Electron Microscopy, NMR & Mass Spectometry News

JEOL present at Materials 2016

JEOL (Europe) BV will be present at Materials 2016, on the 20th and 21st of April in the Konings in Veldhoven. We will have our latest compact SEM, the JSM-IT100LA on display. You are more than welcome to visit us and be informed about our latest developments. You can find us at Booth 91.

JEOL (Europe) BV introduces: Photo Ion-Source for JMS-T200GC AccuTOF GCx

Electron ionization (EI), generally used for GC/MS and GCxGC/MS analysis, produces fragment ions. Fragments are valuable for database search and compound identification. However, fragmentation adds an additional level of complexity in interpreting complex mixtures, such as crude oil. Some compounds (e.g. alkanes, alcohols) do not produce abundant (or any) molecular ions.

Since photoionization (PI) is a softer ionization method than EI, molecular ion can be easily distinguished using this technique. For some analytes, characteristic fragment ions may also be observed. Combining soft ionization with high-resolution exact-mass data and new software tools simplifies processing of complex GC and GCxGC data (e.g. petroleum type analysis).

PI provides clear molecular ions and elemental composition that can be combined with EI data to identify unknowns and also provides selective ionization of target compounds

The JEOL PI source is designed as a PI/EI combination ion source. Switching between PI and EI can be done without breaking vacuum of the ion source, even without breaking any vacuum. Also during an analytical run it is possible to switch between PI/EI and vice versa. The accurate mass will always stay available whatever ionisation technique is used with our JMS-T200GC AccuTOF GCx.

At this moment a PI source is available for our GC-TOF and GC-Quadrupole systems.

Release of the JEM-F200, a multi purpose TEM

JEOL's latest addition to its suite of Transmission Electron Microscopes is the versatile JEM-F200, also nicknamed "F2", the only advanced analytical, high throughput 200kV S/TEM in its class to offer a Cold Field Emission Gun and dual Silicon Drift Detectors.

The combined boost in probe current from the Cold FEG with the dual EDS makes this TEM stand out in its class.The 'F2' employs the newest in JEOL innovations in an easy-to-use, extremely stable, high resolution imaging and analytical TEM.

The F2 incorporates many new features: 

• Smart- design, with a new intuitive user interface
• Quad-lens condenser system,  the new 4-stageprobe-forming optical system, Quad-Lens condenser system, controls the electron beam intensity and the convergence angle independently to respond to different research requirements.
• Advanced Scan system,which is capable of scanning the electron beam in the image forming system (optional) , in addition to the standard scanning system for the probe-forming system. This accomplishes wide field STEM-EELS.
• Pico Stage Drive, which is capable of driving the stage in pico meter steps without a piezo drive, and moving the area of view in a wide dynamic range from an entire sample grid to atomic order images.
• Specporter, an auto holder loading/unloading device.
• Improved coldFEG, Guaranteeing high stability, high brightness, and high energy resolution, the cold field emission electron gun enables chemical bonding analysis by EELS, speeds up the analytical process by the high brightness electron beam, and minimizes chromatic aberrations from the electron source for enabling high resolution imaging.
• Dual SDD, for very fast EDS analysis and minimal sample damage.
• Environmental friendly, the instrument can be switched to ECO mode when not in use, to reduce its energy consumption.

Main specification: TEM point to point: 0.19 nm STEM-HAADF: 0.14 nm (using Cold FEG and UHR polepiece)

JEOL present at Laborama 2016

JEOL (Europe) BV will be present at the Laborama Expo 2016, on the 17th and 18th of March in the Brussels Kart Expo in Groot Bijgaarden. We will have our Nanalysis NMReady Benchtop NMR on display, as well as our latest compact SEM, the JSM-IT100LA. You are more than welcome to visit us and be informed about our latest developments. You can find us at Booth I11.

http://expo.laborama.be/

Release of a new Field-Emission Scanning Electron Microscope: The JSM-7200F

JEOL has released the  JSM-7200F, a multi-purpose FE-SEM combining high-resolution and easy operation.

Scanning electron microscopes have been used in a wide range of fields and for diverse applications. The JSM-7200F utilizes JEOL proprietary in-lens Schottky Plus technology that allows improvement in the resolution at low accelerating voltages (1.6 nm @ 1 kV), and achieves a maximum probe current of 300 nA. The JSM-7200F is a multi-purpose FE-SEM that can satisfy a wide range of needs with both higher resolution and easier operation than conventional instruments.The features include:

1. High resolution of 1.6 nm at 1 kV, 1.2nm at 30kV.
2. High-speed analysis: maximum probe current of 300 nA, allowing short acquisition time for EDS, WDS, and EBSD, while maintaining high resolution.
3. Energy signal differentiation: incorporation of the TTL (through-the-lens) system in the standard configuration enables the use of energy filtering to selectively differentiate the electron energies.
4. Wide area analysis: the LDF (long depth of field) mode enables applications like wide-area EBSD analysis, without the need to use stage scan (montage).

New Versatile Compact SEM from JEOL

JEOL has released the JSM-IT100, the successor of the very popular and succesful InTouchscope JSM-6010 series. The JSM-IT100 is a simple-to-use versatile, research-grade SEM with a compact ergonomic design.

The JSM-IT100 is very easy to use, due to the very intuitive user interface and has a formidable price-performance ratio. This compact SEM is a versatile workhorse SEM that can be configured to meet individual lab requirements. It offers high resolution imaging, and offers a range of acceleration voltages at both high and low vacuum modes.

With the JSM-IT100, it is simple to quickly obtain high quality images using both Secondary Electron and Backscatter Imaging. The embedded JEOL EDS system with silicon drift detector technology now includes Spectral Mapping, Multi-Point Analysis, Automatic Drift Compensation, Partial area, Line Scan, and Mapping Filter functions.

JEOL's popular InTouchScope series includes the NeoScope benchtop SEM with selectable HV/LV and the JSM-IT300LV with advanced analytical capabilities and imaging of large, intact samples.

New TEM for Naturalis

The Naturalis Biodiversity Center, a research institute and natural history museum in Leiden, has recently acquired the state-of-the-art JEM-1400Plus Transmission Electron Microscope (TEM) from JEOL.

 “Thanks to this TEM we are able to study the biodiversity of plants and species in the smallest details.” According to Kees van den Berg, Senior Analyst at Naturalis. “For the acquisition of the new 120kV TEM the JEM-1400Plus from JEOL was selected because of its performance, ease-of-use and proven stability of the system. The excellent service track record of JEOL also played an important role in the evaluation."

"We used to have a JEOL JEM-1010 from 1992. Even though it was still working well, it no longer fit in our new organization structure where digitalization of our collection and data has become a priority. Additionally, the new TEM is also fully compatible with our Windows 7 based network. The JEM-1010 will go to a new owner who will certainly  benefit from the microscope for years to come."

Since the introduction of the JEM-1400 in 2007 and the JEM-1400Plus in 2012, already more than 600 microscopes of this type have been installed worldwide. The strength of this system lies in the flexibility of the system to be able to work in a great variety of research fields, for example: Biological sections, polymers, nanomaterials and asbestos analysis, all in both room temperature and under cryo conditions. 

JEOL Europe BV present at the Precision Fair 2015

JEOL Europe BV at PEFTEC

JEOL Europe BV would like to invite you to visit stand 90 at PEFTEC 2015 on the 18th & 19th of November 2015 at the Antwerp Expo.

JEOL (Europe) BV present at Labtechnology 2015

On the 7th and 8th of October the exhibition Labtechnology 2015 will be held at the Jaarbeurs in Utrecht. JEOL (Europe) BV will be present to promote our recent developments and new products in the field of NMR, Mass spectrometry and Electron Optics. You can find us at booth C18.

To register for this exhibition please visit https://labtechnology.nl/