JMS-T2000GC

JMS-T2000GC

High performance gas chromatograph time-of-flight mass spectrometer.

JEM-ARM300F2

JEM-ARM300F2

A new atomic resolution electron microscope has been released! The "GRAND ARM 2" has been upgraded. This new "GRAND ARM 2" enables observations at ultrahigh spatial resolution with highly sensitive analysis over a wide range of accelerating voltages.

JAM-5200 EBM
CRYO ARM 300 II (JEM-3300)

JEM-3300 (CRYO ARM 300 II) Cryo-Electron Microscope

CRYO ARM™ is an electron microscope for observing biomolecules such as proteins at cryo temperature. The microscope equips a cold field-emission electron gun, an in-column Omega energy filter, a side-entry liquid nitrogen cooling stage, and an automated specimen exchange system. The specimen exchange system can store up to 12 specimens in the specimen exchange chamber.

Electron Microscopy, NMR & Mass Spectometry News

rss

Electron Microscopy News

Our latest blogs on (Scanning) Electron Microscopes, NMR & Mass Spectometry

JEOL releases the JSM-IT300HR

The JSM-IT300HR is the latest model in the InTouchscope Series. The succesful series has been expanded with a model that comes standard with a Field Emission Gun and Low Vacuum capabilities, based on the JSM-IT300 Tungsten SEM.

This versatile and powerful microscope allows for very easy and very fast imaging at high magnifications, so that even novice users can quickly enjoy the benefits of a Field Emission Gun. 

Main features:

  1. New high-brightness electron gun and optical system provide high resolution imaging and high spatial-resolution analysis.
  2. Intuitive operation is enabled by Touch panel functions, Automatic functions and Recipe functions.
  3. Easy-to-use software interface (GUI) includes full integration of image observation and element analysis, allowing even novice users to perform any task with high efficiency.
  4. Large specimen stage which accommodates various sizes and types of specimens for extended observation and analysis.
  5. Small footprint equivalent to the conventional general-purpose SEM.

More detailed information and example images can be found on our corporate website: https://www.jeol.co.jp/en/news/detail/20160907.1675.html

October 25, 2016 By Arnold Kruize Product Introduction Ease of use, FEG SEM, High resolution, Intouchscope, SEM 0 0 Comment Read More »

Archives

Tags

Benchtop SEM GCMS MS Netherlands NMR Phenom SEM tabletop SEM TEM 120kV 200kV 2nd hand 3D EBSD 3D EDS 3d EDX 3D Imaging 3view 63pm 7900F Analytical anniversary ARM ARXPS Asbestos Automation Benchtop Benchtop SEM Benelux Biology CMGG Cold FEG Compact MS Compact SEM CP Cross Section Polisher Crude oil solution Cryo CRYOARM CryoEM Cryo-EM CryoTEM Delft Depth profiling Desktop SEM DualBeam ease of use Easy to use EBSD EDS EDX Electron Ionisation Elemental Analysis FEG FEG SEM FEG-SEM FEG-TEM FEI FE-SEM FIB-SEM Field Emission GC GCMS GC-Quadrupole GC-TOF GCxGC GCxGC/MS Ghent HCN MAS High resolution Hitachi HR-MS Inauguration In-situ installation Intouchscope Intuitive Ion beam polisher Ion Milling IT100 JEOL Laborama Laboratory solutions Mass Mass spectrometry Material Characterisation Material Science Medical Micro Microscope MS Multi Beam Multi purpose Nano Neoscope Netherlands New SEM NKI NMR Phenom Photo Iionisation Resolution Scanning Electron Microscope screening SEM SEM EDS SEM EDX SEM sample preparation SEM-EDX Solids NMR Solutions SPA STEM Structural Biology Surface analysis Table top Tabletop SEM TEM Titan TOF TOFMS Transmission Electron Microscope Triple Quad TRXPS Tweedehands UHR Ultra high resolution VIB Workflow WOTS XPS Zeromag

Featured Posts

Read More »