JSM-IT500HR Scanning Electron Microscope

JSM-IT500HR Scanning Electron Microscope

The JSM-IT500HR SEM, based on the highly successful and award winning JEOL InTouchScope series, is equipped with a high-brightness electron gun and fully integrating JEOL's energy dispersive X-ray spectrometer (EDS). This revolutionizing JSM-IT500HR is a superb high throughput SEM, delivering a dramatically improved work efficiency (40% or higher than conventional models).

JEM-Z300FSC (CRYO ARM) Electron Microscope

JEM-Z300FSC / JEM-Z200FSC Cryo-Electron Microscope

CRYO ARM is an electron microscope for observing biomolecules such as proteins at cryo temperature. The microscope equips a cold field-emission electron gun, an in-column Omega energy filter, a side-entry liquid nitrogen cooling stage, and an automated specimen exchange system. The specimen exchange system can store up to 12 specimens in the specimen exchange chamber.

JSM-IT200 Scanning Electron Microscope

JSM-IT200 Scanning Electron Microscope

Fast observation, analysis and report generation! JSM-IT200 is an easy-to-use scanning electron microscope focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope, with significantly higher throughput.

Electron Microscopy, NMR & Mass Spectometry News

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Electron Microscopy News

Our latest blogs on (Scanning) Electron Microscopes, NMR & Mass Spectometry

JEOL released the JSM-IT800 FE-SEM

JEOL has released the JSM-IT800 FE-SEM, the most powerful SEM to date, guaranteeing a resolution of 0.5nm @ 15kV and 0.9nm at 500V.

The JSM-IT800 incorporates our In-lens Schottky Plus field emission electron gun for high resolution imaging to fast elemental mapping, and an innovative electron optical control system "Neo Engine", as well as a seamless GUI "SEM Center" for full integration of a JEOL energy dispersive X-ray spectrometer (EDS). Furthermore, the JSM-IT800 allows for two types of objective lens configurations, offering different versions to satisfy various users requirements.

The two versions of the JSM-IT800 include the Hybrid Lens (HL) version for a general-purpose SEM and the Super Hybrid Lens (SHL) version for enhanced high resolution observation and various analyses. In addition, the JSM-IT800 of the SHL version comes with a new Upper Hybrid Detector (UHD) to acquire higher signal-to-noise ratio images for the study of fine structures of specimens.

The JSM-IT800 can also be equipped with a new Scintillator Backscattered Electron Detector (SBED) and a Versatile Backscattered Electron Detector (VBED). The SBED enables acquisition of images with high responsiveness and produces sharp material contrast even at low accelerating voltage. The VBED can acquire 3D-, topographic-, and material-contrast images.

 

For more information, please visit our corporate website

JEOL (Europe) BV offering Refurbished Instruments

We have recently taken back several instruments that are still in excellent condition and can be offered as refurbished microscopes.

  • JEM-1010 100kV TEM with Megaview Camera

               JEM-1010

  • JEM-1200EXII 120kV TEM with STEM
  • JEM-1200EXII 120kV TEM with Orius Camera and EDX

                      JEM-1200EXII

  • JSM-6380 Compact W-SEM with SE detector (same size as 6060LV)
  • JSM-6060LV Compact W-SEM with SE and BSE detector

               JSM-6060LV 

  • JSM-6700F Cold FEG-SEM with in chamber SE, in-lens SE, retractable BSE detector and STEM detector

               JSM-6700F

For any further details or questions, please contact us: Sales(at)jeolbenelux.com