JSM-IT500HR Scanning Electron Microscope

JSM-IT500HR Scanning Electron Microscope

The JSM-IT500HR SEM, based on the highly successful and award winning JEOL InTouchScope series, is equipped with a high-brightness electron gun and fully integrating JEOL's energy dispersive X-ray spectrometer (EDS). This revolutionizing JSM-IT500HR is a superb high throughput SEM, delivering a dramatically improved work efficiency (40% or higher than conventional models).

JEM-Z300FSC (CRYO ARM) Electron Microscope

JEM-Z300FSC / JEM-Z200FSC Cryo-Electron Microscope

CRYO ARM is an electron microscope for observing biomolecules such as proteins at cryo temperature. The microscope equips a cold field-emission electron gun, an in-column Omega energy filter, a side-entry liquid nitrogen cooling stage, and an automated specimen exchange system. The specimen exchange system can store up to 12 specimens in the specimen exchange chamber.

JSM-IT200 Scanning Electron Microscope

JSM-IT200 Scanning Electron Microscope

Fast observation, analysis and report generation! JSM-IT200 is an easy-to-use scanning electron microscope focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope, with significantly higher throughput.

Electron Microscopy News

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Electron Microscopy News

Our latest blogs on (Scanning) Electron Microscopes

JEOL releases the JSM-IT300HR

The JSM-IT300HR is the latest model in the InTouchscope Series. The succesful series has been expanded with a model that comes standard with a Field Emission Gun and Low Vacuum capabilities, based on the JSM-IT300 Tungsten SEM.

This versatile and powerful microscope allows for very easy and very fast imaging at high magnifications, so that even novice users can quickly enjoy the benefits of a Field Emission Gun. 

Main features:

  1. New high-brightness electron gun and optical system provide high resolution imaging and high spatial-resolution analysis.
  2. Intuitive operation is enabled by Touch panel functions, Automatic functions and Recipe functions.
  3. Easy-to-use software interface (GUI) includes full integration of image observation and element analysis, allowing even novice users to perform any task with high efficiency.
  4. Large specimen stage which accommodates various sizes and types of specimens for extended observation and analysis.
  5. Small footprint equivalent to the conventional general-purpose SEM.

More detailed information and example images can be found on our corporate website: https://www.jeol.co.jp/en/news/detail/20160907.1675.html

JEOL introduces the InfiTOF Spectrometer JMS-MT3010HRGA

The InfiTOF  Spectrometer JMS-MT3010HRGA is a Time-of-Flight Mass Spectrometer using Multi-turn® and Perfect focusing® technologies, which achieves high mass-resolving power in a very compact package. This mass spectrometer is designed for real time monitoring of directly introduced gas. It is a high mass-resolution mass spectrometer with stability for real time gas monitoring and capable of elemental composition determination through accurate mass measurement.










High-Resolution Gas Monitoring

MS measurement results shown below are acquired by introducing the standard gases (10 ppm each) and then performing sequential measurement of 4 hours at high mass resolution conditions. High-resolution gas monitoring is enabled for all components over a long period of time with high stability.


High Mass Resolving Power

An innovative Multi-Turn technology makes the spectrometer compact while maintaining high mass resolving power. The maximum resolving power of 40,000 (FWHM) or higher is achieved even for a low-mass range, such as nitrogen molecule (28.0062 Da). With the conventional compact spectrometers, it was difficult to perform mass separation of gas components like carbon monoxide (27.9949) and nitrogen molecule (28.0062), or carbon dioxide (43.9898) and nitrous oxide (44.0011 Da). However, a new InfiTOF can easily separate these gas components and moreover, this revolutionized spectrometer calculates elemental composition through accurate mass measurement. 

Capable of Measuring Hydrogen Ions

JMS-MT3010HRGA is capable of measuring proton (1.0078 Da; a fragment ion of hydrogen molecule) as well as hydrogen molecule (2.0157 Da). Hydrogen is very difficult to measure with a time-of-flight mass spectrometer because of very low mass and fast flight velocity compared to other elements. The JMS-MT3010HRGA, however, achieves stable measurement of these species. This capability will contribute to research of various advanced materials, including electrolytic reactions and catalyst reactions. 


Main Specifications InfiniTOF

  • Mass resolving power 40,000 (FWHM) or higher : m/z 28 of N2
  • Mass range m/z 1 to 1,000
  • Sensitivity S/N ≦10, 38Ar in ambient air (direct infusion through a capillary tube)
  • Mass stability ≦ 100 ppm/h
  • Mass accuracy 3 mDa (Internal standard method) / 5 mDa (External standard merthod)
  • Data acquisition speed Up to 2 GS/s
  • Spectral recording speed Up to 20 spectra/s
  • Dimensions and Weight 430 mm (W) × 625 mm (D) × 552 mm (H) / 40 kgof Main Console (The width of the main console includes the anti-tipping legs.)


JEOL present at WOTS 2016

During WOTS 2016 from October 4th until October 7th in Utrecht, JEOL will be present with live SEM demonstrations and a variety of lectures on the latest developments regarding SEM, TEM, MS and NMR.

Every day presentations will be given in our on-booth lecture room:

Novelties in Liquid and Solids NMR  11:00-11:30

SEM at your fingertips 12:00-12:30

Gas and Volatiles analysis with High resolution MS 14:00-14:30

Introduction to the all-purpose TEM 15:00-15:30

Of course there will also be plenty of opportunity to discuss with our product specialists to discuss your application and how our instrumentation will help you find your answers. Our booth number is 7B034.

See you at WOTS 2016!

Inauguration of the JEM-1400Plus in Ghent on 24th March 2016

24th March 2016 knew the festive inauguration of the JEM-1400Plus, JEOL’s 120 kV TEM, in Ghent. The 1400Plus is JEOL’s latest generation 120 kV TEM. This system is extremely user-friendly and has integrated solutions for tomography as well as for large area imaging. The investment is a joint effort of 4 research centers of VIB (Flemish Institute for Biotechnology) and 1 research center of Ghent University:

·         Inflammation Research Center (VIB-IRC)

·         Plant Systems Biology (VIB-PSB)

·         Medical Biotechnology Center (VIB-MBC)

·         VIB Core facilities

·         Center for Medical Genetics Ghent University (CMGG)

In her welcome speech Prof. Anne de Paepe, Rector of Ghent University and Director of CMGG, emphasized the importance of collaboration for the acquisition and exploitation of large equipment.

The official “cutting of the ribbon” was followed by a demonstration of the 1400Plus and a reception with a variety of drinks and delicious snacks for the more than 100 participants.

  

Pictures:

TOP The official “cutting of the ribbon” by Prof. Anne De Paepe, assisted by mrs. Riet De Rycke and mr. Michiel De Bruyne, transmission electron microscopists at the VIB-UGent TEM Core Facility.

BOTTOM Mrs Riet De Rycke (far right) demonstrates the 1400Plus to (starting first row and from left to right): Prof. Nico Callewaert, Director MBC; Prof. Dirk Inzé, Director PSB; Dr. Jo Bury, Managing Director VIB, Prof. Bart Lambrecht, Director IRC; Prof. Anne De Paepe, Rector and Director CMGG.

JEOL present at Materials 2016

JEOL (Europe) BV will be present at Materials 2016, on the 20th and 21st of April in the Konings in Veldhoven. We will have our latest compact SEM, the JSM-IT100LA on display. You are more than welcome to visit us and be informed about our latest developments. You can find us at Booth 91.

For more information, please visit the website https://materials.nl/