JMS-T2000GC

JMS-T2000GC

High performance gas chromatograph time-of-flight mass spectrometer.

JEM-ARM300F2

JEM-ARM300F2

A new atomic resolution electron microscope has been released! The "GRAND ARM 2" has been upgraded. This new "GRAND ARM 2" enables observations at ultrahigh spatial resolution with highly sensitive analysis over a wide range of accelerating voltages.

JAM-5200 EBM
CRYO ARM 300 II (JEM-3300)

JEM-3300 (CRYO ARM 300 II) Cryo-Electron Microscope

CRYO ARM™ is an electron microscope for observing biomolecules such as proteins at cryo temperature. The microscope equips a cold field-emission electron gun, an in-column Omega energy filter, a side-entry liquid nitrogen cooling stage, and an automated specimen exchange system. The specimen exchange system can store up to 12 specimens in the specimen exchange chamber.

Electron Microscopy, NMR & Mass Spectometry News

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JEOL releases the JSM-IT300HR

The JSM-IT300HR is the latest model in the InTouchscope Series. The succesful series has been expanded with a model that comes standard with a Field Emission Gun and Low Vacuum capabilities, based on the JSM-IT300 Tungsten SEM.

This versatile and powerful microscope allows for very easy and very fast imaging at high magnifications, so that even novice users can quickly enjoy the benefits of a Field Emission Gun. 

Main features:

  1. New high-brightness electron gun and optical system provide high resolution imaging and high spatial-resolution analysis.
  2. Intuitive operation is enabled by Touch panel functions, Automatic functions and Recipe functions.
  3. Easy-to-use software interface (GUI) includes full integration of image observation and element analysis, allowing even novice users to perform any task with high efficiency.
  4. Large specimen stage which accommodates various sizes and types of specimens for extended observation and analysis.
  5. Small footprint equivalent to the conventional general-purpose SEM.

More detailed information and example images can be found on our corporate website: https://www.jeol.co.jp/en/news/detail/20160907.1675.html

October 25, 2016 By Arnold Kruize Product Introduction Ease of use, FEG SEM, High resolution, Intouchscope, SEM 0 0 Comment Read More »
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