JSM-IT500HR Scanning Electron Microscope

JSM-IT500HR Scanning Electron Microscope

The JSM-IT500HR SEM, based on the highly successful and award winning JEOL InTouchScope series, is equipped with a high-brightness electron gun and fully integrating JEOL's energy dispersive X-ray spectrometer (EDS). This revolutionizing JSM-IT500HR is a superb high throughput SEM, delivering a dramatically improved work efficiency (40% or higher than conventional models).

JEM-Z300FSC (CRYO ARM) Electron Microscope

JEM-Z300FSC / JEM-Z200FSC Cryo-Electron Microscope

CRYO ARM is an electron microscope for observing biomolecules such as proteins at cryo temperature. The microscope equips a cold field-emission electron gun, an in-column Omega energy filter, a side-entry liquid nitrogen cooling stage, and an automated specimen exchange system. The specimen exchange system can store up to 12 specimens in the specimen exchange chamber.

JSM-IT200 Scanning Electron Microscope

JSM-IT200 Scanning Electron Microscope

Fast observation, analysis and report generation! JSM-IT200 is an easy-to-use scanning electron microscope focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope, with significantly higher throughput.

Electron Microscopy News

Electron Microscopy News

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Arnold Kruize
Arnold Kruize
Arnold Kruize's Blog

Inauguration of the JEM-ARM200F in Leuven

You are kindly invited to the Res Metallica symposium “Advanced Electron Microscopy and Spectroscopy for Deep Insight of Materials” on Wednesday May 9, 2018 at 13:00 in the "Aula van de Tweede Hoofdwet", Kasteelpark Arenberg 41, 3001 Leuven. The symposium is organised by the Department of Materials Engineering, KU Leuven and sponsored by JEOL and by FWO Science Research Network (WOG).

Recent advancements in electron microscope instrumentation have provided new possibilities for high resolution characterization of materials. Especially, the successful implementation of aberration-correction in a (scanning) transmission electron microscope (S)TEM has yielded possibilities far beyond the lateral resolution. In this symposium, two experts in this field will present the benefits of these advances with reference to several materials systems for gaining deeper understanding of materials properties. Two additional speakers, from university and from an industrial research environment, will highlight the role of (S)TEM for their research.

This symposium will be combined with the inauguration of the JEOL ARM200F STEM installed at the Corelab “Leuven NanoCentre”. The ARM200F was acquired via a Hercules Foundation project led by a consortium of KU Leuven (Materials Engineering, Physics, Centre for Surface Chemistry and Catalysis, Dental Materials) and supported by the group Science, Engineering and Technology of KU Leuven and JEOL. The ARM200F is an atomic resolution analytical electron microscope, with a STEM Cs corrector and cold field emission gun providing a STEM-HAADF resolution of 78 pm and full analytical capabilities using EDX and EELS.

 

To register, please visit: https://www.mtm.kuleuven.be/Events/ResMetallica/res-metallica-2018



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