JSM-IT700HR Scanning Electron Microscope

JSM-IT700HR InTouchScope™

SEM- Essential in Daily Lab Operation JSM-IT700HR Makes it Easy.

Scanning Electron Microscope

JEM-Z300FSC (CRYO ARM) Electron Microscope

JEM-Z300FSC / JEM-Z200FSC Cryo-Electron Microscope

CRYO ARM™ is an electron microscope for observing biomolecules such as proteins at cryo temperature. The microscope equips a cold field-emission electron gun, an in-column Omega energy filter, a side-entry liquid nitrogen cooling stage, and an automated specimen exchange system. The specimen exchange system can store up to 12 specimens in the specimen exchange chamber.

JSM-IT200 Scanning Electron Microscope

JSM-IT200 Scanning Electron Microscope

Fast observation, analysis and report generation! JSM-IT200 is an easy-to-use scanning electron microscope focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope™, with significantly higher throughput.

Electron Microscopy, NMR & Mass Spectometry News

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Electron Microscopy News

Our latest blogs on (Scanning) Electron Microscopes, NMR & Mass Spectometry

JEOL introduces the IB-19530CP Cross section Polisher

The IB-19530CP is equipped with a newly designed multi-purpose stage to fulfill increasingly diversified market needs and realize multi-functionality by different kinds of functional holders. Surface milling and polishing, cross-section polishing and also carbon sputtering is now possible within one instrument, using specialized functional holders.

The system is easy to set up and can be programmed for high-speed processing and finishing of high quality cross sections in a short period of time. Intermittent processing can also be programmed to enhance preparation of materials of low melting temperature and susceptible to ion beam irradiation.

 

For more details, please visit our main website: https://www.jeol.co.jp/en/products/detail/IB-19530CP.html

September 1, 2017 By Arnold Kruize Product Introduction CP, Cross Section Polisher, Ion beam polisher, Ion Milling, SEM sample preparation 0 0 Comment Read More »

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