JSM-IT500HR

JSM-IT500HR

The JSM-IT500HR, based on the highly successful and award winning JEOL InTouchScope series, is equipped with a high-brightness electron gun and fully integrating JEOL's energy dispersive X-ray spectrometer (EDS). This revolutionizing JSM-IT500HR is a superb high throughput SEM, delivering a dramatically improved work efficiency (40% or higher than conventional models).

JEM-Z300FSC / JEM-Z200FSC

JEM-Z300FSC / JEM-Z200FSC

CRYO ARM is an electron microscope for observing biomolecules such as proteins at cryo temperature. The microscope equips a cold field-emission electron gun, an in-column Omega energy filter, a side-entry liquid nitrogen cooling stage, and an automated specimen exchange system. The specimen exchange system can store up to 12 specimens in the specimen exchange chamber.

JSM-IT200

JSM-IT200

Fast observation, analysis and report generation! JSM-IT200 is an easy-to-use SEM focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope, with significantly higher throughput.

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Arnold Kruize
Arnold Kruize
Arnold Kruize's Blog

JEOL (Europe) BV introduces: Photo Ion-Source for JMS-T200GC AccuTOF GCx

Electron ionization (EI), generally used for GC/MS and GCxGC/MS analysis, produces fragment ions. Fragments are valuable for database search and compound identification. However, fragmentation adds an additional level of complexity in interpreting complex mixtures, such as crude oil. Some compounds (e.g. alkanes, alcohols) do not produce abundant (or any) molecular ions.

Since photoionization (PI) is a softer ionization method than EI, molecular ion can be easily distinguished using this technique. For some analytes, characteristic fragment ions may also be observed. Combining soft ionization with high-resolution exact-mass data and new software tools simplifies processing of complex GC and GCxGC data (e.g. petroleum type analysis).

PI provides clear molecular ions and elemental composition that can be combined with EI data to identify unknowns and also provides selective ionization of target compounds

The JEOL PI source is designed as a PI/EI combination ion source. Switching between PI and EI can be done without breaking vacuum of the ion source, even without breaking any vacuum. Also during an analytical run it is possible to switch between PI/EI and vice versa. The accurate mass will always stay available whatever ionisation technique is used with our JMS-T200GC AccuTOF GCx.

At this moment a PI source is available for our GC-TOF and GC-Quadrupole systems.

JEOL Photo Ion-Source



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