JSM-IT500HR Scanning Electron Microscope

JSM-IT500HR Scanning Electron Microscope

The JSM-IT500HR SEM, based on the highly successful and award winning JEOL InTouchScope series, is equipped with a high-brightness electron gun and fully integrating JEOL's energy dispersive X-ray spectrometer (EDS). This revolutionizing JSM-IT500HR is a superb high throughput SEM, delivering a dramatically improved work efficiency (40% or higher than conventional models).

JEM-Z300FSC (CRYO ARM) Electron Microscope

JEM-Z300FSC / JEM-Z200FSC Cryo-Electron Microscope

CRYO ARM is an electron microscope for observing biomolecules such as proteins at cryo temperature. The microscope equips a cold field-emission electron gun, an in-column Omega energy filter, a side-entry liquid nitrogen cooling stage, and an automated specimen exchange system. The specimen exchange system can store up to 12 specimens in the specimen exchange chamber.

JSM-IT200 Scanning Electron Microscope

JSM-IT200 Scanning Electron Microscope

Fast observation, analysis and report generation! JSM-IT200 is an easy-to-use scanning electron microscope focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope, with significantly higher throughput.

Electron Microscopy News

Electron Microscopy News

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Arnold Kruize
Arnold Kruize
Arnold Kruize's Blog

JEOL present at the 42nd ISCC & 15th GCxGC Symposium from May 13-18

JEOL will be present at the 42nd International Conference Symposium on Capillary Chromatography (ISCC) jointly organized with the 15th GCxGC Symposium, which will be held this year in Riva del Garda, Italy from May 13th-18th.

We will have a booth displaying our latest developments, which will be presented in detail during a seminar.

The last conference in 2016 was very successful with 830 participants, from all around the world, and with 41 exhibitors.

This year particular emphasis will be directed to all Comprehensive Separation Technologies and MS Hyphenation and to capillary chromatography and 2D GC with various forms of MS from unit-mass to high resolution, and from single to hybrid analyzers.

 

For more information, please visit the conference website



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