR & Mass Spectometry

JEOL present at Materials 2016

JEOL (Europe) BV will be present at Materials 2016, on the 20th and 21st of April in the Konings in Veldhoven. We will have our latest compact SEM, the JSM-IT100LA on display. You are more than welcome to visit us and be informed about our latest developments. You can find us at Booth 91.

For more information, please visit the website https://materials.nl/

March 31, 2016 By Arnold Kruize Event Benchtop SEM, Desktop SEM, Elemental Analysis, Material Characterisation, SEM 0 0 Comment Read More »

Archives

Tags

Benchtop SEM GCMS MS Netherlands NMR Phenom SEM tabletop SEM TEM 120kV 200kV 2nd hand 3D EBSD 3D EDS 3d EDX 3D Imaging 3view 63pm 7900F Analytical anniversary ARM ARXPS Asbestos Automation Benchtop Benchtop SEM Benelux Biology CMGG Cold FEG Compact MS Compact SEM CP Cross Section Polisher Crude oil solution Cryo CRYOARM CryoEM Cryo-EM CryoTEM Delft Depth profiling Desktop SEM DualBeam ease of use Easy to use EBSD EDS EDX Electron Ionisation Elemental Analysis FEG FEG SEM FEG-SEM FEG-TEM FEI FE-SEM FIB-SEM Field Emission GC GCMS GC-Quadrupole GC-TOF GCxGC GCxGC/MS Ghent HCN MAS High resolution Hitachi HR-MS Inauguration In-situ installation Intouchscope Intuitive Ion beam polisher Ion Milling IT100 JEOL Laborama Laboratory solutions Mass Mass spectrometry Material Characterisation Material Science Medical Micro Microscope MS Multi Beam Multi purpose Nano Neoscope Netherlands New SEM NKI NMR Phenom Photo Iionisation Resolution Scanning Electron Microscope screening SEM SEM EDS SEM EDX SEM sample preparation SEM-EDX Solids NMR Solutions SPA STEM Structural Biology Surface analysis Table top Tabletop SEM TEM Titan TOF TOFMS Transmission Electron Microscope Triple Quad TRXPS Tweedehands UHR Ultra high resolution VIB Workflow WOTS XPS Zeromag

Featured Posts

Read More »