JSM-IT500HR Scanning Electron Microscope

JSM-IT500HR Scanning Electron Microscope

The JSM-IT500HR SEM, based on the highly successful and award winning JEOL InTouchScope series, is equipped with a high-brightness electron gun and fully integrating JEOL's energy dispersive X-ray spectrometer (EDS). This revolutionizing JSM-IT500HR is a superb high throughput SEM, delivering a dramatically improved work efficiency (40% or higher than conventional models).

JEM-Z300FSC (CRYO ARM) Electron Microscope

JEM-Z300FSC / JEM-Z200FSC Cryo-Electron Microscope

CRYO ARM is an electron microscope for observing biomolecules such as proteins at cryo temperature. The microscope equips a cold field-emission electron gun, an in-column Omega energy filter, a side-entry liquid nitrogen cooling stage, and an automated specimen exchange system. The specimen exchange system can store up to 12 specimens in the specimen exchange chamber.

JSM-IT200 Scanning Electron Microscope

JSM-IT200 Scanning Electron Microscope

Fast observation, analysis and report generation! JSM-IT200 is an easy-to-use scanning electron microscope focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope, with significantly higher throughput.

Electron Microscopy, NMR & Mass Spectometry News

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Electron Microscopy News

Our latest blogs on (Scanning) Electron Microscopes, NMR & Mass Spectometry

Inauguration of the JEM-ARM200F in Leuven

You are kindly invited to the Res Metallica symposium “Advanced Electron Microscopy and Spectroscopy for Deep Insight of Materials” on Wednesday May 9, 2018 at 13:00 in the "Aula van de Tweede Hoofdwet", Kasteelpark Arenberg 41, 3001 Leuven. The symposium is organised by the Department of Materials Engineering, KU Leuven and sponsored by JEOL and by FWO Science Research Network (WOG).

Recent advancements in electron microscope instrumentation have provided new possibilities for high resolution characterization of materials. Especially, the successful implementation of aberration-correction in a (scanning) transmission electron microscope (S)TEM has yielded possibilities far beyond the lateral resolution. In this symposium, two experts in this field will present the benefits of these advances with reference to several materials systems for gaining deeper understanding of materials properties. Two additional speakers, from university and from an industrial research environment, will highlight the role of (S)TEM for their research.

This symposium will be combined with the inauguration of the JEOL ARM200F STEM installed at the Corelab “Leuven NanoCentre”. The ARM200F was acquired via a Hercules Foundation project led by a consortium of KU Leuven (Materials Engineering, Physics, Centre for Surface Chemistry and Catalysis, Dental Materials) and supported by the group Science, Engineering and Technology of KU Leuven and JEOL. The ARM200F is an atomic resolution analytical electron microscope, with a STEM Cs corrector and cold field emission gun providing a STEM-HAADF resolution of 78 pm and full analytical capabilities using EDX and EELS.

 

To register, please visit: https://www.mtm.kuleuven.be/Events/ResMetallica/res-metallica-2018

Release of the JEM-F200, a multi purpose TEM

JEOL's latest addition to its suite of Transmission Electron Microscopes is the versatile JEM-F200, also nicknamed "F2", the only advanced analytical, high throughput 200kV S/TEM in its class to offer a Cold Field Emission Gun and dual Silicon Drift Detectors.

The combined boost in probe current from the Cold FEG with the dual EDS makes this TEM stand out in its class.The 'F2' employs the newest in JEOL innovations in an easy-to-use, extremely stable, high resolution imaging and analytical TEM.

The F2 incorporates many new features: 

  • Smart- design, with a new intuitive user interface
  • Quad-lens condenser system,  the new 4-stageprobe-forming optical system, Quad-Lens condenser system, controls the electron beam intensity and the convergence angle independently to respond to different research requirements.
  • Advanced Scan system,which is capable of scanning the electron beam in the image forming system (optional) , in addition to the standard scanning system for the probe-forming system. This accomplishes wide field STEM-EELS.
  • Pico Stage Drive, which is capable of driving the stage in pico meter steps without a piezo drive, and moving the area of view in a wide dynamic range from an entire sample grid to atomic order images.
  • Specporter, an auto holder loading/unloading device.
  • Improved coldFEG, Guaranteeing high stability, high brightness, and high energy resolution, the cold field emission electron gun enables chemical bonding analysis by EELS, speeds up the analytical process by the high brightness electron beam, and minimizes chromatic aberrations from the electron source for enabling high resolution imaging.
  • Dual SDD, for very fast EDS analysis and minimal sample damage.
  • Environmental friendly, the instrument can be switched to ECO mode when not in use, to reduce its energy consumption.

Main specification: TEM point to point: 0.19 nm STEM-HAADF: 0.14 nm (using Cold FEG and UHR polepiece)

JEM-F200-F2 Transmission Electron Microscope (TEM)

New TEM for Naturalis

The Naturalis Biodiversity Center, a research institute and natural history museum in Leiden, has recently acquired the state-of-the-art JEM-1400Plus Transmission Electron Microscope (TEM) from JEOL.

 “Thanks to this TEM we are able to study the biodiversity of plants and species in the smallest details.” According to Kees van den Berg, Senior Analyst at Naturalis. “For the acquisition of the new 120kV TEM the JEM-1400Plus from JEOL was selected because of its performance, ease-of-use and proven stability of the system. The excellent service track record of JEOL also played an important role in the evaluation."

"We used to have a JEOL JEM-1010 from 1992. Even though it was still working well, it no longer fit in our new organization structure where digitalization of our collection and data has become a priority. Additionally, the new TEM is also fully compatible with our Windows 7 based network. The JEM-1010 will go to a new owner who will certainly  benefit from the microscope for years to come."

Since the introduction of the JEM-1400 in 2007 and the JEM-1400Plus in 2012, already more than 600 microscopes of this type have been installed worldwide. The strength of this system lies in the flexibility of the system to be able to work in a great variety of research fields, for example: Biological sections, polymers, nanomaterials and asbestos analysis, all in both room temperature and under cryo conditions.