JSM-IT500HR Scanning Electron Microscope

JSM-IT500HR Scanning Electron Microscope

The JSM-IT500HR SEM, based on the highly successful and award winning JEOL InTouchScope series, is equipped with a high-brightness electron gun and fully integrating JEOL's energy dispersive X-ray spectrometer (EDS). This revolutionizing JSM-IT500HR is a superb high throughput SEM, delivering a dramatically improved work efficiency (40% or higher than conventional models).

JEM-Z300FSC (CRYO ARM) Electron Microscope

JEM-Z300FSC / JEM-Z200FSC Cryo-Electron Microscope

CRYO ARM is an electron microscope for observing biomolecules such as proteins at cryo temperature. The microscope equips a cold field-emission electron gun, an in-column Omega energy filter, a side-entry liquid nitrogen cooling stage, and an automated specimen exchange system. The specimen exchange system can store up to 12 specimens in the specimen exchange chamber.

JSM-IT200 Scanning Electron Microscope

JSM-IT200 Scanning Electron Microscope

Fast observation, analysis and report generation! JSM-IT200 is an easy-to-use scanning electron microscope focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope, with significantly higher throughput.

Electron Microscopy News

Electron Microscopy News

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Arnold Kruize
Arnold Kruize
Arnold Kruize's Blog

JPS-9030: The XPS for high-speed, high-precision depth profiling

In recent years, there has been a growing demand to perform high quality surface analysis quickly, easily and reproducibly on any kind of sample for any level user. The JPS-9030 is equipped with a newly-designed user interface that further improves operability and also debuts a sophisticated, new modern and sleek exterior design.

Main Features

  1. Depth profiling optimized for the application
    The newly-developed Kaufman-type etching ion source provides etching rates from 1 nm/min to 100 nm/min (SiO2equivalent), and allows a wide range of settings. It is capable of depth profiles suitable for any application, from measurements demanding precision to processes that require speed. The mounting of the Kaufman-type etching ion source to the specimen exchange chamber facilitates prevention of  contamination of the measurement chamber.
  2. Newly-developed software provides even greater ease-of-use
    SpecSurf Ver. 2.0 now incorporates a ribbon-style GUI, offering a user-friendly environment in which all operations can be performed with the mouse. With JEOL’s own automatic qualitative analysis function, it is possible to sequentially perform qualitative, quantitative and chemical state analyses for multiple acquisition points.
  3. Ultra-high surface sensitivity
    The JPS-9030 supports techniques like Angle-Resolved XPS (ARXPS) and Total Reflection XPS (TRXPS), and is capable ultra-high sensitive analysis of the top surfaces of 1 nm (standard measurement method 6 nm or more).
  4. A wealth of options
    • Monochromatic X-ray sources
    • Argon gas cluster ion source suitable for organic samples
    • Infra-red heating system capable of temperatures of 1,000°C or higher
    • Transfer vessel to protect specimens from exposure to the atmosphere

Main Specifications

Intensity
(MgKα, 300W equivalent)
1,000,000 cps or more (at Ag3d5/2FWHM is 1.0 eV)
X-ray source Mg/Al twin anode
Input-lens system Cylindrical electrostatic lens
Energy analyzer Electrostatic hemispherical analyzer
Energy sweep method Constant Analyzer Energy and Constant Retarding Ratio
Detector multichannel plate
Ion gun Kaufman type ion gun
Base pressure 7 × 10-8Pa or better
Bake-out system Built-in heater, automatic control
JPS-9030


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