JMS-T2000GC

JMS-T2000GC

High performance gas chromatograph time-of-flight mass spectrometer.

JEM-ARM300F2

JEM-ARM300F2

A new atomic resolution electron microscope has been released! The "GRAND ARM 2" has been upgraded. This new "GRAND ARM 2" enables observations at ultrahigh spatial resolution with highly sensitive analysis over a wide range of accelerating voltages.

JAM-5200 EBM
CRYO ARM 300 II (JEM-3300)

JEM-3300 (CRYO ARM 300 II) Cryo-Electron Microscope

CRYO ARM is an electron microscope for observing biomolecules such as proteins at cryo temperature. The microscope equips a cold field-emission electron gun, an in-column Omega energy filter, a side-entry liquid nitrogen cooling stage, and an automated specimen exchange system. The specimen exchange system can store up to 12 specimens in the specimen exchange chamber.

Electron Microscopy, NMR & Mass Spectometry News

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Electron Microscopy News

Our latest blogs on (Scanning) Electron Microscopes, NMR & Mass Spectometry

JEOL JSM-F100.jpg

JEOL introduces the JSM-F100

JSM-F100 is an easy-to-use FEG-SEM for high resolution imaging. This latest model Scanning Electron Microscope is equipped with our NEO-engine, LIVE-AI image filter and a brandnew GUI. Together this speeds up the workflow significantly.

Furthermore, the JSM-F100 comes with a JEOL energy dispersive X-ray spectrometer (EDS), which is fully integrated within "SEM Center" for seamless acquisition from images to elemental analysis results. Inspired by users in pursuing the evolution, and integration, of high performance and operability, the JSM-F100 achieves a superb work efficiency,  leading to dramatically increased high throughput capabilities.

 

For more information please visit https://www.jeol.co.jp/en/products/detail/JSM-F100.html

 

JEOL introduces the JSM-IT200

JEOL combines ease of use, high resolution and quick analysis in the latest SEM model.

With new features JEOL's new and compact scanning electron microscope JSM-IT200 enables the user to quickly and easily perform SEM analysis.

Scanning Electron Microscope JSM-IT200

  • “Zeromag" links the SEM image with Holder Graphics or optical CCD image, which enables the user to quickly locate areas for imaging and analysis.
  • Autofunctions will do the microscope adjustments.
  • Fully integrated EDS includes “live EDS Analysis”, displaying the chemical composition of the specimen while imaging.
  • Smile View™ Lab" for integrated management of image and analysis data, generates very quick reports from all data ranging from collected SEM images to elemental analysis results.
  • The small footprint and no need for water cooling or gas inlet allows easy installation of the SEM.

For more information, please visit our corporate website: https://www.jeol.co.jp/en/products/detail/JSM-IT200.html

Read more about electron microscopy on JEOL Benelux - Scanning Electron Microscopy (SEM).