JSM-IT500HR Scanning Electron Microscope

JSM-IT500HR Scanning Electron Microscope

The JSM-IT500HR SEM, based on the highly successful and award winning JEOL InTouchScope series, is equipped with a high-brightness electron gun and fully integrating JEOL's energy dispersive X-ray spectrometer (EDS). This revolutionizing JSM-IT500HR is a superb high throughput SEM, delivering a dramatically improved work efficiency (40% or higher than conventional models).

JEM-Z300FSC (CRYO ARM) Electron Microscope

JEM-Z300FSC / JEM-Z200FSC Cryo-Electron Microscope

CRYO ARM is an electron microscope for observing biomolecules such as proteins at cryo temperature. The microscope equips a cold field-emission electron gun, an in-column Omega energy filter, a side-entry liquid nitrogen cooling stage, and an automated specimen exchange system. The specimen exchange system can store up to 12 specimens in the specimen exchange chamber.

JSM-IT200 Scanning Electron Microscope

JSM-IT200 Scanning Electron Microscope

Fast observation, analysis and report generation! JSM-IT200 is an easy-to-use scanning electron microscope focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope, with significantly higher throughput.

Electron Microscopy, NMR & Mass Spectometry News

Electron Microscopy News

Our latest blogs on (Scanning) Electron Microscopes, NMR & Mass Spectometry


Arnold Kruize
Arnold Kruize
Arnold Kruize's Blog
JCM-7000 New.jpg

JEOL released the JCM-7000 Benchtop SEM

The JCM-7000 Benchtop Scanning Electron Microscope is designed based on a key concept of "Easy-to-use SEM with seamless navigation and live analysis". When you place the JCM-7000 next to an optical microscope, further-faster and more-detailed foreign material analysis and quality control can be made.

Main Features:

With our "Zeromag" function, sample navigation is even easier than ever before. "Zeromag" which links the CCD image with color information with the SEM image on surface details, enables you to quickly locate areas for imaging and analysis.

With the aid of a 2-axis (X, Y) motorized stage, work efficiency is enhanced and montage images can easily be collected for a large specimen area.

With our Analytical series ("Live Analysis" function), the embedded EDS system shows a real time EDS spectrum during image observation for quick and efficient elemental analysis.

A new "Live 3D" function enables simultaneous observation of a live SEM image and a reconstructed live 3D surface image, together with acquisition of topographic and depth information.

 

For more information please visit https://www.jeol.co.jp/en/products/detail/JCM-7000.html



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