Electron Microscopy, NMR & Mass Spectometry News

JPS-9030: The XPS for high-speed, high-precision depth profiling

In recent years, there has been a growing demand to perform high quality surface analysis quickly, easily and reproducibly on any kind of sample for any level user. The JPS-9030 is equipped with a newly-designed user interface that further improves operability and also debuts a sophisticated, new modern and sleek exterior design.

Main Features

1. Depth profiling optimized for the application
   The newly-developed Kaufman-type etching ion source provides etching rates from 1 nm/min to 100 nm/min (SiO2equivalent), and allows a wide range of settings. It is capable of depth profiles suitable for any application, from measurements demanding precision to processes that require speed. The mounting of the Kaufman-type etching ion source to the specimen exchange chamber facilitates prevention of  contamination of the measurement chamber.
2. Newly-developed software provides even greater ease-of-use
   SpecSurf Ver. 2.0 now incorporates a ribbon-style GUI, offering a user-friendly environment in which all operations can be performed with the mouse. With JEOL’s own automatic qualitative analysis function, it is possible to sequentially perform qualitative, quantitative and chemical state analyses for multiple acquisition points.
3. Ultra-high surface sensitivity
   The JPS-9030 supports techniques like Angle-Resolved XPS (ARXPS) and Total Reflection XPS (TRXPS), and is capable ultra-high sensitive analysis of the top surfaces of 1 nm (standard measurement method 6 nm or more).
4. A wealth of options
   • Monochromatic X-ray sources
   • Argon gas cluster ion source suitable for organic samples
   • Infra-red heating system capable of temperatures of 1,000°C or higher
   • Transfer vessel to protect specimens from exposure to the atmosphere

Main Specifications

JEM-2100Plus: A new 200kV Transmission Electron Microscope

The JEM-2100Plus is a multi purpose transmission electron microscope for micro structure evaluation, which combines the proven JEM-2100 optic system with an advanced control system for enhanced ease of operation. Achieving superior performance through very user friendly intuitive operation, the JEM-2100Plus provides solutions to a wide range of applications from materials science to medical/biological studies.

Main Features

Designed to ease of operation

1. 64 bit Windows® compatible control software, TEM Center, is an intuitive user interface designed to maximize ease of operation.
2. A complete range of automated functions
   The JEM-2100Plus comes with a complete range of automated functions, including auto focus, auto contrast/brightness, auto exposure, auto montage, drift compensation, and stage navigation.
3. Advanced integration
   The TEM Center allows the user to control optional accessories such as high resolution camera and scanning image (BF/DF) observation device through intuitive user-system interaction.
4. Image view/edit software
   Viewer software supports off-line image viewing and editing.

Notices:Windows is a registered trademark of Microsoft Corporation in the United States and other countries.

Main Specifications