JSM-IT700HR Scanning Electron Microscope

JSM-IT700HR InTouchScope™

SEM- Essential in Daily Lab Operation JSM-IT700HR Makes it Easy.

Scanning Electron Microscope

JEM-Z300FSC (CRYO ARM) Electron Microscope

JEM-Z300FSC / JEM-Z200FSC Cryo-Electron Microscope

CRYO ARM™ is an electron microscope for observing biomolecules such as proteins at cryo temperature. The microscope equips a cold field-emission electron gun, an in-column Omega energy filter, a side-entry liquid nitrogen cooling stage, and an automated specimen exchange system. The specimen exchange system can store up to 12 specimens in the specimen exchange chamber.

JSM-IT200 Scanning Electron Microscope

JSM-IT200 Scanning Electron Microscope

Fast observation, analysis and report generation! JSM-IT200 is an easy-to-use scanning electron microscope focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope™, with significantly higher throughput.

Electron Microscopy, NMR & Mass Spectometry News

rss

Electron Microscopy News

Our latest blogs on (Scanning) Electron Microscopes, NMR & Mass Spectometry

Specify Alternate Text

Centurio Large Angle SDD-EDS

Centurio is a next-generation Silicon Drift Detector (SDD) EDS that collects X-rays from S/TEM samples at an unprecedented large solid angle of up to 0.98 steradians from a detection area of 100mm2.

Through efficient collection of X-rays at very high count rates, Centurio speeds elemental mapping and improves element detection sensitivity without loss of energy resolution. Large pixel number EDS maps can be made at rates ten times faster than with the previous EDS designs, with excellent signal-to-noise ratio. Combined with the large probe currents in small probe sizes attainable with aberration corrected STEM, fast, efficient atomic resolution EDS analysis is possible.

Key Features

  • High sensitivity, high throughput analysis
  • Exponentially expands the elemental mapping capability for the JEOL 200kV and higher nano-area analysis TEM.
  • The automatically retractable side entry design allows fast repositioning to avoid irradiation from back-scattered electrons.

Specifications

  • Solid angle
    - High resolution polepiece 0.98 sr
    - Ultrahigh resolution polepiece 0.8 sr
  • Detection area 100mm2
September 1, 2011 By SuperUser Account General 0 0 Comment Read More »

Archives

Tags

Benchtop SEM GCMS MS Netherlands NMR Phenom SEM tabletop SEM TEM 120kV 200kV 2nd hand 3D EBSD 3D EDS 3d EDX 3D Imaging 3view 63pm 7900F Analytical anniversary ARM ARXPS Asbestos Automation Benchtop Benchtop SEM Benelux Biology CMGG Cold FEG Compact MS Compact SEM CP Cross Section Polisher Crude oil solution Cryo CRYOARM CryoEM Cryo-EM CryoTEM Delft Depth profiling Desktop SEM DualBeam ease of use Easy to use EBSD EDS EDX Electron Ionisation Elemental Analysis FEG FEG SEM FEG-SEM FEG-TEM FEI FE-SEM FIB-SEM Field Emission GC GCMS GC-Quadrupole GC-TOF GCxGC GCxGC/MS Ghent HCN MAS High resolution Hitachi HR-MS Inauguration In-situ installation Intouchscope Intuitive Ion beam polisher Ion Milling IT100 JEOL Laborama Laboratory solutions Mass Mass spectrometry Material Characterisation Material Science Medical Micro Microscope MS Multi Beam Multi purpose Nano Neoscope Netherlands New SEM NKI NMR Phenom Photo Iionisation Resolution Scanning Electron Microscope screening SEM SEM EDS SEM EDX SEM sample preparation SEM-EDX Solids NMR Solutions SPA STEM Structural Biology Surface analysis Table top Tabletop SEM TEM Titan TOF TOFMS Transmission Electron Microscope Triple Quad TRXPS Tweedehands UHR Ultra high resolution VIB Workflow WOTS XPS Zeromag

Featured Posts

Read More »