JSM-IT700HR Scanning Electron Microscope

JSM-IT700HR InTouchScope™

SEM- Essential in Daily Lab Operation JSM-IT700HR Makes it Easy.

Scanning Electron Microscope

JEM-Z300FSC (CRYO ARM) Electron Microscope

JEM-Z300FSC / JEM-Z200FSC Cryo-Electron Microscope

CRYO ARM is an electron microscope for observing biomolecules such as proteins at cryo temperature. The microscope equips a cold field-emission electron gun, an in-column Omega energy filter, a side-entry liquid nitrogen cooling stage, and an automated specimen exchange system. The specimen exchange system can store up to 12 specimens in the specimen exchange chamber.

JSM-IT200 Scanning Electron Microscope

JSM-IT200 Scanning Electron Microscope

Fast observation, analysis and report generation! JSM-IT200 is an easy-to-use scanning electron microscope focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope, with significantly higher throughput.

Electron Microscopy, NMR & Mass Spectometry News

Electron Microscopy News

Our latest blogs on (Scanning) Electron Microscopes, NMR & Mass Spectometry


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JCM-6000 ”NeoScope™”, A New Desktop Scanning Electron Microscope

JEOL's JCM-5000 NeoScope, since it was announced, has been widely used by electronics manufacturers, including semiconductor device makers, as a desktop scanning electron microscope featuring the same ease of operation as optical microscopes for inspection of the products developed and processed by micro technologies. The new JCM-6000 "NeoScopeTM," is a touch panel controlled, multi functional desktop scanning microscope that answers the increasingly diversified needs among users worldwide. Nikon has joined JEOL to sell the Neoscope.

Features

1) Simple operation

  • Easy touch panel operation
  • A complete range of automated functions (auto focus, auto stigmator, auto contrast/brightness)
  • Easy, dependable auto gun alignment (filament centering)

2) Enhanced low vacuum capability

  • Enhanced quality of backscattered electron images
  • Easy observation of non conductive samples in the direct low vacuum mode
  • Only 2 minutes 30 seconds from sample loading to imaging

3) New capabilities for imaging

  • Secondary electron imaging and backscattered electron imaging supported at high vacuum
  • Dual frame imaging to facilitate comparison of live and retrieved images
  • A wide magnification range from the lowest 10x for wide area of view up to 60,000x

4) A complete line of optional accessories

  • Energy dispersive X-ray spectrometer
  • Tilt/rotation motor drive specimen holder

    *Both options are retrofittable

5) Compact, light, and energy saving

  • Base unit: 330mm (W) x 490mm (D) x 430mm (H); 50 kg
  • Utility: Single phase 100 V to 240 V, 50/60 Hz, 700 to 960 VA


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