JSM-IT500HR Scanning Electron Microscope

JSM-IT500HR Scanning Electron Microscope

The JSM-IT500HR SEM, based on the highly successful and award winning JEOL InTouchScope series, is equipped with a high-brightness electron gun and fully integrating JEOL's energy dispersive X-ray spectrometer (EDS). This revolutionizing JSM-IT500HR is a superb high throughput SEM, delivering a dramatically improved work efficiency (40% or higher than conventional models).

JEM-Z300FSC (CRYO ARM) Electron Microscope

JEM-Z300FSC / JEM-Z200FSC Cryo-Electron Microscope

CRYO ARM is an electron microscope for observing biomolecules such as proteins at cryo temperature. The microscope equips a cold field-emission electron gun, an in-column Omega energy filter, a side-entry liquid nitrogen cooling stage, and an automated specimen exchange system. The specimen exchange system can store up to 12 specimens in the specimen exchange chamber.

JSM-IT200 Scanning Electron Microscope

JSM-IT200 Scanning Electron Microscope

Fast observation, analysis and report generation! JSM-IT200 is an easy-to-use scanning electron microscope focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope, with significantly higher throughput.

Electron Microscopy News

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Electron Microscopy News

Our latest blogs on (Scanning) Electron Microscopes

New software for SEM Asbestos Analysis

Application Note: Frame Step Analyzer for Asbestos analysis.

We have released a software module for JEOL SEMs to assist the operator with asbestos analysis.

The operator can program any number of fields to be viewed, and with one press of a button the microscope can move to the next field.

Frame Step Analyzer for Asbestos Analysis (screenshot)

When an asbestos fiber has been found and identified, it can be registered in a table, which can be saved as a report.

 

Frame Step Analyzer for Asbestos Analysis (screenshot 2)

Applicable instruments: IT100, IT200, IT300 and IT500 series

For more information please contact us.

JEOL introduces the JSM-IT200

JEOL combines ease of use, high resolution and quick analysis in the latest SEM model.

With new features JEOL's new and compact scanning electron microscope JSM-IT200 enables the user to quickly and easily perform SEM analysis.

Scanning Electron Microscope JSM-IT200

  • “Zeromag" links the SEM image with Holder Graphics or optical CCD image, which enables the user to quickly locate areas for imaging and analysis.
  • Autofunctions will do the microscope adjustments.
  • Fully integrated EDS includes “live EDS Analysis”, displaying the chemical composition of the specimen while imaging.
  • Smile View™ Lab" for integrated management of image and analysis data, generates very quick reports from all data ranging from collected SEM images to elemental analysis results.
  • The small footprint and no need for water cooling or gas inlet allows easy installation of the SEM.

For more information, please visit our corporate website: https://www.jeol.co.jp/en/products/detail/JSM-IT200.html

Read more about electron microscopy on JEOL Benelux - Scanning Electron Microscopy (SEM).

Visit JEOL at WOTS 2018

WOTS 2018 will be held from October 2nd until October 5th in the Jaarbeurs Utrecht.

JEOL will be present with live SEM demonstrations on our latest model, the JSM-IT200 and we will have our latest Triple Quad Mass Spectrometer on display, the JMS-TQ4000GC.

Of course there will also be plenty of opportunity to discuss with our product specialists to discuss your application and how our instrumentation will help you find your answers. Our booth number is 07E084.