JSM-IT500HR Scanning Electron Microscope

JSM-IT500HR Scanning Electron Microscope

The JSM-IT500HR SEM, based on the highly successful and award winning JEOL InTouchScope series, is equipped with a high-brightness electron gun and fully integrating JEOL's energy dispersive X-ray spectrometer (EDS). This revolutionizing JSM-IT500HR is a superb high throughput SEM, delivering a dramatically improved work efficiency (40% or higher than conventional models).

JEM-Z300FSC (CRYO ARM) Electron Microscope

JEM-Z300FSC / JEM-Z200FSC Cryo-Electron Microscope

CRYO ARM is an electron microscope for observing biomolecules such as proteins at cryo temperature. The microscope equips a cold field-emission electron gun, an in-column Omega energy filter, a side-entry liquid nitrogen cooling stage, and an automated specimen exchange system. The specimen exchange system can store up to 12 specimens in the specimen exchange chamber.

JSM-IT200 Scanning Electron Microscope

JSM-IT200 Scanning Electron Microscope

Fast observation, analysis and report generation! JSM-IT200 is an easy-to-use scanning electron microscope focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope, with significantly higher throughput.

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Centurio Large Angle SDD-EDS

Centurio is a next-generation Silicon Drift Detector (SDD) EDS that collects X-rays from S/TEM samples at an unprecedented large solid angle of up to 0.98 steradians from a detection area of 100mm2.

Through efficient collection of X-rays at very high count rates, Centurio speeds elemental mapping and improves element detection sensitivity without loss of energy resolution. Large pixel number EDS maps can be made at rates ten times faster than with the previous EDS designs, with excellent signal-to-noise ratio. Combined with the large probe currents in small probe sizes attainable with aberration corrected STEM, fast, efficient atomic resolution EDS analysis is possible.

Key Features

  • High sensitivity, high throughput analysis
  • Exponentially expands the elemental mapping capability for the JEOL 200kV and higher nano-area analysis TEM.
  • The automatically retractable side entry design allows fast repositioning to avoid irradiation from back-scattered electrons.

Specifications

  • Solid angle
    - High resolution polepiece 0.98 sr
    - Ultrahigh resolution polepiece 0.8 sr
  • Detection area 100mm2