JSM-IT500HR Scanning Electron Microscope

JSM-IT500HR Scanning Electron Microscope

The JSM-IT500HR SEM, based on the highly successful and award winning JEOL InTouchScope series, is equipped with a high-brightness electron gun and fully integrating JEOL's energy dispersive X-ray spectrometer (EDS). This revolutionizing JSM-IT500HR is a superb high throughput SEM, delivering a dramatically improved work efficiency (40% or higher than conventional models).

JEM-Z300FSC (CRYO ARM) Electron Microscope

JEM-Z300FSC / JEM-Z200FSC Cryo-Electron Microscope

CRYO ARM is an electron microscope for observing biomolecules such as proteins at cryo temperature. The microscope equips a cold field-emission electron gun, an in-column Omega energy filter, a side-entry liquid nitrogen cooling stage, and an automated specimen exchange system. The specimen exchange system can store up to 12 specimens in the specimen exchange chamber.

JSM-IT200 Scanning Electron Microscope

JSM-IT200 Scanning Electron Microscope

Fast observation, analysis and report generation! JSM-IT200 is an easy-to-use scanning electron microscope focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope, with significantly higher throughput.

Electron Microscopy News


Electron Microscopy News

Our latest blogs on (Scanning) Electron Microscopes

JEOL is releasing new triple quadrupole mass spectrometer

JEOL Ltd. (President Gon-emon Kurihara) announces the release of new Gas Chromatograph(GC) -  triple quadrupole mass spectrometer system, JMS-TQ4000GC on August, 2018.

JMS-TQ4000GC is a GC-triple quadrupole mass spectrometer system with both capabilities of high throughput and high sensitivity based on the unique “Short collision cell technology”. Those capabilities can improve the productivity for routine analysis such as residual pesticides analysis in agricultural materials or monitoring of trace amount of chemicals regulated by tap water quality standard and environmental criteria in each region or country.

It is expected that JMS-TQ4000GC would contribute to expand JEOL’s market share of not only GC-triple quadrupole mass spectrometer but also GC-single quadrupole mass spectrometer or GC –time-of-flight mass spectrometer.

[Main Features]

1.   Short collision cell technology enables high speed data acquisition without crosstalk

JMS-TQ4000GC can achieve the fastest SRM (Selected Reaction Monitor) switching speed in the industry at 1,000 channels/sec. Moreover, even at the fast SRM it can eliminate ion interaction among SRM channels (crosstalk) and makes it possible to analyze multi-target compounds with high accuracies.

2.   High sensitivity achieved with ion accumulation and pulsed ion ejection at short collision cell

Short collision cell has both capabilities of ion accumulation and pulsed ion ejection. Noise level of signal can be reduced as much as possible by acquire data only when an ion pulse arrives at the detector. The noise reduction leads to high sensitivity.

3.   Simple operation for data acquisition and analysis with a combination of pre-installed SRM condition file and multi-target quantitative analysis software.

The “peak dependent SRM” system automatically creates the optimized measurement condition when the target pesticides are selected from the pre-installed SRM condition files. After measurement, the multi-target quantitative analysis software “Escrime” analyzes the data and creates the analysis reports according to the report format template selected in advance. In addition, the unique functionalities of “Escrime” such as “Slide show for chromatographic peaks check” and “Across-the-board manual peak integration” make the data verification easier and faster.

[Main Specification]

Measurement modes : Scan, SIM, Scan&SIM, SRM, Product-ion scan, Neutral loss scan, Precursor-ion scan, Scan&SRM

m/z range : 4~1,022

SRM speed : 1,000 channels/sec

Gas Chromatograph JMS-TQ4000GC -  Triple Quadrupole Mass Spectrometer System - JEOL Benelux

JEOL (Europe) BV introduces: Photo Ion-Source for JMS-T200GC AccuTOF GCx

Electron ionization (EI), generally used for GC/MS and GCxGC/MS analysis, produces fragment ions. Fragments are valuable for database search and compound identification. However, fragmentation adds an additional level of complexity in interpreting complex mixtures, such as crude oil. Some compounds (e.g. alkanes, alcohols) do not produce abundant (or any) molecular ions.

Since photoionization (PI) is a softer ionization method than EI, molecular ion can be easily distinguished using this technique. For some analytes, characteristic fragment ions may also be observed. Combining soft ionization with high-resolution exact-mass data and new software tools simplifies processing of complex GC and GCxGC data (e.g. petroleum type analysis).

PI provides clear molecular ions and elemental composition that can be combined with EI data to identify unknowns and also provides selective ionization of target compounds

The JEOL PI source is designed as a PI/EI combination ion source. Switching between PI and EI can be done without breaking vacuum of the ion source, even without breaking any vacuum. Also during an analytical run it is possible to switch between PI/EI and vice versa. The accurate mass will always stay available whatever ionisation technique is used with our JMS-T200GC AccuTOF GCx.

At this moment a PI source is available for our GC-TOF and GC-Quadrupole systems.

JEOL Photo Ion-Source

JEOL (Europe) BV present at Labtechnology 2015

On the 7th and 8th of October the exhibition Labtechnology 2015 will be held at the Jaarbeurs in Utrecht. JEOL (Europe) BV will be present to promote our recent developments and new products in the field of NMR, Mass spectrometry and Electron Optics. You can find us at booth C18.

To register for this exhibition please visit https://labtechnology.nl/

Logo Exhibition Labtechnology 2015