JSM-IT500HR Scanning Electron Microscope

JSM-IT500HR Scanning Electron Microscope

The JSM-IT500HR SEM, based on the highly successful and award winning JEOL InTouchScope series, is equipped with a high-brightness electron gun and fully integrating JEOL's energy dispersive X-ray spectrometer (EDS). This revolutionizing JSM-IT500HR is a superb high throughput SEM, delivering a dramatically improved work efficiency (40% or higher than conventional models).

JEM-Z300FSC (CRYO ARM) Electron Microscope

JEM-Z300FSC / JEM-Z200FSC Cryo-Electron Microscope

CRYO ARM is an electron microscope for observing biomolecules such as proteins at cryo temperature. The microscope equips a cold field-emission electron gun, an in-column Omega energy filter, a side-entry liquid nitrogen cooling stage, and an automated specimen exchange system. The specimen exchange system can store up to 12 specimens in the specimen exchange chamber.

JSM-IT200 Scanning Electron Microscope

JSM-IT200 Scanning Electron Microscope

Fast observation, analysis and report generation! JSM-IT200 is an easy-to-use scanning electron microscope focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope, with significantly higher throughput.

Electron Microscopy, NMR & Mass Spectometry News

rss

Electron Microscopy News

Our latest blogs on (Scanning) Electron Microscopes, NMR & Mass Spectometry

JEOL JSM-F100.jpg

JEOL introduces the JSM-F100

JSM-F100 is an easy-to-use FEG-SEM for high resolution imaging. This latest model Scanning Electron Microscope is equipped with our NEO-engine, LIVE-AI image filter and a brandnew GUI. Together this speeds up the workflow significantly.

Furthermore, the JSM-F100 comes with a JEOL energy dispersive X-ray spectrometer (EDS), which is fully integrated within "SEM Center" for seamless acquisition from images to elemental analysis results. Inspired by users in pursuing the evolution, and integration, of high performance and operability, the JSM-F100 achieves a superb work efficiency,  leading to dramatically increased high throughput capabilities.

 

For more information please visit https://www.jeol.co.jp/en/products/detail/JSM-F100.html

 

JEOL Present at Labtechnology 2019

Logo Labtechnology

On the 1st and 2nd of October the exhibition Labtechnology 2019 will be held at the Jaarbeurs in Utrecht. JEOL (Europe) BV will be present to promote our recent developments and new products in the field of NMR, Mass spectrometry and Electron Optics. You can find us at booth A17.. 

We will have our latest Benchtop SEM, the JCM-7000 live on display, and we will present our most recent Triple Quadrupole Mass Spectrometer, the JMS-TQ4000GC

To sign up for this event, please visit https://labtechnology.nl

New software for SEM Asbestos Analysis

Application Note: Frame Step Analyzer for Asbestos analysis.

We have released a software module for JEOL SEMs to assist the operator with asbestos analysis.

The operator can program any number of fields to be viewed, and with one press of a button the microscope can move to the next field.

Frame Step Analyzer for Asbestos Analysis (screenshot)

When an asbestos fiber has been found and identified, it can be registered in a table, which can be saved as a report.

 

Frame Step Analyzer for Asbestos Analysis (screenshot 2)

Applicable instruments: IT100, IT200, IT300 and IT500 series

For more information please contact us.

JEOL introduces the JSM-IT200

JEOL combines ease of use, high resolution and quick analysis in the latest SEM model.

With new features JEOL's new and compact scanning electron microscope JSM-IT200 enables the user to quickly and easily perform SEM analysis.

Scanning Electron Microscope JSM-IT200

  • “Zeromag" links the SEM image with Holder Graphics or optical CCD image, which enables the user to quickly locate areas for imaging and analysis.
  • Autofunctions will do the microscope adjustments.
  • Fully integrated EDS includes “live EDS Analysis”, displaying the chemical composition of the specimen while imaging.
  • Smile View™ Lab" for integrated management of image and analysis data, generates very quick reports from all data ranging from collected SEM images to elemental analysis results.
  • The small footprint and no need for water cooling or gas inlet allows easy installation of the SEM.

For more information, please visit our corporate website: https://www.jeol.co.jp/en/products/detail/JSM-IT200.html

Read more about electron microscopy on JEOL Benelux - Scanning Electron Microscopy (SEM).

Visit JEOL at WOTS 2018

WOTS 2018 will be held from October 2nd until October 5th in the Jaarbeurs Utrecht.

JEOL will be present with live SEM demonstrations on our latest model, the JSM-IT200 and we will have our latest Triple Quad Mass Spectrometer on display, the JMS-TQ4000GC.

Of course there will also be plenty of opportunity to discuss with our product specialists to discuss your application and how our instrumentation will help you find your answers. Our booth number is 07E084.

 

JEOL Introduces the JSM-IT500HR

The JSM-IT500HR, the Field Emission version of the JSM-IT500, has been released. With this model all existing features of the IT500 are now incorporated into a High Resolution platform, enabling seemless operation from an optical image to a high resolution image.

For application examples and to see how the features work, please visit our corporate website:

https://www.jeol.co.jp/en/products/special_edition/2017/special01.html

JEOL Present at Laborama 2018

JEOL (Europe) BV will be present at the Laborama Expo 2018, on the 15th and 16th of March in the Brussels Kart Expo in Groot Bijgaarden. We will have  our benchtop SEM on display. You are more than welcome to visit us and be informed about our latest developments on SEM, MS and NMR. You can find us at Booth B4. 

For more Information about this event, please visit: http://expo.laborama.be/nl

Announcement Laborama Expo 2018 - Trade Fair for Laboratory Professionals