JMS-T2000GC

JMS-T2000GC

High performance gas chromatograph time-of-flight mass spectrometer.

JEM-ARM300F2

JEM-ARM300F2

A new atomic resolution electron microscope has been released! The "GRAND ARM 2" has been upgraded. This new "GRAND ARM 2" enables observations at ultrahigh spatial resolution with highly sensitive analysis over a wide range of accelerating voltages.

JAM-5200 EBM
CRYO ARM 300 II (JEM-3300)

JEM-3300 (CRYO ARM 300 II) Cryo-Electron Microscope

CRYO ARM™ is an electron microscope for observing biomolecules such as proteins at cryo temperature. The microscope equips a cold field-emission electron gun, an in-column Omega energy filter, a side-entry liquid nitrogen cooling stage, and an automated specimen exchange system. The specimen exchange system can store up to 12 specimens in the specimen exchange chamber.

Electron Microscopy, NMR & Mass Spectometry News

Electron Microscopy News

Our latest blogs on (Scanning) Electron Microscopes, NMR & Mass Spectometry


Arnold Kruize
Arnold Kruize
Arnold Kruize's Blog
15 February

Release of the JEM-F200, a multi purpose TEM

February 15, 2016 By Arnold Kruize General 3d EDX, Cold FEG, Ease of use, EDX, FEG-TEM, In-situ, JEOL, TEM, Transmission Electron Microscope 0

JEOL's latest addition to its suite of Transmission Electron Microscopes is the versatile JEM-F200, also nicknamed "F2", the only advanced analytical, high throughput 200kV S/TEM in its class to offer a Cold Field Emission Gun and dual Silicon Drift Detectors.

The combined boost in probe current from the Cold FEG with the dual EDS makes this TEM stand out in its class.The 'F2' employs the newest in JEOL innovations in an easy-to-use, extremely stable, high resolution imaging and analytical TEM.

The F2 incorporates many new features: 

  • Smart- design, with a new intuitive user interface
  • Quad-lens condenser system,  the new 4-stageprobe-forming optical system, Quad-Lens condenser system, controls the electron beam intensity and the convergence angle independently to respond to different research requirements.
  • Advanced Scan system,which is capable of scanning the electron beam in the image forming system (optional) , in addition to the standard scanning system for the probe-forming system. This accomplishes wide field STEM-EELS.
  • Pico Stage Drive, which is capable of driving the stage in pico meter steps without a piezo drive, and moving the area of view in a wide dynamic range from an entire sample grid to atomic order images.
  • Specporter, an auto holder loading/unloading device.
  • Improved coldFEG, Guaranteeing high stability, high brightness, and high energy resolution, the cold field emission electron gun enables chemical bonding analysis by EELS, speeds up the analytical process by the high brightness electron beam, and minimizes chromatic aberrations from the electron source for enabling high resolution imaging.
  • Dual SDD, for very fast EDS analysis and minimal sample damage.
  • Environmental friendly, the instrument can be switched to ECO mode when not in use, to reduce its energy consumption.

Main specification: TEM point to point: 0.19 nm STEM-HAADF: 0.14 nm (using Cold FEG and UHR polepiece)

JEM-F200-F2 Transmission Electron Microscope (TEM)

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