JSM-IT500HR

JSM-IT500HR

The JSM-IT500HR, based on the highly successful and award winning JEOL InTouchScope series, is equipped with a high-brightness electron gun and fully integrating JEOL's energy dispersive X-ray spectrometer (EDS). This revolutionizing JSM-IT500HR is a superb high throughput SEM, delivering a dramatically improved work efficiency (40% or higher than conventional models).

JEM-Z300FSC / JEM-Z200FSC

JEM-Z300FSC / JEM-Z200FSC

CRYO ARM is an electron microscope for observing biomolecules such as proteins at cryo temperature. The microscope equips a cold field-emission electron gun, an in-column Omega energy filter, a side-entry liquid nitrogen cooling stage, and an automated specimen exchange system. The specimen exchange system can store up to 12 specimens in the specimen exchange chamber.

JSM-IT200

JSM-IT200

Fast observation, analysis and report generation! JSM-IT200 is an easy-to-use SEM focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope, with significantly higher throughput.

rss

JEOL (Europe) BV News

latest news and events

Inauguration of the JEM-ARM200F in Leuven

You are kindly invited to the Res Metallica symposium “Advanced Electron Microscopy and Spectroscopy for Deep Insight of Materials” on Wednesday May 9, 2018 at 13:00 in the "Aula van de Tweede Hoofdwet", Kasteelpark Arenberg 41, 3001 Leuven. The symposium is organised by the Department of Materials Engineering, KU Leuven and sponsored by JEOL and by FWO Science Research Network (WOG).

Recent advancements in electron microscope instrumentation have provided new possibilities for high resolution characterization of materials. Especially, the successful implementation of aberration-correction in a (scanning) transmission electron microscope (S)TEM has yielded possibilities far beyond the lateral resolution. In this symposium, two experts in this field will present the benefits of these advances with reference to several materials systems for gaining deeper understanding of materials properties. Two additional speakers, from university and from an industrial research environment, will highlight the role of (S)TEM for their research.

This symposium will be combined with the inauguration of the JEOL ARM200F STEM installed at the Corelab “Leuven NanoCentre”. The ARM200F was acquired via a Hercules Foundation project led by a consortium of KU Leuven (Materials Engineering, Physics, Centre for Surface Chemistry and Catalysis, Dental Materials) and supported by the group Science, Engineering and Technology of KU Leuven and JEOL. The ARM200F is an atomic resolution analytical electron microscope, with a STEM Cs corrector and cold field emission gun providing a STEM-HAADF resolution of 78 pm and full analytical capabilities using EDX and EELS.

 

To register, please visit: https://www.mtm.kuleuven.be/Events/ResMetallica/res-metallica-2018

JEOL present at WOTS 2016

During WOTS 2016 from October 4th until October 7th in Utrecht, JEOL will be present with live SEM demonstrations and a variety of lectures on the latest developments regarding SEM, TEM, MS and NMR. 

Every day presentations will be given in our on-booth lecture room:

Novelties in Liquid and Solids NMR   11:00-11:30

SEM at your fingertips 12:00-12:30

Gas and Volatiles analysis with High resolution MS  14:00-14:30

Introduction to the all-purpose TEM  15:00-15:30

Of course there will also be plenty of opportunity to discuss with our product specialists to discuss your application and how our instrumentation will help you find your answers. Our booth number is 7B034.

See you at WOTS 2016!

Inauguration of the JEM-1400Plus in Ghent on 24th March 2016

24th March 2016 knew the festive inauguration of the JEM-1400Plus, JEOL’s 120 kV TEM, in Ghent. The 1400Plus is JEOL’s latest generation 120 kV TEM. This system is extremely user-friendly and has integrated solutions for tomography as well as for large area imaging. The investment is a joint effort of 4 research centers of VIB (Flemish Institute for Biotechnology) and 1 research center of Ghent University:

·         Inflammation Research Center (VIB-IRC)

·         Plant Systems Biology (VIB-PSB)

·         Medical Biotechnology Center (VIB-MBC)

·         VIB Core facilities

·         Center for Medical Genetics Ghent University (CMGG)

In her welcome speech Prof. Anne de Paepe, Rector of Ghent University and Director of CMGG, emphasized the importance of collaboration for the acquisition and exploitation of large equipment.

The official “cutting of the ribbon” was followed by a demonstration of the 1400Plus and a reception with a variety of drinks and delicious snacks for the more than 100 participants.

  

Pictures:

TOP The official “cutting of the ribbon” by Prof. Anne De Paepe, assisted by mrs. Riet De Rycke and mr. Michiel De Bruyne, transmission electron microscopists at the VIB-UGent TEM Core Facility.

BOTTOM Mrs Riet De Rycke (far right) demonstrates the 1400Plus to (starting first row and from left to right): Prof. Nico Callewaert, Director MBC; Prof. Dirk Inzé, Director PSB; Dr. Jo Bury, Managing Director VIB, Prof. Bart Lambrecht, Director IRC; Prof. Anne De Paepe, Rector and Director CMGG.

Release of the JEM-F200, a multi purpose TEM

JEOL's latest addition to its suite of Transmission Electron Microscopes is the versatile JEM-F200, also nicknamed "F2", the only advanced analytical, high throughput 200kV S/TEM in its class to offer a Cold Field Emission Gun and dual Silicon Drift Detectors.

The combined boost in probe current from the Cold FEG with the dual EDS makes this TEM stand out in its class.The 'F2' employs the newest in JEOL innovations in an easy-to-use, extremely stable, high resolution imaging and analytical TEM.


The F2 incorporates many new features: 

  • Smart- design, with a new intuitive user interface
  • Quad-lens condenser system,  the new 4-stageprobe-forming optical system, Quad-Lens condenser system, controls the electron beam intensity and the convergence angle independently to respond to different research requirements.
  • Advanced Scan system,which is capable of scanning the electron beam in the image forming system (optional) , in addition to the standard scanning system for the probe-forming system. This accomplishes wide field STEM-EELS.
  • Pico Stage Drive, which is capable of driving the stage in pico meter steps without a piezo drive, and moving the area of view in a wide dynamic range from an entire sample grid to atomic order images.
  • Specporter, an auto holder loading/unloading device.
  • Improved coldFEG, Guaranteeing high stability, high brightness, and high energy resolution, the cold field emission electron gun enables chemical bonding analysis by EELS, speeds up the analytical process by the high brightness electron beam, and minimizes chromatic aberrations from the electron source for enabling high resolution imaging.
  • Dual SDD, for very fast EDS analysis and minimal sample damage.
  • Environmental friendly, the instrument can be switched to ECO mode when not in use, to reduce its energy consumption.

Main specification: TEM point to point: 0.19 nm STEM-HAADF: 0.14 nm (using Cold FEG and UHR polepiece)


New TEM for Naturalis

The Naturalis Biodiversity Center, a research institute and natural history museum in Leiden, has recently acquired the state-of-the-art JEM-1400Plus Transmission Electron Microscope (TEM) from JEOL.

 “Thanks to this TEM we are able to study the biodiversity of plants and species in the smallest details.” According to Kees van den Berg, Senior Analyst at Naturalis. “For the acquisition of the new 120kV TEM the JEM-1400Plus from JEOL was selected because of its performance, ease-of-use and proven stability of the system. The excellent service track record of JEOL also played an important role in the evaluation."

"We used to have a JEOL JEM-1010 from 1992. Even though it was still working well, it no longer fit in our new organization structure where digitalization of our collection and data has become a priority. Additionally, the new TEM is also fully compatible with our Windows 7 based network. The JEM-1010 will go to a new owner who will certainly  benefit from the microscope for years to come."

Since the introduction of the JEM-1400 in 2007 and the JEM-1400Plus in 2012, already more than 600 microscopes of this type have been installed worldwide. The strength of this system lies in the flexibility of the system to be able to work in a great variety of research fields, for example: Biological sections, polymers, nanomaterials and asbestos analysis, all in both room temperature and under cryo conditions. 




JEOL (Europe) BV present at Labtechnology 2015

On the 7th and 8th of October the exhibition Labtechnology 2015 will be held at the Jaarbeurs in Utrecht. JEOL (Europe) BV will be present to promote our recent developments and new products in the field of NMR, Mass spectrometry and Electron Optics. You can find us at booth C18.

To register for this exhibition please visit http://www.labtechnology.nl/

 

JEM-ARM300F: The Ultimate Atomic Resolution Transmission Electron Microscope

Transmission electron microscopy (TEM) has long been a tool essential for micro structure evaluation in the field of materials development.
However, as the fine structures of advanced materials are being designed at the nano level or atomic level, the synthetic process for such materials increasingly requires imaging and analysis at higher resolution.

To meet this demand, JEOL has focused on development of a transmission electron microscope incorporating spherical aberration correctors to exceed the current resolution boundary.
In 2009, JEOL announced the JEM-ARM200F, a 200 kV atomic resolution analytical transmission electron microscope featuring spherical aberration correctors, which achieved a resolution of 80 pm (scanning transmission (STEM) image) as the first ever commercial electron microscope.  To achieve the atomic level resolution, the JEM-ARM200F incorporates various capabilities to ensure highly stable operation.  With over 100 units of the ARM200F currently in operation worldwide, many researchers have become familiar with atomic level imaging and analysis.

JEM-ARM300F
Meanwhile, as aberration correctors are widely used, various new requirements for transmission electron microscopy are emerging, in addition to higher resolution, including higher analytical sensitivity, in-situ imaging, flexible accelerating voltage control, and ease of operation for aberration correction.

Thus, JEOL developed the JEM-ARM300F, a 300 kV atomic resolution transmission electron microscope featuring JEOL's own aberration correctors as an enhanced model of the JEM-ARM200F.
Nicknamed GRAND ARM, the JEM-ARM300F, incorporates JEOL's propriety dodecapole correctors, successfully increasing the resolution level to 63 pm (STEM resolution).
The GRAND ARM can be configured for ultra high resolution imaging or analytical applications for high sensitivity and in-situ analysis according to the user's needs.


The system is primarily intended for public and private research institutes and semiconductor manufacturers.

Main Features

  1. Ultra high resolution imaging
    Achieves a resolution of 63 pm in the scanning transmission electron microscope image (STEM) mode at an accelerating voltage of 300 kV, using JEOL's own spherical aberration corrector for the illumination system.
  2. High performance cold-cathode field-emission electron gun featuring high brightness and low energy dispersion
    Incorporates a new high performance cold cathode electron gun as standard; the high brightness beam with minimum chromatic aberration allows for high resolution imaging and analysis.
  3. Wide accelerating voltage range
    Supports accelerating voltage levels of 300 kV and 80 kV as standard; other accelerating voltage levels are optionally available as needed.
  4. Aberration corrector integrated with microscope base unit
    Incorporates JEOL's proprietary spherical aberration correctors in the image forming system (TEM aberration corrector) and in the illumination system (STEM spherical aberration corrector).
  5. Aberration corrector control system
    Uses the JEOL COSMO (JEOL Corrector System Module) system for auto control of the aberration correctors.
  6. Two types of objective lens pole piece
    Two types of objective lens polepiece are available to meet a wide range of users' applications.
  7. Vacuum system featuring dry pre-evacuation and high vacuum
    The vacuum system features a pre-evacuation system incorporating a turbo molecular pump as standard and an enhanced column evacuation system, achieving higher vacuum while minimizing contamination and damage in atomic level imaging and analysis.
  8. Stable column/console, specimen stage, and electrical system
    The column, 330 mm in diameter, features a higher level of mechanical rigidity.  The microscope base unit is also designed to enhance its mechanical/electrical stability and resistance to environment, fully utilizing the stabilizing technologies developed for the JEM-ARM200F.
  9. A complete line of signal detectors
    A complete line of signal detectors are available, including EDS (energy dispersive X-ray spectrometer) up to 100 mm2and EELS (electron energy loss spectrometer), backscattered electron detectors, and up to 4 STEM detectors.  The microscope also supports simultaneous observation of high angle annular dark field image, low angle annular dark field image, annular bright field image, and bright field image.

Main Specifications

Accelerating voltage Maximum 300 kV
TEM lattice resolution 0.05 nm(with spherical aberration corrector for image forming system)
STEM resolution 0.063 nm(spherical aberration corrector for illumination system)

 

JEM-2100Plus: A new 200kV Transmission Electron Microscope

The JEM-2100Plus is a multi purpose transmission electron microscope for micro structure evaluation, which combines the proven JEM-2100 optic system with an advanced control system for enhanced ease of operation. Achieving superior performance through very user friendly intuitive operation, the JEM-2100Plus provides solutions to a wide range of applications from materials science to medical/biological studies.

Main Features


Designed to ease of operation

  1. 64 bit Windows® compatible control software, TEM Center, is an intuitive user interface designed to maximize ease of operation.
  2. A complete range of automated functions
    The JEM-2100Plus comes with a complete range of automated functions, including auto focus, auto contrast/brightness, auto exposure, auto montage, drift compensation, and stage navigation.
  3. Advanced integration
    The TEM Center allows the user to control optional accessories such as high resolution camera and scanning image (BF/DF) observation device through intuitive user-system interaction.
  4. Image view/edit software
    Viewer software supports off-line image viewing and editing.

Notices:Windows is a registered trademark of Microsoft Corporation in the United States and other countries.

Main Specifications

Maximum accelerating voltage 200kV
Guaranteed resolution 0.14 nm(TEM lattice image)
Magnification x30 to x800,000
The JEM-2100Plus can be configured to support a variety of applications from cryo TEM to ultra high resolution imaging.

JEM-2100Plus