Electron Microscopy, NMR & Mass Spectometry News

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  JEOL Europe BV present at the Precision Fair 2015

  JEOL (Europe) BV will be present at the Precision Fair 2015 on the 18th and 19th of november at the Koningshof in Veldhoven. You are invited to stand 202 to receive a live demonstration of our JCM-6000 Benchtop SEM.
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  JEOL Europe BV at PEFTEC

  JEOL Europe BV would like to invite you to visit stand 90 at PEFTEC 2015 on the 18th & 19th of November 2015 at the Antwerp Expo.
• JEOL (Europe) BV present at Labtechnology 2015

  On the 7th and 8th of October the exhibition Labtechnology 2015 will be held at the Jaarbeurs in Utrecht. JEOL (Europe) BV will be present to promote our recent developments and new products in the field of NMR, Mass spectrometry and Electron Optics. You can find us at booth C18. To register for this exhibition please visit https://labtechnology.nl/  
• JEOL (Europe) BV introduces: Photo Ion-Source for JMS-T200GC AccuTOF GCx

  Electron ionization (EI), generally used for GC/MS and GCxGC/MS analysis, produces fragment ions. Fragments are valuable for database search and compound identification. However, fragmentation adds an additional level of complexity in interpreting complex mixtures, such as crude oil. Some compounds (e.g. alkanes, alcohols) do not produce abundant (or any) molecular ions. Since photoionization (PI) is a softer ionization method than EI, molecular ion can be easily distinguished using this technique. For some analytes, characteristic fragment ions may also be observed. Combining soft ionization with high-resolution exact-mass data and new software tools simplifies processing of complex GC and GCxGC data (e.g. petroleum type analysis). PI provides clear molecular ions and elemental composition that can be combined with EI data to identify unknowns and also provides selective ionization of target compounds The JEOL PI source is designed as a PI/EI combination ion source. Switching between PI and EI can be done without breaking vacuum of the ion source, even without breaking any vacuum. Also during an analytical run it is possible to switch between PI/EI and vice versa. The accurate mass will always stay available whatever ...
• JEOL Present at Medica 2021

  Overview: JEOL has gained global confidence as a leading manufacturer of clinical chemistry analyzers. More than 10,000 of our clinical chemistry analyzers have been placed on the market all over the world under JEOL brand and as OEM products, extending our dedication to healthcare beyond Japan. With our 3rd appearance in MEDICA, we are privileged to introduce BioMajesty™ series, clinical chemistry with unique but proven technologies. It is our mission to cater to global needs for premium quality "MADE IN JAPAN" products. (*) BioMajesty™ is a registered trademark of JEOL Ltd. Date/Period: 15th – 18th November, 2021 Location: Messe Düsseldorf　 Booth No: Hall3, 3B27 Website:  https://www.medica-tradefair.com/ Displayed instruments : JCA-BM6070/C https://www.jeol.co.jp/en/products/detail/JCA-BM6070_C.html JEOL Europe Medical Equipment Center(JEMEC) in Zaventem Belgium (2 hours drive from Düsseldorf )      We welcome anyone interested in stopping by at JEMEC the week after MEDICA.      For more information, please contact Mr. Tanabe tanabe@jeolbenelux.com  .      JEMEC : https://www.jeolbenelux.com/About-Us/JEOL-Europe-Medical-Equipment-Center-JEMEC
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  First JEOL JEM-ARM200F Electron Microscope Produces Atomic Resolution Data in Record Time at University of San Antonio

  The first transmission electron microscope of its caliber to be installed, the eagerly awaited atomic resolution JEOL JEM-ARM200F TEM arrived at the University of Texas at San Antonio in January, and by early February began producing outstanding imaging results. “Achieving raw HAADF images showing at least 78 picometer information transfer in just three weeks demonstrates the stability of this all-new instrument and the skill of the UTSA-JEOL team to quickly power up the first TEM of its kind,” said Dr. Thomas Isabell, JEOL USA Director of the TEM Product Division. UTSA physics and astronomy department chair Dr. Miguel Yacaman, a renowned electron microscopist and nanotechnology researcher, tested the new ARM200F performance on Si samples as the JEOL engineering, service and applications team worked closely together to install the TEM in UTSA’s Advanced Microscopy Lab. “At the level of this new microscope, the potential for new discoveries is enormous,” says Yacaman, who likened the capabilities of the JEOL ARM200F for sub-atomic research to those of the Hubble telescope for intergalactic exploration. The ARM200F represents more than 60 years of TEM expertise at JEOL ...