JSM-IT500HR

JSM-IT500HR

The JSM-IT500HR, based on the highly successful and award winning JEOL InTouchScope series, is equipped with a high-brightness electron gun and fully integrating JEOL's energy dispersive X-ray spectrometer (EDS). This revolutionizing JSM-IT500HR is a superb high throughput SEM, delivering a dramatically improved work efficiency (40% or higher than conventional models).

JEM-Z300FSC / JEM-Z200FSC

JEM-Z300FSC / JEM-Z200FSC

CRYO ARM is an electron microscope for observing biomolecules such as proteins at cryo temperature. The microscope equips a cold field-emission electron gun, an in-column Omega energy filter, a side-entry liquid nitrogen cooling stage, and an automated specimen exchange system. The specimen exchange system can store up to 12 specimens in the specimen exchange chamber.

JSM-IT200

JSM-IT200

Fast observation, analysis and report generation! JSM-IT200 is an easy-to-use SEM focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope, with significantly higher throughput.

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JEOL (Europe) BV News

latest news and events

New software for SEM Asbestos Analysis

Application Note: Frame Step Analyzer for Asbestos analysis.

We have released a software module for JEOL SEMs to assist the operator with asbestos analysis.

The operator can program any number of fields to be viewed, and with 1 press of a button the microscope can move to the next field.

When an asbestos fiber has been found and identified, it can be registered in a table, which can be saved as a report.

 

Applicable instruments: IT100, IT200, IT300 and IT500 series

For more information please contact us.

JEOL introduces the JSM-IT200

JEOL combines ease of use, high resolution and quick analysis in the latest SEM model.

With new features the new and compact JEOL JSM-IT200 enables the user to quickly and easily perform SEM analysis.

- “Zeromag" links the SEM image with Holder Graphics or optical CCD image, which enables the user to quickly locate areas for imaging and analysis.

- Autofunctions will do the microscope adjustments.

- Fully integrated EDS includes “live EDS Analysis”, displaying the chemical composition of the specimen while imaging.

- "Smile View™ Lab" for integrated management of image and analysis data, generates very quick reports from all data ranging from collected SEM images to elemental analysis results.

The small footprint and no need for water cooling or gas inlet allows easy installation of the SEM.

For more information, please visit our corporate website: https://www.jeol.co.jp/en/products/detail/JSM-IT200.html

JEOL expands its lineup of gas chromatograph mass spectrometry with releasing new triple quadrupole mass spectrometer

JEOL Ltd. (President Gon-emon Kurihara) announces the release of new Gas Chromatograph(GC) -  triple quadrupole mass spectrometer system, JMS-TQ4000GC on August, 2018.

JMS-TQ4000GC is a GC-triple quadrupole mass spectrometer system with both capabilities of high throughput and high sensitivity based on the unique “Short collision cell technology”. Those capabilities can improve the productivity for routine analysis such as residual pesticides analysis in agricultural materials or monitoring of trace amount of chemicals regulated by tap water quality standard and environmental criteria in each region or country.

It is expected that JMS-TQ4000GC would contribute to expand JEOL’s market share of not only GC-triple quadrupole mass spectrometer but also GC-single quadrupole mass spectrometer or GC –time-of-flight mass spectrometer.

 

[Main Features]

1.   Short collision cell technology enables high speed data acquisition without crosstalk

JMS-TQ4000GC can achieve the fastest SRM (Selected Reaction Monitor) switching speed in the industry at 1,000 channels/sec. Moreover, even at the fast SRM it can eliminate ion interaction among SRM channels (crosstalk) and makes it possible to analyze multi-target compounds with high accuracies.

2.   High sensitivity achieved with ion accumulation and pulsed ion ejection at short collision cell

Short collision cell has both capabilities of ion accumulation and pulsed ion ejection. Noise level of signal can be reduced as much as possible by acquire data only when an ion pulse arrives at the detector. The noise reduction leads to high sensitivity.

3.   Simple operation for data acquisition and analysis with a combination of pre-installed SRM condition file and multi-target quantitative analysis software.

The “peak dependent SRM” system automatically creates the optimized measurement condition when the target pesticides are selected from the pre-installed SRM condition files. After measurement, the multi-target quantitative analysis software “Escrime” analyzes the data and creates the analysis reports according to the report format template selected in advance. In addition, the unique functionalities of “Escrime” such as “Slide show for chromatographic peaks check” and “Across-the-board manual peak integration” make the data verification easier and faster.

 

[Main Specification]

Measurement modes : Scan, SIM, Scan&SIM, SRM, Product-ion scan, Neutral loss scan, Precursor-ion scan, Scan&SRM

m/z range : 4~1,022

SRM speed : 1,000 channels/sec

JEOL Introduces the JSM-IT500HR

The JSM-IT500HR, the Field Emission version of the JSM-IT500, has been released. With this model all existing features of the IT500 are now incorporated into a High Resolution platform, enabling seemless operation from an optical image to a high resolution image.

For application examples and to see how the features work, please visit our corporate website:

https://www.jeol.co.jp/en/products/special_edition/2017/special01.html

JEOL introduces the IB-19530CP Cross section Polisher

The IB-19530CP is equipped with a newly designed multi-purpose stage to fulfill increasingly diversified market needs and realize multi-functionality by different kinds of functional holders. Surface milling and polishing, cross-section polishing and also carbon sputtering is now possible within one instrument, using specialized functional holders.

The system is easy to set up and can be programmed for high-speed processing and finishing of high quality cross sections in a short period of time. Intermittent processing can also be programmed to enhance preparation of materials of low melting temperature and susceptible to ion beam irradiation.

 

For more details, please visit our main website: https://www.jeol.co.jp/en/products/detail/IB-19530CP.html

JEOL introduces the JSM-IT500

JEOL's latest addition to the InTouchscope series is the JSM-IT500, a new model that incorporates new features that further increase ease of use and create a higher throughput for SEM analysis.

Key point 1 : Zeromag
The displayed Holder Graphics or CCD image enables you to locate the specimen area or specify analysis positions. You can rapidly search the specimen area and specify positions for multiple-field serial analysis.


Key point 2 : Live Analysis (Only for A/LA)
With "Live Analysis", the embedded EDS system shows a real time EDS spectrum during image observation. Elemental composition or "Alert" for element of interest is displayed on a live image.


Key point 3 : Integrated data management software
This user-friendly software enables you to select and review SEM images and analysis results through the data management area. You can also generate a report with a single click.

Please take a look at the video to see how the new features work: https://youtu.be/Kad1BzLWT5E

 

 

 

Release of the JSM-7900 UHR FEG-SEM

JSM-7900F is JEOL’s new flagship FE-SEM which combines ultimate high resolution imaging, enhanced stability and exceptional ease of use for any level of operator in multi-user environment.

Newly developed functionality that integrates lens control system and automatic technology, "Neo Engine" (New Electron Optical Engine) is a standard feature, allowing for fast and easy image acquisition at any accelerating voltage and probe current.
The system is the premier example of the JEOL’s advanced electron optics technology.

For more details visit our corporate website: https://www.jeol.co.jp/en/products/detail/JSM-7900F.html

Release of the JIB-4700F Multi Beam System

The JIB-4700F features a hybrid conical objective lens, GENTLEBEAM™ (GB) mode and an in-lens detector system to deliver a guaranteed resolution of 1.6nm at a low accelerating voltage of 1 kV. Using an "in-lens Schottky-emission electron gun" that produces an electron beam with a maximum probe-current of 300nA, this newly-developed instrument allows for high-resolution observations and fast analyses. For the FIB column, a high-current density Ga ion beam of up to 90nA maximum probe-current is employed for fast ion milling and processing of specimens.


Concurrent with high-speed cross-section processing by FIB, high-resolution SEM observations and fast analyses can be conducted utilizing energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD). Additionally, a three-dimensional analysis function that automatically captures SEM images at certain intervals in cross-section processing is provided as one of the JIB-4700F's standard features. 


For more details visit our corporate website: http://www.jeol.co.jp/en/products/detail/JIB-4700F.html

JEOL releases the JSM-IT300HR

The JSM-IT300HR is the latest model in the InTouchscope Series. The succesful series has been expanded with a model that comes standard with a Field Emission Gun and Low Vacuum capabilities, based on the JSM-IT300 Tungsten SEM.

This versatile and powerful microscope allows for very easy and very fast imaging at high magnifications, so that even novice users can quickly enjoy the benefits of a Field Emission Gun. 

Main features:

  1. New high-brightness electron gun and optical system provide high resolution imaging and high spatial-resolution analysis.
  2. Intuitive operation is enabled by Touch panel functions, Automatic functions and Recipe functions.
  3. Easy-to-use software interface (GUI) includes full integration of image observation and element analysis, allowing even novice users to perform any task with high efficiency.
  4. Large specimen stage which accommodates various sizes and types of specimens for extended observation and analysis.
  5. Small footprint equivalent to the conventional general-purpose SEM.

More detailed information and example images can be found on our corporate website: http://www.jeol.co.jp/en/products/detail/JSM-IT300HR.html