JSM-IT500HR

JSM-IT500HR

The JSM-IT500HR, based on the highly successful and award winning JEOL InTouchScope series, is equipped with a high-brightness electron gun and fully integrating JEOL's energy dispersive X-ray spectrometer (EDS). This revolutionizing JSM-IT500HR is a superb high throughput SEM, delivering a dramatically improved work efficiency (40% or higher than conventional models).

JEM-Z300FSC / JEM-Z200FSC

JEM-Z300FSC / JEM-Z200FSC

CRYO ARM is an electron microscope for observing biomolecules such as proteins at cryo temperature. The microscope equips a cold field-emission electron gun, an in-column Omega energy filter, a side-entry liquid nitrogen cooling stage, and an automated specimen exchange system. The specimen exchange system can store up to 12 specimens in the specimen exchange chamber.

JSM-IT200

JSM-IT200

Fast observation, analysis and report generation! JSM-IT200 is an easy-to-use SEM focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope, with significantly higher throughput.

JEOL (Europe) BV News

latest news and events


Arnold Kruize
Arnold Kruize
Arnold Kruize's Blog

JEOL introduces the IB-19530CP Cross section Polisher

The IB-19530CP is equipped with a newly designed multi-purpose stage to fulfill increasingly diversified market needs and realize multi-functionality by different kinds of functional holders. Surface milling and polishing, cross-section polishing and also carbon sputtering is now possible within one instrument, using specialized functional holders.

The system is easy to set up and can be programmed for high-speed processing and finishing of high quality cross sections in a short period of time. Intermittent processing can also be programmed to enhance preparation of materials of low melting temperature and susceptible to ion beam irradiation.

 

For more details, please visit our main website: https://www.jeol.co.jp/en/products/detail/IB-19530CP.html



Comments are closed.