Electron Microscopy, NMR & Mass Spectometry News

JEOL Present at Laborama 2018

JEOL (Europe) BV will be present at the Laborama Expo 2018, on the 15th and 16th of March in the Brussels Kart Expo in Groot Bijgaarden. We will have  our benchtop SEM on display. You are more than welcome to visit us and be informed about our latest developments on SEM, MS and NMR. You can find us at Booth B4. 

For more Information about this event, please visit: http://expo.laborama.be/nl

JEOL present at Labtechnology 2017

On the 3rd and 4th of October the exhibition Labtechnology 2017 will be held at the Jaarbeurs in Utrecht. JEOL (Europe) BV will be present to promote our recent developments and new products in the field of NMR, Mass spectrometry and Electron Optics. You can find us at booth B16. 

To sign up for this event, please visit https://labtechnology.nl

JEOL introduces the JSM-IT500

JEOL's latest addition to the InTouchscope series is the JSM-IT500, a new model that incorporates new features that further increase ease of use and create a higher throughput for SEM analysis.

Key point 1 : Zeromag
The displayed Holder Graphics or CCD image enables you to locate the specimen area or specify analysis positions. You can rapidly search the specimen area and specify positions for multiple-field serial analysis.

Key point 2 : Live Analysis (Only for A/LA)
With "Live Analysis", the embedded EDS system shows a real time EDS spectrum during image observation. Elemental composition or "Alert" for element of interest is displayed on a live image.

Key point 3 : Integrated data management software
This user-friendly software enables you to select and review SEM images and analysis results through the data management area. You can also generate a report with a single click.

Please take a look at the video to see how the new features work: https://youtu.be/Kad1BzLWT5E

Release of the JSM-7900 UHR FEG-SEM

JSM-7900F is JEOL’s new flagship FE-SEM which combines ultimate high resolution imaging, enhanced stability and exceptional ease of use for any level of operator in multi-user environment.

Newly developed functionality that integrates lens control system and automatic technology, "Neo Engine" (New Electron Optical Engine) is a standard feature, allowing for fast and easy image acquisition at any accelerating voltage and probe current.
The system is the premier example of the JEOL’s advanced electron optics technology.

For more details visit our corporate website: https://www.jeol.co.jp/en/products/detail/JSM-7900F.html

JEOL releases the JSM-IT300HR

The JSM-IT300HR is the latest model in the InTouchscope Series. The succesful series has been expanded with a model that comes standard with a Field Emission Gun and Low Vacuum capabilities, based on the JSM-IT300 Tungsten SEM.

This versatile and powerful microscope allows for very easy and very fast imaging at high magnifications, so that even novice users can quickly enjoy the benefits of a Field Emission Gun. 

Main features:

1. New high-brightness electron gun and optical system provide high resolution imaging and high spatial-resolution analysis.
2. Intuitive operation is enabled by Touch panel functions, Automatic functions and Recipe functions.
3. Easy-to-use software interface (GUI) includes full integration of image observation and element analysis, allowing even novice users to perform any task with high efficiency.
4. Large specimen stage which accommodates various sizes and types of specimens for extended observation and analysis.
5. Small footprint equivalent to the conventional general-purpose SEM.

More detailed information and example images can be found on our corporate website: https://www.jeol.co.jp/en/news/detail/20160907.1675.html

JEOL present at WOTS 2016

During WOTS 2016 from October 4th until October 7th in Utrecht, JEOL will be present with live SEM demonstrations and a variety of lectures on the latest developments regarding SEM, TEM, MS and NMR.

Every day presentations will be given in our on-booth lecture room:

Novelties in Liquid and Solids NMR  11:00-11:30

SEM at your fingertips 12:00-12:30

Gas and Volatiles analysis with High resolution MS 14:00-14:30

Introduction to the all-purpose TEM 15:00-15:30

Of course there will also be plenty of opportunity to discuss with our product specialists to discuss your application and how our instrumentation will help you find your answers. Our booth number is 7B034.

See you at WOTS 2016!

JEOL Celebrating 50 years of SEM

In 2016 we are celebrating 50 years of JEOL scanning electron microscopes!

Since the launch of our first SEM in 1966, the JSM-1, we have been constantly developing and improving the ease-of-use and the performance of our SEMs, with the support of our customers. 

Since 1966, more than 22.000 JEOL SEMs have been installed worldwide!

JEOL present at Materials 2016

JEOL (Europe) BV will be present at Materials 2016, on the 20th and 21st of April in the Konings in Veldhoven. We will have our latest compact SEM, the JSM-IT100LA on display. You are more than welcome to visit us and be informed about our latest developments. You can find us at Booth 91.

JEOL present at Laborama 2016

JEOL (Europe) BV will be present at the Laborama Expo 2016, on the 17th and 18th of March in the Brussels Kart Expo in Groot Bijgaarden. We will have our Nanalysis NMReady Benchtop NMR on display, as well as our latest compact SEM, the JSM-IT100LA. You are more than welcome to visit us and be informed about our latest developments. You can find us at Booth I11.

http://expo.laborama.be/

Release of a new Field-Emission Scanning Electron Microscope: The JSM-7200F

JEOL has released the  JSM-7200F, a multi-purpose FE-SEM combining high-resolution and easy operation.

Scanning electron microscopes have been used in a wide range of fields and for diverse applications. The JSM-7200F utilizes JEOL proprietary in-lens Schottky Plus technology that allows improvement in the resolution at low accelerating voltages (1.6 nm @ 1 kV), and achieves a maximum probe current of 300 nA. The JSM-7200F is a multi-purpose FE-SEM that can satisfy a wide range of needs with both higher resolution and easier operation than conventional instruments.The features include:

1. High resolution of 1.6 nm at 1 kV, 1.2nm at 30kV.
2. High-speed analysis: maximum probe current of 300 nA, allowing short acquisition time for EDS, WDS, and EBSD, while maintaining high resolution.
3. Energy signal differentiation: incorporation of the TTL (through-the-lens) system in the standard configuration enables the use of energy filtering to selectively differentiate the electron energies.
4. Wide area analysis: the LDF (long depth of field) mode enables applications like wide-area EBSD analysis, without the need to use stage scan (montage).