JSM-IT500HR Scanning Electron Microscope

JSM-IT500HR Scanning Electron Microscope

The JSM-IT500HR SEM, based on the highly successful and award winning JEOL InTouchScope series, is equipped with a high-brightness electron gun and fully integrating JEOL's energy dispersive X-ray spectrometer (EDS). This revolutionizing JSM-IT500HR is a superb high throughput SEM, delivering a dramatically improved work efficiency (40% or higher than conventional models).

JEM-Z300FSC (CRYO ARM) Electron Microscope

JEM-Z300FSC / JEM-Z200FSC Cryo-Electron Microscope

CRYO ARM is an electron microscope for observing biomolecules such as proteins at cryo temperature. The microscope equips a cold field-emission electron gun, an in-column Omega energy filter, a side-entry liquid nitrogen cooling stage, and an automated specimen exchange system. The specimen exchange system can store up to 12 specimens in the specimen exchange chamber.

JSM-IT200 Scanning Electron Microscope

JSM-IT200 Scanning Electron Microscope

Fast observation, analysis and report generation! JSM-IT200 is an easy-to-use scanning electron microscope focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope, with significantly higher throughput.

Electron Microscopy News

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Electron Microscopy News

Our latest blogs on (Scanning) Electron Microscopes

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JEOL Periodic Table app

JEOL USA has developed an app to assist researchers with EDS, NMR and MS research. Using the JEOL Periodic Table app you have quick and easy access to the spectral data of all known elements while doing EDS in electron microscopy, nuclear magnetic resonance or mass spectrometry.

The app is available in the apple appstore: https://itunes.apple.com/us/app/jeol-usa-periodic-table/id1459184462?ls=1&mt=8

 

 

JEOL NMR in high demand

The New JNM-ECZ High field NMR series is booming. Recent installations of 400 MHz, 500 MHz and 600 MHz for liquid experiments, but also for solids is proving the excellent performance of these systems. With old magnets and new probes making it possible to do 3 channel experiments on a two channel spectrometer JEOL is showing the way to modern NMR systems at lower cost of ownership.

Improvement of our application center in UK together with the any installations, we now can demonstrate the wide range of system configurations.

Are you interested in knowing more, just complete the “request product info” on our website.

 

                                                                                        NMR Spectrometer - JEOL Benelux

Inauguration of the JEM-1400Plus in Ghent on 24th March 2016

24th March 2016 knew the festive inauguration of the JEM-1400Plus, JEOL’s 120 kV TEM, in Ghent. The 1400Plus is JEOL’s latest generation 120 kV TEM. This system is extremely user-friendly and has integrated solutions for tomography as well as for large area imaging. The investment is a joint effort of 4 research centers of VIB (Flemish Institute for Biotechnology) and 1 research center of Ghent University:

·         Inflammation Research Center (VIB-IRC)

·         Plant Systems Biology (VIB-PSB)

·         Medical Biotechnology Center (VIB-MBC)

·         VIB Core facilities

·         Center for Medical Genetics Ghent University (CMGG)

In her welcome speech Prof. Anne de Paepe, Rector of Ghent University and Director of CMGG, emphasized the importance of collaboration for the acquisition and exploitation of large equipment.

The official “cutting of the ribbon” was followed by a demonstration of the 1400Plus and a reception with a variety of drinks and delicious snacks for the more than 100 participants.

  

Pictures:

TOP The official “cutting of the ribbon” by Prof. Anne De Paepe, assisted by mrs. Riet De Rycke and mr. Michiel De Bruyne, transmission electron microscopists at the VIB-UGent TEM Core Facility.

BOTTOM Mrs Riet De Rycke (far right) demonstrates the 1400Plus to (starting first row and from left to right): Prof. Nico Callewaert, Director MBC; Prof. Dirk Inzé, Director PSB; Dr. Jo Bury, Managing Director VIB, Prof. Bart Lambrecht, Director IRC; Prof. Anne De Paepe, Rector and Director CMGG.

JEOL (Europe) BV introduces: Photo Ion-Source for JMS-T200GC AccuTOF GCx

Electron ionization (EI), generally used for GC/MS and GCxGC/MS analysis, produces fragment ions. Fragments are valuable for database search and compound identification. However, fragmentation adds an additional level of complexity in interpreting complex mixtures, such as crude oil. Some compounds (e.g. alkanes, alcohols) do not produce abundant (or any) molecular ions.

Since photoionization (PI) is a softer ionization method than EI, molecular ion can be easily distinguished using this technique. For some analytes, characteristic fragment ions may also be observed. Combining soft ionization with high-resolution exact-mass data and new software tools simplifies processing of complex GC and GCxGC data (e.g. petroleum type analysis).

PI provides clear molecular ions and elemental composition that can be combined with EI data to identify unknowns and also provides selective ionization of target compounds

The JEOL PI source is designed as a PI/EI combination ion source. Switching between PI and EI can be done without breaking vacuum of the ion source, even without breaking any vacuum. Also during an analytical run it is possible to switch between PI/EI and vice versa. The accurate mass will always stay available whatever ionisation technique is used with our JMS-T200GC AccuTOF GCx.

At this moment a PI source is available for our GC-TOF and GC-Quadrupole systems.

JEOL Photo Ion-Source

Release of the JEM-F200, a multi purpose TEM

JEOL's latest addition to its suite of Transmission Electron Microscopes is the versatile JEM-F200, also nicknamed "F2", the only advanced analytical, high throughput 200kV S/TEM in its class to offer a Cold Field Emission Gun and dual Silicon Drift Detectors.

The combined boost in probe current from the Cold FEG with the dual EDS makes this TEM stand out in its class.The 'F2' employs the newest in JEOL innovations in an easy-to-use, extremely stable, high resolution imaging and analytical TEM.

The F2 incorporates many new features: 

  • Smart- design, with a new intuitive user interface
  • Quad-lens condenser system,  the new 4-stageprobe-forming optical system, Quad-Lens condenser system, controls the electron beam intensity and the convergence angle independently to respond to different research requirements.
  • Advanced Scan system,which is capable of scanning the electron beam in the image forming system (optional) , in addition to the standard scanning system for the probe-forming system. This accomplishes wide field STEM-EELS.
  • Pico Stage Drive, which is capable of driving the stage in pico meter steps without a piezo drive, and moving the area of view in a wide dynamic range from an entire sample grid to atomic order images.
  • Specporter, an auto holder loading/unloading device.
  • Improved coldFEG, Guaranteeing high stability, high brightness, and high energy resolution, the cold field emission electron gun enables chemical bonding analysis by EELS, speeds up the analytical process by the high brightness electron beam, and minimizes chromatic aberrations from the electron source for enabling high resolution imaging.
  • Dual SDD, for very fast EDS analysis and minimal sample damage.
  • Environmental friendly, the instrument can be switched to ECO mode when not in use, to reduce its energy consumption.

Main specification: TEM point to point: 0.19 nm STEM-HAADF: 0.14 nm (using Cold FEG and UHR polepiece)

JEM-F200-F2 Transmission Electron Microscope (TEM)

Release of a new Field-Emission Scanning Electron Microscope: The JSM-7200F

JEOL has released the  JSM-7200F, a multi-purpose FE-SEM combining high-resolution and easy operation.

Scanning electron microscopes have been used in a wide range of fields and for diverse applications. The JSM-7200F utilizes JEOL proprietary in-lens Schottky Plus technology that allows improvement in the resolution at low accelerating voltages (1.6 nm @ 1 kV), and achieves a maximum probe current of 300 nA. The JSM-7200F is a multi-purpose FE-SEM that can satisfy a wide range of needs with both higher resolution and easier operation than conventional instruments.The features include:

  1. High resolution of 1.6 nm at 1 kV, 1.2nm at 30kV.
  2. High-speed analysis: maximum probe current of 300 nA, allowing short acquisition time for EDS, WDS, and EBSD, while maintaining high resolution.
  3. Energy signal differentiation: incorporation of the TTL (through-the-lens) system in the standard configuration enables the use of energy filtering to selectively differentiate the electron energies.
  4. Wide area analysis: the LDF (long depth of field) mode enables applications like wide-area EBSD analysis, without the need to use stage scan (montage).

New Versatile Compact SEM from JEOL

 

JEOL has released the JSM-IT100, the successor of the very popular and succesful InTouchscope JSM-6010 series. The JSM-IT100 is a simple-to-use versatile, research-grade SEM with a compact ergonomic design.

The JSM-IT100 is very easy to use, due to the very intuitive user interface and has a formidable price-performance ratio. This compact SEM is a versatile workhorse SEM that can be configured to meet individual lab requirements. It offers high resolution imaging, and offers a range of acceleration voltages at both high and low vacuum modes.

With the JSM-IT100, it is simple to quickly obtain high quality images using both Secondary Electron and Backscatter Imaging. The embedded JEOL EDS system with silicon drift detector technology now includes Spectral Mapping, Multi-Point Analysis, Automatic Drift Compensation, Partial area, Line Scan, and Mapping Filter functions.

JEOL's popular InTouchScope series includes the NeoScope benchtop SEM with selectable HV/LV and the JSM-IT300LV with advanced analytical capabilities and imaging of large, intact samples.

 

New TEM for Naturalis

The Naturalis Biodiversity Center, a research institute and natural history museum in Leiden, has recently acquired the state-of-the-art JEM-1400Plus Transmission Electron Microscope (TEM) from JEOL.

 “Thanks to this TEM we are able to study the biodiversity of plants and species in the smallest details.” According to Kees van den Berg, Senior Analyst at Naturalis. “For the acquisition of the new 120kV TEM the JEM-1400Plus from JEOL was selected because of its performance, ease-of-use and proven stability of the system. The excellent service track record of JEOL also played an important role in the evaluation."

"We used to have a JEOL JEM-1010 from 1992. Even though it was still working well, it no longer fit in our new organization structure where digitalization of our collection and data has become a priority. Additionally, the new TEM is also fully compatible with our Windows 7 based network. The JEM-1010 will go to a new owner who will certainly  benefit from the microscope for years to come."

Since the introduction of the JEM-1400 in 2007 and the JEM-1400Plus in 2012, already more than 600 microscopes of this type have been installed worldwide. The strength of this system lies in the flexibility of the system to be able to work in a great variety of research fields, for example: Biological sections, polymers, nanomaterials and asbestos analysis, all in both room temperature and under cryo conditions. 




JEM-ARM300F: The Ultimate Atomic Resolution Transmission Electron Microscope

Transmission electron microscopy (TEM) has long been a tool essential for micro structure evaluation in the field of materials development.
However, as the fine structures of advanced materials are being designed at the nano level or atomic level, the synthetic process for such materials increasingly requires imaging and analysis at higher resolution.

To meet this demand, JEOL has focused on development of a transmission electron microscope incorporating spherical aberration correctors to exceed the current resolution boundary.
In 2009, JEOL announced the JEM-ARM200F, a 200 kV atomic resolution analytical transmission electron microscope featuring spherical aberration correctors, which achieved a resolution of 80 pm (scanning transmission (STEM) image) as the first ever commercial electron microscope.  To achieve the atomic level resolution, the JEM-ARM200F incorporates various capabilities to ensure highly stable operation.  With over 100 units of the ARM200F currently in operation worldwide, many researchers have become familiar with atomic level imaging and analysis.

JEM-ARM300F
Meanwhile, as aberration correctors are widely used, various new requirements for transmission electron microscopy are emerging, in addition to higher resolution, including higher analytical sensitivity, in-situ imaging, flexible accelerating voltage control, and ease of operation for aberration correction.

Thus, JEOL developed the JEM-ARM300F, a 300 kV atomic resolution transmission electron microscope featuring JEOL's own aberration correctors as an enhanced model of the JEM-ARM200F.
Nicknamed GRAND ARM, the JEM-ARM300F, incorporates JEOL's propriety dodecapole correctors, successfully increasing the resolution level to 63 pm (STEM resolution).
The GRAND ARM can be configured for ultra high resolution imaging or analytical applications for high sensitivity and in-situ analysis according to the user's needs.


The system is primarily intended for public and private research institutes and semiconductor manufacturers.

Main Features

  1. Ultra high resolution imaging
    Achieves a resolution of 63 pm in the scanning transmission electron microscope image (STEM) mode at an accelerating voltage of 300 kV, using JEOL's own spherical aberration corrector for the illumination system.
  2. High performance cold-cathode field-emission electron gun featuring high brightness and low energy dispersion
    Incorporates a new high performance cold cathode electron gun as standard; the high brightness beam with minimum chromatic aberration allows for high resolution imaging and analysis.
  3. Wide accelerating voltage range
    Supports accelerating voltage levels of 300 kV and 80 kV as standard; other accelerating voltage levels are optionally available as needed.
  4. Aberration corrector integrated with microscope base unit
    Incorporates JEOL's proprietary spherical aberration correctors in the image forming system (TEM aberration corrector) and in the illumination system (STEM spherical aberration corrector).
  5. Aberration corrector control system
    Uses the JEOL COSMO (JEOL Corrector System Module) system for auto control of the aberration correctors.
  6. Two types of objective lens pole piece
    Two types of objective lens polepiece are available to meet a wide range of users' applications.
  7. Vacuum system featuring dry pre-evacuation and high vacuum
    The vacuum system features a pre-evacuation system incorporating a turbo molecular pump as standard and an enhanced column evacuation system, achieving higher vacuum while minimizing contamination and damage in atomic level imaging and analysis.
  8. Stable column/console, specimen stage, and electrical system
    The column, 330 mm in diameter, features a higher level of mechanical rigidity.  The microscope base unit is also designed to enhance its mechanical/electrical stability and resistance to environment, fully utilizing the stabilizing technologies developed for the JEM-ARM200F.
  9. A complete line of signal detectors
    A complete line of signal detectors are available, including EDS (energy dispersive X-ray spectrometer) up to 100 mm2and EELS (electron energy loss spectrometer), backscattered electron detectors, and up to 4 STEM detectors.  The microscope also supports simultaneous observation of high angle annular dark field image, low angle annular dark field image, annular bright field image, and bright field image.

Main Specifications

Accelerating voltage Maximum 300 kV
TEM lattice resolution 0.05 nm(with spherical aberration corrector for image forming system)
STEM resolution 0.063 nm(spherical aberration corrector for illumination system)